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Investigation of Zinc Tin Oxide Thin Films and Their UV Optoelectrical Devices Fabricated by RF Sputtering

Investigation of Zinc Tin Oxide Thin Films and Their UV Optoelectrical Devices Fabricated by RF Sputtering PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 0

Book Description


Investigation of Zinc Tin Oxide Thin Films and Their UV Optoelectrical Devices Fabricated by RF Sputtering

Investigation of Zinc Tin Oxide Thin Films and Their UV Optoelectrical Devices Fabricated by RF Sputtering PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 0

Book Description


Investigation of Zinc Tin Oxide Thin Films and Their Optoelectrical Applications Fabricated by RF Sputtering System

Investigation of Zinc Tin Oxide Thin Films and Their Optoelectrical Applications Fabricated by RF Sputtering System PDF Author: 楊宸權
Publisher:
ISBN:
Category :
Languages : en
Pages : 111

Book Description


Investigation of Silicon Zinc Tin Oxide Thin Films and Their Optoelectrical Applications Fabricated by RF Sputtering

Investigation of Silicon Zinc Tin Oxide Thin Films and Their Optoelectrical Applications Fabricated by RF Sputtering PDF Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 0

Book Description


Fabrication of Zinc Nitride Thin Films Using RF Magnetron Sputtering Deposition for Optoelectronic Applications

Fabrication of Zinc Nitride Thin Films Using RF Magnetron Sputtering Deposition for Optoelectronic Applications PDF Author: Ting Wen
Publisher:
ISBN:
Category : Optoelectronics
Languages : en
Pages : 122

Book Description
Zinc nitride thin films possess a small optical band gap with direct transition, low resistivity, high mobility and carrier concentration. Therefore, it may be suitable as an optoelectronic material for infrared sensors, smart windows and energy conversion devices. The objective of this work is to grow zinc nitride thin films using RF magnetron sputtering, understand its mechanical, optical, and electrical properties, and investigate its performance as light sensing devices. Synthesis and characterization of zinc nitride thin films has been investigated in this work. An RF magnetron sputtering deposition was employed to synthesize zinc nitride thin films using pure metal zinc target in either N2-Ar or N2-Ar-H2 mixtures. The microstructural, optical and electrical characterizations of the representative films were investigated with stylus profilometry, XRD, AFM, SEM, TEM, UV-VIS-NIR double beam spectrometry, and Hall effect measurement. The photoresponse of the zinc nitride photoconductors was also studied under the irradiation of white light and NIR light. The as-deposited zinc nitride thin films were relatively soft and densely packed with smooth surface. It possesses a narrow optical band gap in the NIR range with direct transition. The zinc nitride showed n-type conductivity with low resistivity and high carrier concentration. To study the RF discharge power effect, the zinc nitride thin films were synthesized at different discharge powers densities. With discharge power density increasing, the film deposition rate increased, and the zinc nitride films acquired better crystalline structure, smaller optical band gap and less oxygen contaminations. After thermal annealing at moderate temperatures in either air or O2, the annealed zinc nitride thin films were photoconductive under irradiation of both NIR light and white light. The largest photoresponse and fastest response times were measured at the room temperature for the zinc nitride thin films annealed at 300 degree in the air. Hydrogen inclusion can modify the electrical and optical properties of crystalline semiconductor films by introducing impurity donor states. The ZnNx:H films deposited in N2-Ar-H2 mixture acquired less oxygen contamination and higher relative nitrogen atom concentration than the ZnNx films deposited in N2-Ar mixture. The as-deposited ZnNx:H films showed a clear photonic behavior under white light irradiation, and the annealed ZnNx:H films exhibited a pronounced change in resistance under both white light and NIR light irradiation comparing to the annealed ZnNx films. This was the first time to report photoresponse of zinc nitride thin films fabricated by reactive sputtering method. The photoconductivity was gradually improved by optimization of deposition conditions, annealing conditions and film compositions.

Optimisation of ZnO Thin Films

Optimisation of ZnO Thin Films PDF Author: Saurabh Nagar
Publisher: Springer
ISBN: 9811008094
Category : Technology & Engineering
Languages : en
Pages : 101

Book Description
This monograph describes the different implantation mechanisms which can be used to achieve strong, reliable and stable p-type ZnO thin films. The results will prove useful in the field of optoelectronics in the UV region. This book will prove useful to research scholars and professionals working on doping and implantation of ZnO thin films and subsequently fabricating optoelectronic devices. The first chapter of the monograph emphasises the importance of ZnO in the field of optoelectronics for ultraviolet (UV) region and also discusses the material, electronic and optical properties of ZnO. The book then goes on to discuss the optimization of pulsed laser deposited (PLD) ZnO thin films in order to make successful p-type films. This can enable achievement of high optical output required for high-efficiency devices. The book also discusses a hydrogen implantation study on the optimized films to confirm whether the implantation leads to improvement in the optimized results.

Zinc Oxide Bulk, Thin Films and Nanostructures

Zinc Oxide Bulk, Thin Films and Nanostructures PDF Author: Chennupati Jagadish
Publisher: Elsevier
ISBN: 0080464033
Category : Science
Languages : en
Pages : 600

Book Description
With an in-depth exploration of the following topics, this book covers the broad uses of zinc oxide within the fields of materials science and engineering:- Recent advances in bulk , thin film and nanowire growth of ZnO (including MBE, MOCVD and PLD), - The characterization of the resulting material (including the related ternary systems ZgMgO and ZnCdO), - Improvements in device processing modules (including ion implantation for doping and isolation ,Ohmic and Schottky contacts , wet and dry etching), - The role of impurities and defects on materials properties - Applications of ZnO in UV light emitters/detectors, gas, biological and chemical-sensing, transparent electronics, spintronics and thin film

Investigation of Oxide Semiconductor Based Thin Films

Investigation of Oxide Semiconductor Based Thin Films PDF Author: Meena Suhanya Rajachidambaram
Publisher:
ISBN:
Category : Coating processes
Languages : en
Pages : 130

Book Description
Nanostructured ZnO films were obtained via thermal oxidation of thin films formed with metallic Zn-nanoparticle dispersions. Commercial zinc nanoparticles used for this work were characterized by microscopic and thermal analysis methods to analyze the Zn-ZnO core shell structure, surface morphology and oxidation characteristics. These dispersions were spin-coated on SiO2/Si substrates and then annealed in air between 100 and 600 °C. Significant nanostructural changes were observed for the resulting films, particularly those from larger Zn nanoparticles. These nanostructures, including nanoneedles and nanorods, were likely formed due to fracturing of ZnO outer shell due to differential thermal expansion between the Zn core and the ZnO shell. At temperatures above 227 °C, the metallic Zn has a high vapor pressure leading to high mass transport through these defects. Ultimately the Zn vapor rapidly oxidizes in air to form the ZnO nanostructures. We have found that the resulting films annealed above 400 °C had high electrical resistivity. The zinc nanoparticles were incorporated into zinc indium oxide solution and spin-coated to form thin film transistor (TFT) test structures to evaluate the potential of forming nanostructured field effect sensors using simple solution processing. The functionalization of zinc tin oxide (ZTO) films with self-assembled monolayers (SAMs) of n-hexylphosphonic acid (n-HPA) was investigated. The n-HPA modified ZTO surfaces were characterized using contact angle measurement, x-ray photoelectron spectroscopy (XPS) and electrical measurements. High contact angles were obtained suggesting high surface coverage of n-HPA on the ZTO films, which was also confirmed using XPS. The impact of n-HPA functionalization on the stability of ZTO TFTs was investigated. The n-HPA functionalized ZTO TFTs were either measured directly after drying or after post-annealing at 140 °C for 48 hours in flowing nitrogen. Their electrical characteristics were compared with that of non-functionalized ZTO reference TFTs fabricated using identical conditions. We found that the non-functionalized devices had a significant turn-on voltage (V[subscript ON]) shift of ~0.9 V and ~1.5 V for the non-annealed and the post-annealed conditions under positive gate bias stress for 10,000 seconds. The n-HPA modified devices showed very minimal shift in V[subscript ON] (0.1 V), regardless of post-thermal treatment. The VON instabilities were attributed to the interaction of species from the ambient atmosphere with the exposed ZTO back channel during gate voltage stress. These species can either accept or donate electrons resulting in changes in the channel conductance with respect to the applied stress.

