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Author: S.J.L. Billinge Publisher: Springer Science & Business Media ISBN: 0306470772 Category : Technology & Engineering Languages : en Pages : 397
Book Description
This series of books, which is published at the rate of about one per year, addresses fundamental problems in materials science. The contents cover a broad range of topics from small clusters of atoms to engineering materials and involve chemistry, physics, materials science and engineering, with length scales ranging from Ångstroms up to millimeters. The emphasis is on basic science rather than on applications. Each book focuses on a single area of current interest and brings together leading experts to give an up-to-date discussion of their work and the work of others. Each article contains enough references that the interested reader can access the relevant literature. Thanks are given to the Center for Fundamental Materials Research at Michigan State University for supporting this series. M.F. Thorpe, Series Editor E-mail: thorpe @ pa.msu.edu East Lansing, Michigan PREFACE One of the most challenging problems in the study of structure is to characterize the atomic short-range order in materials. Long-range order can be determined with a high degree of accuracy by analyzing Bragg peak positions and intensities in data from single crystals or powders. However, information about short-range order is contained in the diffuse scattering intensity. This is difficult to analyze because it is low in absolute intensity (though the integrated intensity may be significant) and widely spread in reciprocal space.
Author: S.J.L. Billinge Publisher: Springer Science & Business Media ISBN: 0306470772 Category : Technology & Engineering Languages : en Pages : 397
Book Description
This series of books, which is published at the rate of about one per year, addresses fundamental problems in materials science. The contents cover a broad range of topics from small clusters of atoms to engineering materials and involve chemistry, physics, materials science and engineering, with length scales ranging from Ångstroms up to millimeters. The emphasis is on basic science rather than on applications. Each book focuses on a single area of current interest and brings together leading experts to give an up-to-date discussion of their work and the work of others. Each article contains enough references that the interested reader can access the relevant literature. Thanks are given to the Center for Fundamental Materials Research at Michigan State University for supporting this series. M.F. Thorpe, Series Editor E-mail: thorpe @ pa.msu.edu East Lansing, Michigan PREFACE One of the most challenging problems in the study of structure is to characterize the atomic short-range order in materials. Long-range order can be determined with a high degree of accuracy by analyzing Bragg peak positions and intensities in data from single crystals or powders. However, information about short-range order is contained in the diffuse scattering intensity. This is difficult to analyze because it is low in absolute intensity (though the integrated intensity may be significant) and widely spread in reciprocal space.
Author: Rozaliya I Barabash Publisher: World Scientific ISBN: 190897964X Category : Science Languages : en Pages : 478
Book Description
This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Author: H Daimon Publisher: World Scientific ISBN: 9813273682 Category : Science Languages : en Pages : 218
Book Description
Active-site is the region at the central atom’s position where functional activated reactions occur in many materials. Hence, it is important for the present study of material sciences to take into consideration this information of atomic structures in the reaction center of the localized impurities and catalyst and phase boundary and the photosynthetic reaction centers. However, it is very difficult to determine a three-dimensional atomic structure directly in the center positions of many functional materials.This book is written for readers to gain the basic knowledge of this “active-site”. It will benefit those who want to know the function and structure of the inorganic, organic and biological materials.
Author: Koichi Hayashi Publisher: Springer Nature ISBN: 9819952352 Category : Technology & Engineering Languages : en Pages : 458
Book Description
This book introduces characterizations of hyperordered structures using latest quantum beam technologies, the advanced theoretical methods for understanding the roles of the structures, and the state-of-the-arts materials containing the structures. In this book, the authors focus on the importance of defect complexes to improve functionality of crystals and that of orders of network structures to improve functionality of glass materials. These features can be regarded as interphases between perfect crystals and perfect amorphous, and they are the key factor for the evolution of materials science to a new dimension. The authors call such interphases "hyperordered structures" in this book. This is the first book that comprehensively summarizes glass science, defect science, and quantum beam science. It is valuable not only for active researchers in industry and academia but also graduate students.
Author: Uri Shmueli Publisher: Springer Science & Business Media ISBN: 9781402082054 Category : Science Languages : en Pages : 704
Book Description
International Tables for Crystallography are no longer available for purchase from Springer. For further information please contact Wiley Inc. (follow the link on the right hand side of this page). Volume B presents accounts of the numerous aspects of reciprocal space in crystallographic research. After an introductory chapter, Part 1 presents the reader with an account of structure-factor formalisms, an extensive treatment of the theory, algorithms and crystallographic applications of Fourier methods, and fundamental as well as advanced treatments of symmetry in reciprocal space. In Part 2, these general accounts are followed by detailed expositions of crystallographic statistics, the theory of direct methods, Patterson techniques, isomorphous replacement and anomalous scattering, and treatments of the role of electron microscopy and diffraction in crystal structure determination, including applications of direct methods to electron crystallography. Part 3 deals with applications of reciprocal space to molecular geometry and `best'-plane calculations, and contains a treatment of the principles of molecular graphics and modelling and their applications. A convergence-acceleration method of importance in the computation of approximate lattice sums is presented and the part concludes with a discussion of the Ewald method. Part 4 contains treatments of various diffuse-scattering phenomena arising from crystal dynamics, disorder and low dimensionality (liquid crystals), and an exposition of the underlying theories and/or experimental evidence. Polymer crystallography and reciprocal-space images of aperiodic crystals are also treated. Part 5 of the volume contains introductory treatments of the theory of the interaction of radiation with matter (dynamical theory) as applied to X-ray, electron and neutron diffraction techniques. The simplified trigonometric expressions for the structure factors in the 230 three-dimensional space groups, which appeared in Volume I of International Tables for X-ray Crystallography, are now given in Appendix 1.4.3 to Chapter 1.4 of this volume. Volume B is a vital addition to the library of scientists engaged in crystal structure determination, crystallographic computing, crystal physics and other fields of crystallographic research. Graduate students specializing in crystallography will find much material suitable for self-study and a rich source of references to the relevant literature.
