Author: William B. Jollie (LT, USAF.)
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Interferometric Measurement of the Index of Refraction of Glass
Author: William B. Jollie (LT, USAF.)
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Measurements of the Index of Refraction of Glass at High Temperatures
Author: Chauncey George Peters
Publisher:
ISBN:
Category : Glass
Languages : en
Pages : 28
Book Description
Publisher:
ISBN:
Category : Glass
Languages : en
Pages : 28
Book Description
An Interferometric Measurement of Index of Refraction
Author: Michael S. Shumate
Publisher:
ISBN:
Category : Electronic dissertations
Languages : en
Pages : 77
Book Description
Of the several common methods for measurement of the index of refraction of solid optical materials, only one, the minimum deviation method, can conveniently be used for materials whose refractive index exceeds 1.8. The minimum deviation method requires that a large prism of the optical material be constructed; this is not always possible or feasible for some crystalline optical materials that are of current interest. A method for measurement of index of refraction is presented which requires a thin flat plate of the optical material and is unlimited in the range of refractive index it can cover. The method uses a two-beam interferometer to determine the optical path length through the flat plate by tipping away from normal incidence through a measured angle. It may be used in the visible portion of the spectrum directly, or extended to other spectral regions with the use of a suitable detector. (Author).
Publisher:
ISBN:
Category : Electronic dissertations
Languages : en
Pages : 77
Book Description
Of the several common methods for measurement of the index of refraction of solid optical materials, only one, the minimum deviation method, can conveniently be used for materials whose refractive index exceeds 1.8. The minimum deviation method requires that a large prism of the optical material be constructed; this is not always possible or feasible for some crystalline optical materials that are of current interest. A method for measurement of index of refraction is presented which requires a thin flat plate of the optical material and is unlimited in the range of refractive index it can cover. The method uses a two-beam interferometer to determine the optical path length through the flat plate by tipping away from normal incidence through a measured angle. It may be used in the visible portion of the spectrum directly, or extended to other spectral regions with the use of a suitable detector. (Author).
Dual Interferometer System for Measuring Index of Refraction
Author: Eric Peter Goodwin
Publisher:
ISBN:
Category :
Languages : en
Pages : 357
Book Description
The second interferometer is a Mach-Zehnder interferometer with a tunable HeNe laser light source. This interferometer measures the optical path length (OPL) of the test sample in the cuvette in transmission as a function of five wavelengths in the visible spectrum. This is done using phase-shifting interferometry. Multiple thickness regions are used to solve 2pi phase ambiguities in the OPL.
Publisher:
ISBN:
Category :
Languages : en
Pages : 357
Book Description
The second interferometer is a Mach-Zehnder interferometer with a tunable HeNe laser light source. This interferometer measures the optical path length (OPL) of the test sample in the cuvette in transmission as a function of five wavelengths in the visible spectrum. This is done using phase-shifting interferometry. Multiple thickness regions are used to solve 2pi phase ambiguities in the OPL.
Design of a Michelson Interferometer for Quantitative Refraction Index Profile Measurements
Author: J. L. M. Nijholt
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 62
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 62
Book Description
The Interferometry of Reversed and Non-reversed Spectra
Author: Carl Barus
Publisher:
ISBN:
Category : Interference (Light)
Languages : en
Pages : 576
Book Description
Publisher:
ISBN:
Category : Interference (Light)
Languages : en
Pages : 576
Book Description
The Production of Elliptic Interferences in Relation to Interferometry
Interferometric Measurement of Refractive Index
Interferometric Measurement of Large Indices of Refraction
Author: Michael S. Shumate
Publisher:
ISBN:
Category : Interferometers
Languages : en
Pages : 5
Book Description
Publisher:
ISBN:
Category : Interferometers
Languages : en
Pages : 5
Book Description
Optical Interferometry, 2e
Author: P. Hariharan
Publisher: Academic Press
ISBN: 0123116309
Category : Science
Languages : en
Pages : 369
Book Description
Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.
Publisher: Academic Press
ISBN: 0123116309
Category : Science
Languages : en
Pages : 369
Book Description
Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.