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Author: J. H. D. Eland Publisher: Elsevier ISBN: 1483103218 Category : Science Languages : en Pages : 286
Book Description
Photoelectron Spectroscopy: An Introduction to Ultraviolet Photoelectronspectroscopy in the Gas Phase, Second Edition Photoelectron Spectroscopy: An Introduction to Ultraviolet PhotoelectronSpectroscopy in the Gas Phase, Second Edition aims to give practical approach on the subject of photoelectron spectroscopy, as well as provide knowledge on the interpretation of the photoelectron spectrum. The book covers topics such as the principles and literature of photoelectron microscopy; the main features and analysis of photoelectron spectra; ionization techniques; and energies from the photoelectron spectra. Also covered in the book are topics suc as photoelectron band structure and the applications of photoelectron spectroscopy in chemistry. The text is recommended for students and practitioners of chemistry who would like to be familiarized with the concepts of photoelectron spectroscopy and its importance in the field.
Author: J. H. D. Eland Publisher: Elsevier ISBN: 1483103218 Category : Science Languages : en Pages : 286
Book Description
Photoelectron Spectroscopy: An Introduction to Ultraviolet Photoelectronspectroscopy in the Gas Phase, Second Edition Photoelectron Spectroscopy: An Introduction to Ultraviolet PhotoelectronSpectroscopy in the Gas Phase, Second Edition aims to give practical approach on the subject of photoelectron spectroscopy, as well as provide knowledge on the interpretation of the photoelectron spectrum. The book covers topics such as the principles and literature of photoelectron microscopy; the main features and analysis of photoelectron spectra; ionization techniques; and energies from the photoelectron spectra. Also covered in the book are topics suc as photoelectron band structure and the applications of photoelectron spectroscopy in chemistry. The text is recommended for students and practitioners of chemistry who would like to be familiarized with the concepts of photoelectron spectroscopy and its importance in the field.
Author: Paul van der Heide Publisher: John Wiley & Sons ISBN: 1118162900 Category : Science Languages : en Pages : 275
Book Description
This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies. This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand-alone appendix sections.
Author: Stefan Hüfner Publisher: Springer Science & Business Media ISBN: 3662031507 Category : Science Languages : en Pages : 525
Book Description
An up-to-date introduction to the field, treating in depth the electronic structures of atoms, molecules, solids and surfaces, together with brief descriptions of inverse photoemission, spin-polarized photoemission and photoelectron diffraction. Experimental aspects are considered throughout and the results carefully interpreted by theory. A wealth of measured data is presented in tabullar for easy use by experimentalists.
Author: Stefan Hüfner Publisher: Springer ISBN: Category : Science Languages : en Pages : 538
Book Description
Photoelectron Spectroscopy presents an up-to-date introduction to the field by comprehensively treating the electronic structures of atoms, molecules, solids, and surfaces. Brief descriptions are given of inverse photoemission, spin-polarized photoemission and photoelectron diffraction. Experimental aspects are considered throughout the book and the results are carefully interpreted in terms of the theory. A wealth of measured data is presented in tabulator form for easy use by experimentalists.
Author: Stephan Hüfner Publisher: Springer Science & Business Media ISBN: 3540681302 Category : Science Languages : en Pages : 411
Book Description
Photoemission spectroscopy is one of the most extensively used methods to study the electronic structure of atoms, molecules, and solids and their surfaces. This volume introduces and surveys the field at highest energy and momentum resolutions allowing for a new range of applications, in particular for studies of high temperature superconductors.
Author: Joseph Berkowitz Publisher: Academic Press ISBN: 0128019581 Category : Science Languages : en Pages : 533
Book Description
Atomic and Molecular Photoabsorption: Partial Cross Sections is a companion work to Joseph Berkowitz's earlier work, Atomic and Molecular Photoabsorption: Absolute Total Cross Sections, published with Academic Press in 2002. In this work Joseph Berkowitz selected the "best" absolute partial cross sections for the same species as included in the companion work. A contrast, however, is that photoabsorption measurements, being of order I/Io, do not require the most intense light sources, whereas acquiring data on the products of light interactions with gaseous matter (ions, electrons, various coincidence measurements) has benefited significantly with the arrival of second- and third-generation synchrotrons. The newer devices have also extended the energy range of the light sources to include the K-shells of the species discussed here. The newer light sources encouraged experimentalists to develop improved instrumentation. Thus, the determination of partial cross sections continues to be an active field, with more recent results in some cases superseding earlier ones. Where the accuracy of the absolute partial cross sections is deemed sufficient (less than five percent), numerical tables are included in this new work. In other cases, the available data are presented graphically. Includes data on atoms, diatomic molecules, triatomic molecules, and polyatomic molecules Written by world-leading pioneer in the field of photoionization mass spectrometry Very clear presentation of the useful, quantitative information in both tables and graphs
Author: Siegfried Hofmann Publisher: Springer Science & Business Media ISBN: 3642273807 Category : Science Languages : en Pages : 544
Book Description
To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Author: Pradip K. Ghosh Publisher: ISBN: Category : Science Languages : en Pages : 408
Book Description
Good,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine.
Author: Andrew M. Ellis Publisher: Cambridge University Press ISBN: 113944185X Category : Science Languages : en Pages : 302
Book Description
Electronic and photoelectron spectroscopy can provide extraordinarily detailed information on the properties of molecules and are in widespread use in the physical and chemical sciences. Applications extend beyond spectroscopy into important areas such as chemical dynamics, kinetics and atmospheric chemistry. This book aims to provide the reader with a firm grounding of the basic principles and experimental techniques employed. The extensive use of case studies effectively illustrates how spectra are assigned and how information can be extracted, communicating the matter in a compelling and instructive manner. Topics covered include laser-induced fluorescence, resonance-enhanced multiphoton ionization, cavity ringdown and ZEKE spectroscopy. The volume is for advanced undergraduate and graduate students taking courses in spectroscopy and will also be useful to anyone encountering electronic and/or photoelectron spectroscopy during their research.
Author: J. H. D. Eland
Author: J. H. D. Eland
Author: Paul van der Heide
Author: Stefan Hüfner
Author: Stefan Hüfner
Author: Stephan Hüfner
Author: Joseph Berkowitz
Author: Siegfried Hofmann
Author: Pradip K. Ghosh
Author: David Briggs
Author: Andrew M. Ellis