Author: Electronic Device Failure Analysis SocietyPublisher: ASM International
ISBN: 1615030891
Category : Technology & Engineering
Languages : en
Pages : 524
Book Description
ISTFA 2006
Author: Electronic Device Failure Analysis SocietyPublisher: ASM International
ISBN: 1615030891
Category : Technology & Engineering
Languages : en
Pages : 524
Book Description
Istfa 2005
Author: ASM InternationalPublisher: ASM International
ISBN: 1615030883
Category : Technology & Engineering
Languages : en
Pages : 524
Book Description
Thirty-fourth International Symposium for Testing and Failure Analysis
Author: ASM InternationalPublisher: ASM International
ISBN: 1615030913
Category : Electronic apparatus and appliances
Languages : en
Pages : 551
Book Description
ISTFA 2013
Author: A. S. M. InternationalPublisher: ASM International
ISBN: 1627080228
Category : Technology & Engineering
Languages : en
Pages : 634
Book Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
ISTFA 2009
Author: Publisher: ASM International
ISBN: 1615030921
Category : Technology & Engineering
Languages : en
Pages : 371
Book Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis
Author: ASM InternationalPublisher: ASM International
ISBN: 1615030905
Category : Technology & Engineering
Languages : en
Pages : 372
Book Description
Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
ISTFA 2012
Author: ASM InternationalPublisher: ASM International
ISBN: 1615039953
Category : Technology & Engineering
Languages : en
Pages : 643
Book Description
ISTFA 2011
Author: Publisher: ASM International
ISBN: 1615038507
Category : Technology & Engineering
Languages : en
Pages : 479
Book Description
ISTFA 2010
Author: Publisher: ASM International
ISBN: 1615037276
Category : Technology & Engineering
Languages : en
Pages : 487
Book Description
ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis
Author: Publisher: ASM International
ISBN: 1627082735
Category : Technology & Engineering
Languages : en
Pages : 540
Book Description
The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.