Author: Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 306
Book Description
24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2017)
Author: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Author: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Author: IEEE StaffPublisher:
ISBN: 9781467382601
Category :
Languages : en
Pages :
Book Description
IPFA is devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability, yield and performance, especially those related to advanced process technologies
International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author: International Symposium on the Physical and Failure Analysis of Integrated Circuits ; 3
Author: Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Author: International Symposium on the Physical and Failure Analysis of Integrated Circuits ; 2
Author: 2nd International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author: Daniel Chan2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Author: IEEE StaffPublisher:
ISBN: 9781538649305
Category :
Languages : en
Pages :
Book Description
IPFA 2018 is devoted to the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device circuit module failure that serves as critical input for future design for reliability