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Measurement Techniques for Thin Films

Author: Bertram Schwartz
Publisher:
ISBN:
Category : Metallic films
Languages : en
Pages : 376

Book Description

Measurement Techniques for Thin Films

Author: Bertram Schwartz
Publisher:
ISBN:
Category : Metallic films
Languages : en
Pages : 376

Book Description

Measurement techniques for thin films, ed

Author: Bertram Schwartz
Publisher:
ISBN:
Category : Metallic films
Languages : en
Pages :

Book Description

Measurement Techniques for Thin Films

Author: Bertram Schwartz
Publisher:
ISBN: 9780384543607
Category :
Languages : en
Pages :

Book Description

A Practical Guide to Optical Metrology for Thin Films

Author: Michael Quinten
Publisher: John Wiley & Sons
ISBN: 3527664351
Category : Science
Languages : en
Pages : 212

Book Description
A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measurement, and modern applications. In so doing, it shows the capabilities and opportunities of optical thickness determination and discusses the strengths and weaknesses of measurement devices along with their evaluation methods. Following an introduction to the topic, Chapter 2 presents the basics of the propagation of light and other electromagnetic radiation in space and matter. The main topic of this book, the determination of the thickness of a layer in a layer stack by measuring the spectral reflectance or transmittance, is treated in the following three chapters. The color of thin layers is discussed in chapter 6. Finally, in chapter 7, the author discusses several industrial applications of the layer thickness measurement, including high-reflection and anti-reflection coatings, photolithographic structuring of semiconductors, silicon on insulator, transparent conductive films, oxides and polymers, thin film photovoltaics, and heavily doped silicon. Aimed at industrial and academic researchers, engineers, developers and manufacturers involved in all areas of optical layer and thin optical film measurement and metrology, process control, real-time monitoring, and applications.

Diffusive Gradients in Thin-Films for Environmental Measurements

Author: William Davison
Publisher: Cambridge University Press
ISBN: 110713076X
Category : Science
Languages : en
Pages : 321

Book Description
An essential guide to the applications and usage of the diffusive gradients in thin-films (DGT) technique for students and professionals.

Measurement Techniques for Thin Films

Author: Bertram Schwartz
Publisher:
ISBN: 9780384543607
Category :
Languages : en
Pages :

Book Description

An Introduction to Thin Films

Author: Leon I. Maissel
Publisher: CRC Press
ISBN: 9780677028408
Category : Science
Languages : en
Pages : 314

Book Description

Measurement Techniques for Thin Films

Author: Electrochemical Society. Dielectrics and Insulation Division
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description

Measurement Techniques for Thin Films

Author: Electrochemical Society. Electronics Division
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description

Measurements Techniques for Thin Films

Author: Bertram Schwartz
Publisher:
ISBN:
Category :
Languages : en
Pages : 363

Book Description