Ionization Curves for Secondary Ions in Mass-spectrometer Ion Sources PDF Download
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Author: U. Lauterbach Publisher: ISBN: Category : Deuterium Languages : en Pages : 36
Book Description
An automatic version of the R.P.D. (Retarding Potential Difference) method was developed for obtaining digital ionization curves of secondary ions by using counting techniques and a multi-channel analyzer. The application of an indirectly heated sintered Nickel cathode yielded ca. 40 percent of the total electron current within an energy range of 0.1 eV. The R.P.D. ion source in connection with the automation circuit and a conventional mass spectrometer were used to investigate the formation of KrD(+) ions in Kr-D2 mixtures. It is shown that besides the well known reaction Kr(+) + D2 yields KrD(+) + D the complementary reaction D2(+) + Kr yields KrD(+) + D contributes considerably to the KrD(+) yield. A rather small contribution of the neutral reaction Kr(*) + D2 yields KrD(+) + D + e( - ), found earlier by Hotop, could be confirmed. Strong evidence was found for the existence of a reaction path D2(*) + Kr yields KrD(+) + D + e( - ) by longlived exited states of D2 above the first ionization limit of D2.
Author: U. Lauterbach Publisher: ISBN: Category : Deuterium Languages : en Pages : 36
Book Description
An automatic version of the R.P.D. (Retarding Potential Difference) method was developed for obtaining digital ionization curves of secondary ions by using counting techniques and a multi-channel analyzer. The application of an indirectly heated sintered Nickel cathode yielded ca. 40 percent of the total electron current within an energy range of 0.1 eV. The R.P.D. ion source in connection with the automation circuit and a conventional mass spectrometer were used to investigate the formation of KrD(+) ions in Kr-D2 mixtures. It is shown that besides the well known reaction Kr(+) + D2 yields KrD(+) + D the complementary reaction D2(+) + Kr yields KrD(+) + D contributes considerably to the KrD(+) yield. A rather small contribution of the neutral reaction Kr(*) + D2 yields KrD(+) + D + e( - ), found earlier by Hotop, could be confirmed. Strong evidence was found for the existence of a reaction path D2(*) + Kr yields KrD(+) + D + e( - ) by longlived exited states of D2 above the first ionization limit of D2.
Author: U. Lauterbach Publisher: ISBN: Category : Deuterium Languages : en Pages : 0
Book Description
An automatic version of the R.P.D. (Retarding Potential Difference) method was developed for obtaining digital ionization curves of secondary ions by using counting techniques and a multi-channel analyzer. The application of an indirectly heated sintered Nickel cathode yielded ca. 40 percent of the total electron current within an energy range of 0.1 eV. The R.P.D. ion source in connection with the automation circuit and a conventional mass spectrometer were used to investigate the formation of KrD(+) ions in Kr-D2 mixtures. It is shown that besides the well known reaction Kr(+) + D2 yields KrD(+) + D the complementary reaction D2(+) + Kr yields KrD(+) + D contributes considerably to the KrD(+) yield. A rather small contribution of the neutral reaction Kr(*) + D2 yields KrD(+) + D + e( - ), found earlier by Hotop, could be confirmed. Strong evidence was found for the existence of a reaction path D2(*) + Kr yields KrD(+) + D + e( - ) by longlived exited states of D2 above the first ionization limit of D2.
Author: V. T. Cherepin Publisher: CRC Press ISBN: 1000083136 Category : Science Languages : en Pages : 127
Book Description
This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.
Author: J. C. Vickerman Publisher: Oxford University Press, USA ISBN: Category : Business & Economics Languages : en Pages : 368
Book Description
This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.
Author: Fred Stevie Publisher: Momentum Press ISBN: 1606505890 Category : Technology & Engineering Languages : en Pages : 233
Book Description
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Author: Robert G. Wilson Publisher: Wiley-Interscience ISBN: Category : Science Languages : en Pages : 392
Book Description
Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Benninghoven, F. G. Rüdenauer, and H. W. Werner "[This book] is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry." —Trends in Analytical Chemistry "This is a monumental work, and contains nearly 600 illustrations and over 2,000 references covering nearly all the essential published information up to 1985. The book will certainly find its place as a reference work in most laboratories using this methodology" —Analytica Chimica Acta 1987 (0 471-01056-1) 1,227 pp. Secondary Ion Mass Spectrometry Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI) Edited by A. Benninghoven, A.M. Huber, and H. W. Werner "The international SIMS conferences have been held every two years since 1977. They are recognized as one of the major forums for scientists, instrument manufacturers, and other researchers actively engaged in this rapidly expanding field…this volume is a valuable account of the latest advances in the field of SIMS, and of the research trends of some of the most respected experts in the field.…it is recommended for the libraries of all academic and industrial institutions where SIMS research is ongoing.…it should prove a valuable reference source for years to come." —Applied Spectroscopy 1988 (0 471-91832-6) 1,078 pp.
Author: Alfred Benninghoven Publisher: Springer Science & Business Media ISBN: 3642827241 Category : Science Languages : en Pages : 578
Book Description
This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.
Author: J. C. Vickerman Publisher: IM Publications ISBN: 1906715173 Category : Mass spectrometry Languages : en Pages : 742
Book Description
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Author: U. Lauterbach
Author: U. Lauterbach
Author: U. Lauterbach
Author: V. T. Cherepin
Author: J. C. Vickerman
Author: Fred Stevie
Author: Kurt F. J. Heinrich
Author: Charles E. Melton
Author: Robert G. Wilson
Author: Alfred Benninghoven
Author: J. C. Vickerman