Author: Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1644
Book Description
Nuclear Science Abstracts
Author: Lifetimes and Transition Probabilities for States in the First Excited Configuration of Atomic Iodine
Author: Lloyd Gordon WilliamsPublisher:
ISBN:
Category : Atomic spectra
Languages : en
Pages : 428
Book Description
Journal of the Optical Society of America
Author: Optical Society of AmericaPublisher:
ISBN:
Category : Optical instruments
Languages : en
Pages : 438
Book Description
AFOSR.
Author: United States. Air Force. Office of Scientific ResearchPublisher:
ISBN:
Category : Research
Languages : en
Pages : 968
Book Description
Nuclear Data
Author: Optics Index
Author: Optics Letters
Author: Anion Sensing
Author: Ivan StiborPublisher: Springer
ISBN: 9783642445187
Category : Science
Languages : en
Pages : 0
Book Description
with contributions by numerous experts
Measurement of Carrier Lifetime in Semiconductors
Author: W. Murray BullisPublisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 68
Book Description
About 300 papers concerned with the measurement and interpretation of carrier lifetime in semiconductors are listed together with key words and a brief comment for each. Eight types of entries are included: Description of Methods, Analysis of Results, Standard Methods, Experimental Results, Theroetical Models, Auxiliary Procedures and Data, Reviews, and Books. Emphasis is placed on methods of carrying out measurements of carrier lifetime. Hence complete coverage was attempted and nearly two thirds of the entries appear in the first three categories. A large fraction of the papers listed describe the photoconductivity or photoconductive decay methods. The other most popular methods are based on diode characteristics or the photomagnetoelectric effect. In all, 35 methods for measuring carrier lifetime are represented by entries. In addition, representative papers which describe various models for recombination are included together with a number of papers which discuss the influence of surface recombination and trapping phenomena. Auxiliary procedures such as surface preparation, formation of ohmic contacts, control of temperature, and the like are described in some of the entries. Two indexes, a Key Word Index and an Author Index, are provided together with a classification of the various methods for measuring carrier lifetime. (Author).
Author: