Author: Benjamin Michael Dvorak
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Investigation of the Near Surface Mechanical Properties of Au-Si Thin Films
Investigation of the Near Surface Mechanical Properties of Au-Ti Thin Films
Thin Films: Stresses and Mechanical Properties IX: Volume 695
Author: Materials Research Society. Meeting
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 544
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 544
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
2012
Author:
Publisher: Walter de Gruyter
ISBN: 3110278715
Category : Reference
Languages : en
Pages : 3064
Book Description
Particularly in the humanities and social sciences, festschrifts are a popular forum for discussion. The IJBF provides quick and easy general access to these important resources for scholars and students. The festschrifts are located in state and regional libraries and their bibliographic details are recorded. Since 1983, more than 659,000 articles from more than 30,500 festschrifts, published between 1977 and 2011, have been catalogued.
Publisher: Walter de Gruyter
ISBN: 3110278715
Category : Reference
Languages : en
Pages : 3064
Book Description
Particularly in the humanities and social sciences, festschrifts are a popular forum for discussion. The IJBF provides quick and easy general access to these important resources for scholars and students. The festschrifts are located in state and regional libraries and their bibliographic details are recorded. Since 1983, more than 659,000 articles from more than 30,500 festschrifts, published between 1977 and 2011, have been catalogued.
Thin Films: Volume 875
Author: Thomas E. Buchheit
Publisher: Cambridge University Press
ISBN: 9781558998292
Category : Technology & Engineering
Languages : en
Pages : 480
Book Description
This book has a long tradition of representing current topics in thin-film properties and how they are related to the performance and reliability of thin-film structures. Several emerging and well-developed technologies rely on understanding the behavior of these structures. This book provides a forum for an exchange of ideas among researchers who are interested in the mechanical behavior of thin films, broadly applied to their materials choice or methodology. The book focuses on stress-related phenomena in thin films for a wide range of materials. Of particular interest are studies that explore the frontiers of thin-film materials science with regard to materials selection or size scale. Topics include: elasticity in thin films; characterizing thin films by nanoindentation; mechanical behavior of nanostructured films; mechanical properties of thin; thin-film plasticity; thin-film plasticity; thin-film plasticity; novel testing techniques; in situ characterization techniques; adhesion and fracture of thin films; fatigue and stress in interconnect and metallization; deformation, growth and microstructure in thin films and thin-film processing.
Publisher: Cambridge University Press
ISBN: 9781558998292
Category : Technology & Engineering
Languages : en
Pages : 480
Book Description
This book has a long tradition of representing current topics in thin-film properties and how they are related to the performance and reliability of thin-film structures. Several emerging and well-developed technologies rely on understanding the behavior of these structures. This book provides a forum for an exchange of ideas among researchers who are interested in the mechanical behavior of thin films, broadly applied to their materials choice or methodology. The book focuses on stress-related phenomena in thin films for a wide range of materials. Of particular interest are studies that explore the frontiers of thin-film materials science with regard to materials selection or size scale. Topics include: elasticity in thin films; characterizing thin films by nanoindentation; mechanical behavior of nanostructured films; mechanical properties of thin; thin-film plasticity; thin-film plasticity; thin-film plasticity; novel testing techniques; in situ characterization techniques; adhesion and fracture of thin films; fatigue and stress in interconnect and metallization; deformation, growth and microstructure in thin films and thin-film processing.
Thin Films, Stresses and Mechanical Properties
Preparation and Properties of Thin Films
Author: K. N. Tu
Publisher: Elsevier
ISBN: 1483218295
Category : Technology & Engineering
Languages : en
Pages : 351
Book Description
Treatise on Materials Science and Technology, Volume 24: Preparation and Properties of Thin Films covers the progress made in the preparation of thin films and the corresponding study of their properties. The book discusses the preparation and property correlations in thin film; the variation of microstructure of thin films; and the molecular beam epitaxy of superlattices in thin film. The text also describes the epitaxial growth of silicon structures (thermal-, laser-, and electron-beam-induced); the characterization of grain boundaries in bicrystalline thin films; and the mechanical properties of thin films on substrates. The ion beam modification of thin film; the use of thin alloy films for metallization in microelectronic devices; and the fabrication and physical properties of ultrasmall structures are also encompassed. Materials scientists and materials engineers will find the book invaluable.
Publisher: Elsevier
ISBN: 1483218295
Category : Technology & Engineering
Languages : en
Pages : 351
Book Description
Treatise on Materials Science and Technology, Volume 24: Preparation and Properties of Thin Films covers the progress made in the preparation of thin films and the corresponding study of their properties. The book discusses the preparation and property correlations in thin film; the variation of microstructure of thin films; and the molecular beam epitaxy of superlattices in thin film. The text also describes the epitaxial growth of silicon structures (thermal-, laser-, and electron-beam-induced); the characterization of grain boundaries in bicrystalline thin films; and the mechanical properties of thin films on substrates. The ion beam modification of thin film; the use of thin alloy films for metallization in microelectronic devices; and the fabrication and physical properties of ultrasmall structures are also encompassed. Materials scientists and materials engineers will find the book invaluable.
Scientific and Technical Aerospace Reports
Physics and Mechanics of New Materials and Their Applications
Author: Ivan A. Parinov
Publisher: Springer Nature
ISBN: 3030764818
Category : Technology & Engineering
Languages : en
Pages : 601
Book Description
This book presents selected peer-reviewed contributions from the 2020 International Conference on “Physics and Mechanics of New Materials and Their Applications”, PHENMA 2020 (26–29 March 2021, Kitakyushu, Japan), focusing on processing techniques, physics, mechanics, and applications of advanced materials. The book describes a broad spectrum of promising nanostructures, crystal structures, materials, and composites with unique properties. It presents nanotechnological design approaches, environmental-friendly processing techniques, and physicochemical as well as mechanical studies of advanced materials. The selected contributions describe recent progress in computational materials science methods and algorithms (in particular, finite-element and finite-difference modelling) applied to various technological, mechanical, and physical problems. The presented results are important for ongoing efforts concerning the theory, modelling, and testing of advanced materials. Other results are devoted to promising devices with higher accuracy, increased longevity, and greater potential to work effectively under critical temperatures, high pressure, and in aggressive environments.
Publisher: Springer Nature
ISBN: 3030764818
Category : Technology & Engineering
Languages : en
Pages : 601
Book Description
This book presents selected peer-reviewed contributions from the 2020 International Conference on “Physics and Mechanics of New Materials and Their Applications”, PHENMA 2020 (26–29 March 2021, Kitakyushu, Japan), focusing on processing techniques, physics, mechanics, and applications of advanced materials. The book describes a broad spectrum of promising nanostructures, crystal structures, materials, and composites with unique properties. It presents nanotechnological design approaches, environmental-friendly processing techniques, and physicochemical as well as mechanical studies of advanced materials. The selected contributions describe recent progress in computational materials science methods and algorithms (in particular, finite-element and finite-difference modelling) applied to various technological, mechanical, and physical problems. The presented results are important for ongoing efforts concerning the theory, modelling, and testing of advanced materials. Other results are devoted to promising devices with higher accuracy, increased longevity, and greater potential to work effectively under critical temperatures, high pressure, and in aggressive environments.