Author: Takeshi Egami Publisher: Elsevier ISBN: 0080543383 Category : Technology & Engineering Languages : en Pages : 423
Book Description
* Introducing a unique method to study the atomic structure of nano-materials* Award winning research. Takeshi Egami received the 2003 Eugene Bertram Warren Diffraction Physics Award for the work described in the book.This book focuses on the structural determination of crystalline solids with extensive disorder. Well-established methods exist for characterizing the structure of fully crystalline solids or fully disordered materials such as liquids and glasses, but there is a dearth of techniques for the cases in-between, crystalline solids with internal atomic and nanometer scale disorder. Egami and Billinge discuss how to fill the gap using modern tools of structural characterization. While this subject might sound rather narrow, the fact is that today this problem is encountered in the structural characterization of a surprisingly wide range of complex materials of interest to modern technology and is becoming increasingly important.
Author: Alexander V. Kolobov Publisher: Springer Science & Business Media ISBN: 3642287050 Category : Technology & Engineering Languages : en Pages : 288
Book Description
A state-of-the-art description of metastability observed in chalcogenide alloys is presented with the accent on the underlying physics. A comparison is made between sulphur(selenium)-based chalcogenide glasses, where numerous photo-induced phenomena take place entirely within the amorphous phase, and tellurides where a reversible crystal-to-amorphous phase-change transformation is a major effect. Applications of metastability in devices¿optical memories and nonvolatile electronic phase-change random-access memories among others are discussed, including the latest trends. Background material essential for understanding current research in the field is also provided.
Author: Chunhai Fan Publisher: John Wiley & Sons ISBN: 352769711X Category : Technology & Engineering Languages : en Pages : 981
Book Description
Endlich ein Fachbuch mit detaillierten Informationen zu einer der fortschrittlichsten Methoden zur Materialcharakterisierung. Ein herausragendes Team aus Herausgebern und Autoren von renommierten Einrichtungen und Institutionen beschäftigt sich mit Synchrotron-Verfahren, die sich in der Materialforschung bewährt haben. Nach einer Einführung in die Synchrotronstrahlung und ihrer Quellen werden die verschiedenen Techniken beschrieben, die von diesem besonders hellen Licht profitieren, u. a. Röntgenabsorption, Diffraktion, Streuung, Bildgebung und Lithographie. Zum Schluss folgt ein Überblick über die Anwendungen der Synchrotronstrahlung in den Materialwissenschaften. Dieses einzigartige, unabdingbare Referenzwerk für akademische Forscher und Forscher aus der Industrie verbindet Spezialisten aus der Synchrotronforschung und Materialwissenschaftler.
Author: X D Xie Publisher: World Scientific ISBN: 9814552445 Category : Languages : en Pages : 658
Book Description
The Fourth International Conference on the Structure of Surfaces provides a forum for the report of new results and less the review of the status of surface structure and the relationship between surface and interface structure and physical or chemical properties of interest. Also within the scope of the meeting are novel experimental and theoretical approaches for the determination of surface and interface structures, computer simulation of dynamic processes and new developments in instrumentation.
Author: Jeroen A. van Bokhoven Publisher: John Wiley & Sons ISBN: 1118844238 Category : Science Languages : en Pages : 940
Book Description
X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x-ray absorption and emission spectroscopy. This progress includes considerable technological improvements in the design and production of detectors especially with the development and expansion of large-scale synchrotron reactors All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x-ray based analysis techniques for the near future. This comprehensive two-volume treatise features articles that explain the phenomena and describe examples of X-ray absorption and emission applications in several fields, including chemistry, biochemistry, catalysis, amorphous and liquid systems, synchrotron radiation, and surface phenomena. Contributors explain the underlying theory, how to set up X-ray absorption experiments, and how to analyze the details of the resulting spectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications: Combines the theory, instrumentation and applications of x-ray absorption and emission spectroscopies which offer unique diagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchers across multi-disciplines since intense beams from modern sources have revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers working on x-rays and related synchrotron sources and applications in materials, physics, medicine, environment/geology, and biomedical materials
Author: S.J.L. Billinge
Author: S.J.L. Billinge
Author: Rozaliya I Barabash
Author: H Daimon
Author: Koichi Hayashi
Author: Uri Shmueli
Author: Takeshi Egami
Author: Alexander V. Kolobov
Author: Chunhai Fan
Author: X D Xie
Author: Jeroen A. van Bokhoven