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Author: Raghavendra, Publisher: OUP India ISBN: 9780198085492 Category : Technology & Engineering Languages : en Pages : 0
Book Description
Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.
Author: Raghavendra, Publisher: OUP India ISBN: 9780198085492 Category : Technology & Engineering Languages : en Pages : 0
Book Description
Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.
Author: X. Jane Jiang Publisher: Academic Press ISBN: 0128218169 Category : Technology & Engineering Languages : en Pages : 376
Book Description
Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. - Includes case studies in every chapter to help readers implement the techniques discussed - Provides unique advice from industry on hot subjects, including surface description and data processing - Features links to online content, including video, code and software
Author: P. Tavella Publisher: IOS Press ISBN: 1614998183 Category : Science Languages : en Pages : 528
Book Description
Metrology is a constantly evolving field, and one which has developed in many ways in the last four decades. This book presents the proceedings of the Enrico Fermi Summer School on the topic of Metrology, held in Varenna, Italy, from 26 June to 6 July 2017. This was the 6th Enrico Fermi summer school devoted to metrology, the first having been held in 1976. The 2017 program addressed two major new directions for metrology: the work done in preparation for a possible re-definition of four of the base units of the SI in 2018, and the impact of the application of metrology to issues addressing quality of life – such as global climate change and clinical and food analysis – on science, citizens and society. The lectures were grouped into three modules: metrology for quality of life; fundamentals of metrology; and physical metrology and fundamental constants, and topics covered included food supply and safety; biomarkers; monitoring climate and air quality; new IS units; measurement uncertainty; fundamental constants; electrical metrology; optical frequency standards; and photometry and light metrology. The book provides an overview of the topics and changes relevant to metrology today, and will be of interest to both academics and all those whose work involves any of the various aspects of this field.
Author: Waldemar Nawrocki Publisher: Springer ISBN: 3319156691 Category : Technology & Engineering Languages : en Pages : 287
Book Description
This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.
Author: Graham T. Smith Publisher: Springer Science & Business Media ISBN: 1447138147 Category : Technology & Engineering Languages : en Pages : 336
Book Description
The subject of this book is surface metrology, in particular two major aspects: surface texture and roundness. It has taken a long time for manufacturing engineers and designers to realise the usefulness of these features in quality of conformance and quality of design. Unfortunately this awareness has come at a time when engineers versed in the use and specification of surfaces are at a premium. Traditionally surface metrology usage has been dictated by engineers who have served long and demanding apprenticeships, usually in parallel with studies leading to technician-level qualifications. Such people understood the processes and the achievable accuracies of machine tools, thereby enabling them to match production capability with design requirements. This synergy, has been made possible by the understanding of adherence to careful metrological procedures and a detailed knowledge of surface measuring instruments and their operation, in addition to wider inspection room techniques. With the demise in the UK of polytechnics and technical colleges, this source of skilled technicians has all but dried up. The shortfall has been made up of semi skilled craftsmen, or inexperienced graduates who cannot be expected to satisfy tradition al or new technology needs. Miniaturisation, for example, has had a pro found effect. Engineering parts are now routinely being made with nanometre surface texture and fiatness. At these molecular and atomic scales, the engineer has to be a physicist.
Author: Ewa Bulska Publisher: Springer ISBN: 3319992066 Category : Science Languages : en Pages : 201
Book Description
In this concise book, the author presents the essentials every chemist needs to know about how to obtain reliable measurement results. Starting with the basics of metrology and the metrological infrastructure, all relevant topics – such as traceability, calibration, chemical reference materials, validation and uncertainty – are covered. In addition, key aspects of laboratory management, including quality management, inter-laboratory comparisons, proficiency testing, and accreditation, are addressed.
Author: Jean-Luc Bertrand-Krajewski Publisher: ISBN: Category : Languages : en Pages :
Book Description
This book presents the advancements made in applied metrology in the field of Urban Drainage and Storm water Management over the past two decades in scientific research as well as in practical applications. Given the broadness of this subject (measuring principles, uncertainty in data, data validation, data storage and communication, design, maintenance and management of monitoring networks, technical details of sensor technology), the focus is on water quantity and a sound metrological basis. The book offers common ground for academics and practitioners when setting up monitoring projects in urban drainage and storm water management. This will enable an easier exchange of results so as to allow for a faster scientific progress in the field. A second, but equally important goal, is to allow practitioners access to scientific developments and gained experience when it comes to monitoring urban drainage and storm water systems. In-depth descriptions of international case studies covering all aspects discussed in the book are presented, along with self-training exercises and codes available for readers on a companion website.
Author: Alain C. Diebold Publisher: CRC Press ISBN: 0203904540 Category : Technology & Engineering Languages : en Pages : 703
Book Description
Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay
Author: Raghavendra,
Author: Raghavendra,
Author: X. Jane Jiang
Author: P. Tavella
Author: Waldemar Nawrocki
Author: Graham T. Smith
Author: Ewa Bulska
Author: Jean-Luc Bertrand-Krajewski
Author: Jay L. Bucher
Author: Alain C. Diebold
Author: Eric R. Marsh