ISTFA 1997: International Symposium for Testing and Failure Analysis PDF Download

Author: Grace M. Davidson
Publisher: ASM International
ISBN: 1615030824
Category : Technology & Engineering
Languages : en
Pages : 310

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Author: ASM International
Publisher: Asm International
ISBN: 9780871706195
Category : Medical
Languages : en
Pages : 346

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Proceedings of the October 1997 symposium, of interest to engineers involved in testing and failure analysis of semiconductor devices. Contains sections on testing and signature analysis, techniques, micro-electric-mechanical systems, discretes, packaging/E-beam, FIB/E- beam, and case histories. Specific topics include gain reduction in silicon pho

Author: ASM International
Publisher: ASM International
ISBN: 1627082735
Category : Technology & Engineering
Languages : en
Pages : 540

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The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.

Author: ASM International
Publisher: ASM International
ISBN: 161503076X
Category : Technology & Engineering
Languages : en
Pages : 453

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Author: ASM International
Publisher: ASM International
ISBN: 1627081518
Category : Technology & Engineering
Languages : en
Pages : 666

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The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

Author:
Publisher: ASM International
ISBN: 1615037276
Category : Technology & Engineering
Languages : en
Pages : 487

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Author: Zhiyong Ma
Publisher: CRC Press
ISBN: 135173394X
Category : Science
Languages : en
Pages : 889

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Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Author: ASM International
Publisher: ASM International
ISBN: 1615030913
Category : Electronic apparatus and appliances
Languages : en
Pages : 551

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Author:
Publisher: ASM International
ISBN: 1615038507
Category : Technology & Engineering
Languages : en
Pages : 479

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Author:
Publisher:
ISBN:
Category : Silicon dioxide
Languages : en
Pages : 306

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