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Author: Manuel J. Bellido Publisher: Imperial College Press ISBN: 1860945899 Category : Technology & Engineering Languages : en Pages : 288
Book Description
This book provides the reader with an extensive background in the field of logic-timing simulation and delay modeling. It includes detailed information on the challenges of logic-timing simulation, applications, advantages and drawbacks. The capabilities of logic-timing are explored using the latest research results that are brought together from previously disseminated materials. An important part of the book is devoted to the description of the ?Degradation Delay Model?, developed by the authors, showing how the inclusion of dynamic effects in the modeling of delays greatly improves the application cases and accuracy of logic-timing simulation. These ideas are supported by simulation results extracted from a wide range of practical applications.Sample Chapter(s)
Author: Manuel J. Bellido Publisher: Imperial College Press ISBN: 1860945899 Category : Technology & Engineering Languages : en Pages : 288
Book Description
This book provides the reader with an extensive background in the field of logic-timing simulation and delay modeling. It includes detailed information on the challenges of logic-timing simulation, applications, advantages and drawbacks. The capabilities of logic-timing are explored using the latest research results that are brought together from previously disseminated materials. An important part of the book is devoted to the description of the ?Degradation Delay Model?, developed by the authors, showing how the inclusion of dynamic effects in the modeling of delays greatly improves the application cases and accuracy of logic-timing simulation. These ideas are supported by simulation results extracted from a wide range of practical applications.Sample Chapter(s)
Author: Bertrand Hochet Publisher: Springer Science & Business Media ISBN: 3540441433 Category : Computers Languages : en Pages : 510
Book Description
This book constitutes the refereed proceedings of the 12th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2002, held in Seville, Spain in September 2002. The 37 revised full papers and 12 poster papers presented were carefully reviewed and selected from numerous submissions. The papers are organized in topical sections on arithmetics, low-level modeling and characterization, asynchronous and adiabatic techniques, CAD tools and algorithms, timing, gate-level modeling and design, and communications modeling and activity reduction.
Author: Vassilis Paliouras Publisher: Springer ISBN: 3540320806 Category : Computers Languages : en Pages : 767
Book Description
Welcome to the proceedings of PATMOS 2005, the 15th in a series of international workshops.PATMOS2005wasorganizedbyIMECwithtechnicalco-sponsorshipfrom the IEEE Circuits and Systems Society. Over the years, PATMOS has evolved into an important European event, where - searchers from both industry and academia discuss and investigate the emerging ch- lenges in future and contemporary applications, design methodologies, and tools - quired for the developmentof upcominggenerationsof integrated circuits and systems. The technical program of PATMOS 2005 contained state-of-the-art technical contri- tions, three invited talks, a special session on hearing-aid design, and an embedded - torial. The technical program focused on timing, performance and power consumption, as well as architectural aspects with particular emphasis on modeling, design, char- terization, analysis and optimization in the nanometer era. The Technical Program Committee, with the assistance of additional expert revi- ers, selected the 74 papers to be presented at PATMOS. The papers were divided into 11 technical sessions and 3 poster sessions. As is always the case with the PATMOS workshops, the review process was anonymous, full papers were required, and several reviews were carried out per paper. Beyond the presentations of the papers, the PATMOS technical program was - riched by a series of speeches offered by world class experts, on important emerging research issues of industrial relevance. Prof. Jan Rabaey, Berkeley, USA, gave a talk on “Traveling the Wild Frontier of Ulta Low-Power Design”, Dr. Sung Bae Park, S- sung, gave a presentation on “DVL (Deep Low Voltage): Circuits and Devices”, Prof.
Author: Salvador Bracho del Pino Publisher: Ed. Universidad de Cantabria ISBN: 9788481023114 Category : Technology & Engineering Languages : en Pages : 756
Book Description
Este libro contiene las presentaciones de la XVII Conferencia de Diseño de Circuitos y Sistemas Integrados celebrado en el Palacio de la Magdalena, Santander, en noviembre de 2002. Esta Conferencia ha alcanzado un alto nivel de calidad, como consecuencia de su tradición y madurez, que lo convierte en uno de los acontecimientos más importantes para los circuitos de microelectrónica y la comunidad de diseño de sistemas en el sur de Europa. Desde su origen tiene una gran contribución de Universidades españolas, aunque hoy los autores participan desde catorce países
Author: Publisher: Institute of Electrical & Electronics Engineers(IEEE) ISBN: 9780769519111 Category : Computers Languages : en Pages : 380
Book Description
The growing awareness of the effects that simulation is having on the way we design our computing, communication, and control systems is leading to an increased demand for a better understanding of all aspects of simulation, ANSS'03 covers broad topics in the areas of distributed systems, network modeling, and advances in simulation methodology and practices.
Author: Raoul Velazco Publisher: Springer ISBN: 3030046605 Category : Technology & Engineering Languages : en Pages : 402
Book Description
This book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA’s in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects. Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures; Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments; Includes coverage of the impact of Small Satellites in the space industry.
Author: Manuel J. Bellido
Author: Manuel J. Bellido
Author: Bertrand Hochet
Author: Vassilis Paliouras
Author: Salvador Bracho del Pino
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Author: 
Author: 
Author: Raoul Velazco
Author: Arthur James Wells
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