Author: Pierre Mertz
Publisher:
ISBN:
Category : X-rays
Languages : en
Pages : 154
Book Description
Measurement of X-ray Scattering Coefficient for Light Substances as a Function of Wavelength
Medical Imaging Systems
Author: Andreas Maier
Publisher: Springer
ISBN: 3319965204
Category : Computers
Languages : en
Pages : 263
Book Description
This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.
Publisher: Springer
ISBN: 3319965204
Category : Computers
Languages : en
Pages : 263
Book Description
This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.
Fundamentals of Powder Diffraction and Structural Characterization of Materials
Author: Vitalij Pecharsky
Publisher: Springer Science & Business Media
ISBN: 0387241477
Category : Technology & Engineering
Languages : en
Pages : 732
Book Description
Requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method. Useful for any scientific or engineering background, where precise structural information is required. Comprehensively describes the state-of-the-art in structure determination from powder diffraction data both theoretically and practically using multiple examples of varying complexity. Pays particular attention to the utilization of Internet resources, especially the well-tested and freely available computer codes designed for processing of powder diffraction data.
Publisher: Springer Science & Business Media
ISBN: 0387241477
Category : Technology & Engineering
Languages : en
Pages : 732
Book Description
Requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method. Useful for any scientific or engineering background, where precise structural information is required. Comprehensively describes the state-of-the-art in structure determination from powder diffraction data both theoretically and practically using multiple examples of varying complexity. Pays particular attention to the utilization of Internet resources, especially the well-tested and freely available computer codes designed for processing of powder diffraction data.
Theory of XRF : getting acquainted with the principles
Author: Peter Brouwer
Publisher:
ISBN: 9789090167589
Category :
Languages : en
Pages : 71
Book Description
Publisher:
ISBN: 9789090167589
Category :
Languages : en
Pages : 71
Book Description
Dissertations in Physics
Author: M. Lois Marckworth
Publisher: Stanford, Calif. : Stanford University Press
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 824
Book Description
Publisher: Stanford, Calif. : Stanford University Press
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 824
Book Description
X-Ray Diffraction Crystallography
Author: Yoshio Waseda
Publisher: Springer Science & Business Media
ISBN: 3642166350
Category : Technology & Engineering
Languages : en
Pages : 320
Book Description
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Publisher: Springer Science & Business Media
ISBN: 3642166350
Category : Technology & Engineering
Languages : en
Pages : 320
Book Description
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Physical Chemistry of Macromolecules
Author: S. F. Sun
Publisher: John Wiley & Sons
ISBN: 0471281387
Category : Technology & Engineering
Languages : en
Pages : 590
Book Description
Integrating coverage of polymers and biological macromolecules into a single text, Physical Chemistry of Macromolecules is carefully structured to provide a clear and consistent resource for beginners and professionals alike. The basic knowledge of both biophysical and physical polymer chemistry is covered, along with important terms, basic structural properties and relationships. This book includes end of chapter problems and references, and also: Enables users to improve basic knowledge of biophysical chemistry and physical polymer chemistry. Explores fully the principles of macromolecular chemistry, methods for determining molecular weight and configuration of molecules, the structure of macromolecules, and their separations.
Publisher: John Wiley & Sons
ISBN: 0471281387
Category : Technology & Engineering
Languages : en
Pages : 590
Book Description
Integrating coverage of polymers and biological macromolecules into a single text, Physical Chemistry of Macromolecules is carefully structured to provide a clear and consistent resource for beginners and professionals alike. The basic knowledge of both biophysical and physical polymer chemistry is covered, along with important terms, basic structural properties and relationships. This book includes end of chapter problems and references, and also: Enables users to improve basic knowledge of biophysical chemistry and physical polymer chemistry. Explores fully the principles of macromolecular chemistry, methods for determining molecular weight and configuration of molecules, the structure of macromolecules, and their separations.
X-ray Characterization of Materials
Author: Eric Lifshin
Publisher: John Wiley & Sons
ISBN: 3527613757
Category : Technology & Engineering
Languages : en
Pages : 277
Book Description
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
Publisher: John Wiley & Sons
ISBN: 3527613757
Category : Technology & Engineering
Languages : en
Pages : 277
Book Description
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
NBS Special Publication
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 650
Book Description
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 650
Book Description
Publications of the National Institute of Standards and Technology ... Catalog
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 610
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 610
Book Description