Author: P. Hariharan
Publisher: Academic Press
ISBN: 0123116309
Category : Science
Languages : en
Pages : 369
Book Description
Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.
Optical Interferometry, 2e
Author: P. Hariharan
Publisher: Academic Press
ISBN: 0123116309
Category : Science
Languages : en
Pages : 369
Book Description
Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.
Publisher: Academic Press
ISBN: 0123116309
Category : Science
Languages : en
Pages : 369
Book Description
Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.
Interferometry for Precision Measurement
Author: Peter Langenbeck
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819491404
Category : Science
Languages : en
Pages : 243
Book Description
Interferometry can be seen as the stethoscope of the precision optical engineer. This book presents various interferometric developments used in physical, optical, and mechanical engineering during the past half century. It is an expanded translation of one chapter of the German Wirtschaftliche Mikrobearbeitung, also by Langenbeck, published by Carl Hanser Verlag, Munich-Vienna, in 2009. The book is illustrated with many practical examples and photographs that are a direct consequence of the author’s vast experience in the subject. The author provides some little-known testing techniques that could lead to future innovation in interferometric testing, along with occasional ""Notes for the practitioner,"" which give the reader tips for successful implementation of the author’s repertoire of techniques. The text will be of value to anyone interested in learning about interferometric evaluation of small mechanical and optical components.
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819491404
Category : Science
Languages : en
Pages : 243
Book Description
Interferometry can be seen as the stethoscope of the precision optical engineer. This book presents various interferometric developments used in physical, optical, and mechanical engineering during the past half century. It is an expanded translation of one chapter of the German Wirtschaftliche Mikrobearbeitung, also by Langenbeck, published by Carl Hanser Verlag, Munich-Vienna, in 2009. The book is illustrated with many practical examples and photographs that are a direct consequence of the author’s vast experience in the subject. The author provides some little-known testing techniques that could lead to future innovation in interferometric testing, along with occasional ""Notes for the practitioner,"" which give the reader tips for successful implementation of the author’s repertoire of techniques. The text will be of value to anyone interested in learning about interferometric evaluation of small mechanical and optical components.
Interferometry as a Measuring Tool
Optical Measurement of Surface Topography
Author: Richard Leach
Publisher: Springer Science & Business Media
ISBN: 3642120121
Category : Technology & Engineering
Languages : en
Pages : 333
Book Description
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Publisher: Springer Science & Business Media
ISBN: 3642120121
Category : Technology & Engineering
Languages : en
Pages : 333
Book Description
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Optical Interferometry
Author: Alexandr Banishev
Publisher: BoD – Books on Demand
ISBN: 9535129554
Category : Technology & Engineering
Languages : en
Pages : 262
Book Description
Optical methods of measurements are the most sensitive techniques of noncontact investigations, and at the same time, they are fast as well as accurate which increases reproducibility of observed results. In recent years, the importance of optical interferometry methods for research has dramatically increased, and applications range from precise surface testing to finding extrasolar planets. This book covers various aspects of optical interferometry including descriptions of novel apparatuses and methods, application interferometry for studying biological objects, surface qualities, materials characterization, and optical testing. The book includes a series of chapters in which experts share recent progress in interferometry through original research and literature reviews.
Publisher: BoD – Books on Demand
ISBN: 9535129554
Category : Technology & Engineering
Languages : en
Pages : 262
Book Description
Optical methods of measurements are the most sensitive techniques of noncontact investigations, and at the same time, they are fast as well as accurate which increases reproducibility of observed results. In recent years, the importance of optical interferometry methods for research has dramatically increased, and applications range from precise surface testing to finding extrasolar planets. This book covers various aspects of optical interferometry including descriptions of novel apparatuses and methods, application interferometry for studying biological objects, surface qualities, materials characterization, and optical testing. The book includes a series of chapters in which experts share recent progress in interferometry through original research and literature reviews.
Field Guide to Displacement Measuring Interferometry
Author: Jonathan D. Ellis
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819497994
Category : Science
Languages : en
Pages : 0
Book Description
Provides a practical treatment of the fundamental theory of displacement measuring interferometry, with examples of interferometry systems and uses. It outlines alignment techniques for optical components, signal processing systems for phase measurements, and laser stabilisation for homodyne and heterodyne sources.
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819497994
Category : Science
Languages : en
Pages : 0
Book Description
Provides a practical treatment of the fundamental theory of displacement measuring interferometry, with examples of interferometry systems and uses. It outlines alignment techniques for optical components, signal processing systems for phase measurements, and laser stabilisation for homodyne and heterodyne sources.
Basics of Interferometry
Author: P. Hariharan
Publisher: Academic Press
ISBN: 0080918611
Category : Technology & Engineering
Languages : en
Pages : 232
Book Description
This book is for those who have some knowledge of optics, but little or no previous experience in interferometry. Accordingly, the carefully designed presentation helps readers easily find and assimilate the interferometric techniques they need for precision measurements. Mathematics is held to a minimum, and the topics covered are also summarized in capsule overviews at the beginning and end of each chapter. Each chapter also contains a set of worked problems that give a feel for numbers.The first five chapters present a clear tutorial review of fundamentals. Chapters six and seven discuss the types of lasers and photodetectors used in interferometry. The next eight chapters describe key applications of interferometry: measurements of length, optical testing, studies of refractive index fields, interference microscopy, holographic and speckle interferometry, interferometric sensors, interference spectroscopy, and Fourier-transform spectroscopy. The final chapter offers suggestions on choosing and setting up an interferometer.
Publisher: Academic Press
ISBN: 0080918611
Category : Technology & Engineering
Languages : en
Pages : 232
Book Description
This book is for those who have some knowledge of optics, but little or no previous experience in interferometry. Accordingly, the carefully designed presentation helps readers easily find and assimilate the interferometric techniques they need for precision measurements. Mathematics is held to a minimum, and the topics covered are also summarized in capsule overviews at the beginning and end of each chapter. Each chapter also contains a set of worked problems that give a feel for numbers.The first five chapters present a clear tutorial review of fundamentals. Chapters six and seven discuss the types of lasers and photodetectors used in interferometry. The next eight chapters describe key applications of interferometry: measurements of length, optical testing, studies of refractive index fields, interference microscopy, holographic and speckle interferometry, interferometric sensors, interference spectroscopy, and Fourier-transform spectroscopy. The final chapter offers suggestions on choosing and setting up an interferometer.
Principles of Stellar Interferometry
Author: Andreas Glindemann
Publisher: Springer Science & Business Media
ISBN: 3642150284
Category : Science
Languages : en
Pages : 359
Book Description
The imaging process in stellar interferometers is explained starting from first principles on wave propagation and diffraction. Wave propagation through turbulence is described in detail using Kolmogorov statistics. The impact of turbulence on the imaging process is discussed both for single telescopes and for interferometers. Correction methods (adaptive optics and fringe tracking) are presented including wavefront sensing/fringe sensing methods and closed loop operation. Instrumental techniques like beam combination and visibility measurements (modulus and phase) as well as Nulling and heterodyne interferometry are described. The book closes with examples of observing programmes linking the theory with individual astrophysical programmes.
Publisher: Springer Science & Business Media
ISBN: 3642150284
Category : Science
Languages : en
Pages : 359
Book Description
The imaging process in stellar interferometers is explained starting from first principles on wave propagation and diffraction. Wave propagation through turbulence is described in detail using Kolmogorov statistics. The impact of turbulence on the imaging process is discussed both for single telescopes and for interferometers. Correction methods (adaptive optics and fringe tracking) are presented including wavefront sensing/fringe sensing methods and closed loop operation. Instrumental techniques like beam combination and visibility measurements (modulus and phase) as well as Nulling and heterodyne interferometry are described. The book closes with examples of observing programmes linking the theory with individual astrophysical programmes.
Interferometry and Synthesis in Radio Astronomy
Author: A. Richard Thompson
Publisher: Wiley-Interscience
ISBN:
Category : Nature
Languages : en
Pages : 568
Book Description
A unified description of the theory and practice of radio interferometry and synthesis mapping techniques as they apply to astronomy and geology. Beginning with an historical review, it goes on to provide a detailed description of all aspects of radio inferometry, from basic principles through instrumental design to data reduction. Over 450 original papers and monographs are cited.
Publisher: Wiley-Interscience
ISBN:
Category : Nature
Languages : en
Pages : 568
Book Description
A unified description of the theory and practice of radio interferometry and synthesis mapping techniques as they apply to astronomy and geology. Beginning with an historical review, it goes on to provide a detailed description of all aspects of radio inferometry, from basic principles through instrumental design to data reduction. Over 450 original papers and monographs are cited.
Atom Interferometry
Author: G.M. Tino
Publisher: IOS Press
ISBN: 161499448X
Category : Science
Languages : en
Pages : 807
Book Description
Since atom interferometers were first realized about 20 years ago, atom interferometry has had many applications in basic and applied science, and has been used to measure gravity acceleration, rotations and fundamental physical quantities with unprecedented precision. Future applications range from tests of general relativity to the development of next-generation inertial navigation systems. This book presents the lectures and notes from the Enrico Fermi school "Atom Interferometry", held in Varenna, Italy, in July 2013. The aim of the school was to cover basic experimental and theoretical aspects and to provide an updated review of current activities in the field as well as main achievements, open issues and future prospects. Topics covered include theoretical background and experimental schemes for atom interferometry; ultracold atoms and atom optics; comparison of atom, light, electron and neutron interferometers and their applications; high precision measurements with atom interferometry and their application to tests of fundamental physics, gravitation, inertial measurements and geophysics; measurement of fundamental constants; interferometry with quantum degenerate gases; matter wave interferometry beyond classical limits; large area interferometers; atom interferometry on chips; and interferometry with molecules. The book will be a valuable source of reference for students, newcomers and experts in the field of atom interferometry.
Publisher: IOS Press
ISBN: 161499448X
Category : Science
Languages : en
Pages : 807
Book Description
Since atom interferometers were first realized about 20 years ago, atom interferometry has had many applications in basic and applied science, and has been used to measure gravity acceleration, rotations and fundamental physical quantities with unprecedented precision. Future applications range from tests of general relativity to the development of next-generation inertial navigation systems. This book presents the lectures and notes from the Enrico Fermi school "Atom Interferometry", held in Varenna, Italy, in July 2013. The aim of the school was to cover basic experimental and theoretical aspects and to provide an updated review of current activities in the field as well as main achievements, open issues and future prospects. Topics covered include theoretical background and experimental schemes for atom interferometry; ultracold atoms and atom optics; comparison of atom, light, electron and neutron interferometers and their applications; high precision measurements with atom interferometry and their application to tests of fundamental physics, gravitation, inertial measurements and geophysics; measurement of fundamental constants; interferometry with quantum degenerate gases; matter wave interferometry beyond classical limits; large area interferometers; atom interferometry on chips; and interferometry with molecules. The book will be a valuable source of reference for students, newcomers and experts in the field of atom interferometry.