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Author: C.H. Stapper Publisher: Springer Science & Business Media ISBN: 1475799578 Category : Technology & Engineering Languages : en Pages : 313
Book Description
Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.
Author: Stephen W. Director Publisher: Springer Science & Business Media ISBN: 1461315212 Category : Technology & Engineering Languages : en Pages : 299
Book Description
One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.
Author: M. Bushnell Publisher: Springer Science & Business Media ISBN: 0306470403 Category : Technology & Engineering Languages : en Pages : 690
Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author: Behrooz Parhami Publisher: Springer Science & Business Media ISBN: 0306469642 Category : Business & Economics Languages : en Pages : 512
Book Description
THE CONTEXT OF PARALLEL PROCESSING The field of digital computer architecture has grown explosively in the past two decades. Through a steady stream of experimental research, tool-building efforts, and theoretical studies, the design of an instruction-set architecture, once considered an art, has been transformed into one of the most quantitative branches of computer technology. At the same time, better understanding of various forms of concurrency, from standard pipelining to massive parallelism, and invention of architectural structures to support a reasonably efficient and user-friendly programming model for such systems, has allowed hardware performance to continue its exponential growth. This trend is expected to continue in the near future. This explosive growth, linked with the expectation that performance will continue its exponential rise with each new generation of hardware and that (in stark contrast to software) computer hardware will function correctly as soon as it comes off the assembly line, has its down side. It has led to unprecedented hardware complexity and almost intolerable dev- opment costs. The challenge facing current and future computer designers is to institute simplicity where we now have complexity; to use fundamental theories being developed in this area to gain performance and ease-of-use benefits from simpler circuits; to understand the interplay between technological capabilities and limitations, on the one hand, and design decisions based on user and application requirements on the other.
Author: John P. Uyemura Publisher: Springer Science & Business Media ISBN: 0306475294 Category : Technology & Engineering Languages : en Pages : 542
Book Description
This is an up-to-date treatment of the analysis and design of CMOS integrated digital logic circuits. The self-contained book covers all of the important digital circuit design styles found in modern CMOS chips, emphasizing solving design problems using the various logic styles available in CMOS.
Author: Mostafa I Abd-el-barr Publisher: World Scientific ISBN: 190897978X Category : Computers Languages : en Pages : 463
Book Description
Covering both the theoretical and practical aspects of fault-tolerant mobile systems, and fault tolerance and analysis, this book tackles the current issues of reliability-based optimization of computer networks, fault-tolerant mobile systems, and fault tolerance and reliability of high speed and hierarchical networks.The book is divided into six parts to facilitate coverage of the material by course instructors and computer systems professionals. The sequence of chapters in each part ensures the gradual coverage of issues from the basics to the most recent developments. A useful set of references, including electronic sources, is listed at the end of each chapter./a
Author: Bruno Ciciani
Author: Bruno Ciciani
Author: C.H. Stapper
Author: Stephen W. Director
Author: M. Bushnell
Author: IEEE computer society
Author: Behrooz Parhami
Author: John P. Uyemura
Author: Peter Yunemo Koo
Author: Mostafa I Abd-el-barr
Author: