Journal of the Royal Microscopical Society PDF Download

Author:
Publisher:
ISBN:
Category : Microscopy
Languages : en
Pages : 934

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Author: Anonymous
Publisher: BoD – Books on Demand
ISBN: 3368657739
Category : Fiction
Languages : en
Pages : 630

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Reprint of the original, first published in 1887.

Author: Royal Microscopical Society (Great Britain)
Publisher:
ISBN:
Category : Microscopy
Languages : en
Pages : 676

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Author: Jeremy Sanderson
Publisher: John Wiley & Sons
ISBN: 0470973757
Category : Science
Languages : en
Pages : 848

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Introduces readers to the enlightening world of the modern light microscope There have been rapid advances in science and technology over the last decade, and the light microscope, together with the information that it gives about the image, has changed too. Yet the fundamental principles of setting up and using a microscope rests upon unchanging physical principles that have been understood for years. This informative, practical, full-colour guide fills the gap between specialised edited texts on detailed research topics, and introductory books, which concentrate on an optical approach to the light microscope. It also provides comprehensive coverage of confocal microscopy, which has revolutionised light microscopy over the last few decades. Written to help the reader understand, set up, and use the often very expensive and complex modern research light microscope properly, Understanding Light Microscopy keeps mathematical formulae to a minimum—containing and explaining them within boxes in the text. Chapters provide in-depth coverage of basic microscope optics and design; ergonomics; illumination; diffraction and image formation; reflected-light, polarised-light, and fluorescence microscopy; deconvolution; TIRF microscopy; FRAP & FRET; super-resolution techniques; biological and materials specimen preparation; and more. Gives a didactic introduction to the light microscope Encourages readers to use advanced fluorescence and confocal microscopes within a research institute or core microscopy facility Features full-colour illustrations and workable practical protocols Understanding Light Microscopy is intended for any scientist who wishes to understand and use a modern light microscope. It is also ideal as supporting material for a formal taught course, or for individual students to learn the key aspects of light microscopy through their own study.

Author: Royal Microscopical Society (Great Britain)
Publisher:
ISBN:
Category : Microscope and microscopy
Languages : en
Pages : 462

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Author: P.W. Hawkes
Publisher: Springer Science & Business Media
ISBN: 0387497625
Category : Technology & Engineering
Languages : en
Pages : 1336

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This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Author: Anonymous
Publisher: BoD – Books on Demand
ISBN: 3368844555
Category : Fiction
Languages : en
Pages : 346

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Reprint of the original, first published in 1874.

Author: Chris Jacobsen
Publisher: Cambridge University Press
ISBN: 1107076579
Category : Medical
Languages : en
Pages : 594

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A complete introduction to x-ray microscopy, covering optics, 3D and chemical imaging, lensless imaging, radiation damage, and applications.

Author: Patrick Echlin
Publisher: Springer Science & Business Media
ISBN: 0387857311
Category : Technology & Engineering
Languages : en
Pages : 329

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Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Author: Royal Microscopical Society
Publisher:
ISBN:
Category :
Languages : en
Pages : 156

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