Zinc Oxide - A Material for Micro- and Optoelectronic Applications

Zinc Oxide - A Material for Micro- and Optoelectronic Applications PDF Author: Norbert H. Nickel
Publisher: Springer Science & Business Media
ISBN: 140203475X
Category : Science
Languages : en
Pages : 245

Book Description
Recently, a significant effort has been devoted to the investigation of ZnO as a suitable semiconductor for UV light-emitting diodes, lasers, and detectors and hetero-substrates for GaN. Research is driven not only by the technological requirements of state-of-the-art applications but also by the lack of a fundamental understanding of growth processes, the role of intrinsic defects and dopants, and the properties of hydrogen. The NATO Advanced Research Workshop on “Zinc oxide as a material for micro- and optoelectronic applications”, held from June 23 to June 25 2004 in St. Petersburg, Russia, was organized accordingly and started with the growth of ZnO. A variety of growth methods for bulk and layer growth were discussed. These techniques comprised growth methods such as closed space vapor transport (CSVT), metal-organic chemical vapor deposition, reactive ion sputtering, and pulsed laser deposition. From a structural point of view using these growth techniques ZnO can be fabricated ranging from single crystalline bulk material to polycrystalline ZnO and nanowhiskers. A major aspect of the ZnO growth is doping. n-type doping is relatively easy to accomplish with elements such al Al or Ga. At room temperature single crystal ZnO exhibits a resistivity of about 0. 3 -cm, an electron mobility of 2 17 -3 225 cm /Vs, and a carrier concentration of 10 cm . In n-type ZnO two shallow donors are observable with activation energies of 30 – 40 meV and 60 – 70 meV.

Thinfilm Schottky Barriers and Heterojunctions

Thinfilm Schottky Barriers and Heterojunctions PDF Author: Sumbit Chaliha
Publisher: LAP Lambert Academic Publishing
ISBN: 9783848429653
Category :
Languages : en
Pages : 276

Book Description
Semiconductor thin films and their junctions such as metal-semiconductor (Schottky barrier) and heterojunctions have received much attention due to their applications in various electronic and optoelectronic devices including solar cells. This book is based on the electrical and optical studies of thin film Schottky barriers and heterojunctions with an aim to use in optoelectronic devices. In this work, two wide band gap semiconductors, one Zinc Selenide (ZnSe) from group II-VI, and another transparent conducting oxide, Indium Tin Oxide are investigated in the forms of thin films and their junctions, for the possible uses as photovoltaic converter. The structural, morphological, optical and electrical (in dark and under illumination) properties of ZnSe and ITO thin films prepared at different growth conditions by thermal evaporation method have been studied by applying different experimental techniques. Schottky barriers and heterojunctions of ZnSe with different barrier metals and semiconductors have been fabricated and their current-voltage and photovoltaic characteristics are studied. The findings of it presented in this book will be helpful for the researchers of this field.

Copper Zinc Tin Sulfide Thin Films for Photovoltaics

Copper Zinc Tin Sulfide Thin Films for Photovoltaics PDF Author: Jonathan J. Scragg
Publisher: Springer Science & Business Media
ISBN: 3642229190
Category : Science
Languages : en
Pages : 220

Book Description
Jonathan Scragg documents his work on a very promising material suitable for use in solar cells. Copper Zinc Tin Sulfide (CZTS) is a low cost, earth-abundant material suitable for large scale deployment in photovoltaics. Jonathan pioneered and optimized a low cost route to this material involving electroplating of the three metals concerned, followed by rapid thermal processing (RTP) in sulfur vapour. His beautifully detailed RTP studies – combined with techniques such as XRD, EDX and Raman – reveal the complex relationships between composition, processing and photovoltaic performance. This exceptional thesis contributes to the development of clean, sustainable and alternative sources of energy