LA TRANSITION ISOLANT-METAL DANS LES SEMICONDUCTEURS DOPES PDF Download

Author: Abdelwahab Ghazali
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Category :
Languages : fr
Pages : 294

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ETUDE DE LA TRANSITION ISOLANT-METAL DANS LES SEMICONDUCTEURS DOPES EN UTILISANT LA METHODE DE LA FONCTIONNELLE DE LA DENSITE DE SPIN, A TEMPERATURE NON NULLE. COMPARAISON AVEC LES RESULTATS OBTENUS PAR DIFFERENTES METHODES EXPERIMENTALES (TRANSPORT, R.P.E., CHALEUR MASSIQUE, SUSCEPTIBILITE MAGNETIQUE, EFFET RAMAN)

Author: Abdelwahab Ghazali (auteur d'une thèse de sciences.)
Publisher:
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Category :
Languages : fr
Pages : 208

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Category : Physics
Languages : en
Pages : 1588

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Author: Michel Rosso
Publisher:
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Category :
Languages : fr
Pages : 108

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ECHANTILLONS, SPECTROMETRE. OBSERVATION D'UN DEDOUBLEMENT DU SPECTRE RPE DU A DES INHOMOGENEITES DE CONCENTRATION. ETUDE DU DEPLACEMENT ET DE LA LARGEUR DE LA RAIE DE RESONNANCE ELECTRONIQUE DANS SI-P DANS LA REGION DE CONCENTRATION INTERMEDIAIRE 10**(17)

Author:
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Category : Magnetic semiconductors
Languages : en
Pages : 404

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Category : Research
Languages : en
Pages : 1058

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Sections 1-2. Keyword Index.--Section 3. Personal author index.--Section 4. Corporate author index.-- Section 5. Contract/grant number index, NTIS order/report number index 1-E.--Section 6. NTIS order/report number index F-Z.

Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800

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This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Author: Jon Paul Janet
Publisher: American Chemical Society
ISBN: 0841299005
Category : Science
Languages : en
Pages : 189

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Recent advances in machine learning or artificial intelligence for vision and natural language processing that have enabled the development of new technologies such as personal assistants or self-driving cars have brought machine learning and artificial intelligence to the forefront of popular culture. The accumulation of these algorithmic advances along with the increasing availability of large data sets and readily available high performance computing has played an important role in bringing machine learning applications to such a wide range of disciplines. Given the emphasis in the chemical sciences on the relationship between structure and function, whether in biochemistry or in materials chemistry, adoption of machine learning by chemistsderivations where they are important

Author: Gurinder Kaur Ahluwalia
Publisher: Springer
ISBN: 9783319822891
Category : Technology & Engineering
Languages : en
Pages : 0

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This book introduces readers to a wide range of applications for elements in Group 16 of the periodic table, such as, optical fibers for communication and sensing, X-ray imaging, electrochemical sensors, data storage devices, biomedical applications, photovoltaics and IR detectors, the rationale for these uses, the future scope of their applications, and expected improvements to existing technologies. Following an introductory section, the book is broadly divided into three parts—dealing with Sulfur, Selenium, and Tellurium. The sections cover the basic structure of the elements and their compounds in bulk and nanostructured forms; properties that make these useful for various applications, followed by applications and commercial products. As the global technology revolution necessitates the search for new materials and more efficient devices in the electronics and semiconductor industry, Applications of Chalcogenides: S, Se, and Te is an ideal book for a wide range of readers in industry, government and academic research facilities looking beyond silicon for materials used in the electronic and optoelectronic industry as well as biomedical applications.

Author:
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ISBN:
Category : Nuclear energy
Languages : en
Pages : 1166

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