Author: John Henry ScofieldPublisher:
ISBN:
Category : Electric resistance
Languages : en
Pages : 264
Book Description
Low Frequency Resistivity Fluctuations in Thin Metal Films
Author: John Henry ScofieldPublisher:
ISBN:
Category : Electric resistance
Languages : en
Pages : 264
Book Description
The Physical Properties of Thin Metal Films
Author: G.P. Zhigal'skiiPublisher: CRC Press
ISBN: 9781420024074
Category : Technology & Engineering
Languages : en
Pages : 234
Book Description
Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.
Scientific and Technical Aerospace Reports
Author: Channel Width Fluctuations in Gallium Arsenide MESFETs
Author: Robert Bryan HallgrenPublisher:
ISBN:
Category : Electronic noise
Languages : en
Pages : 250
Book Description
Exploring the use of the Microflown
Author: Raang RaangsPublisher: Ron Raangs
ISBN: 9036522854
Category :
Languages : en
Pages : 242
Book Description
Sixth International Conference on Noise in Physical Systems
Author: Paul Herman Ernst MeijerPublisher:
ISBN:
Category : Electronic noise
Languages : en
Pages : 436
Book Description
Nuclear Science Abstracts
Author: Noise in Nanoscale Semiconductor Devices
Author: Tibor GrasserPublisher: Springer Nature
ISBN: 3030375005
Category : Technology & Engineering
Languages : en
Pages : 724
Book Description
This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.
Advances in Electronics and Electron Physics
Author: Publisher: Academic Press
ISBN: 0080577539
Category : Computers
Languages : en
Pages : 319
Book Description
Advances in Electronics and Electron Physics
Sustaining University Program Research, 1969
Author: United States. National Aeronautics and Space Administration. Office of University AffairsPublisher:
ISBN:
Category : Research
Languages : en
Pages : 234
Book Description