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Author: Raminderpal Singh Publisher: John Wiley & Sons ISBN: 0471150428 Category : Technology & Engineering Languages : en Pages : 484
Book Description
"...offers a tutorial guide to IC designers who want to move to the next level of chip design by unlocking the secrets of signal integrity." —Jake Buurma, Senior Vice President, Worldwide Research & Development, Cadence Design Systems, Inc. Covers signal integrity effects in high performance Radio Frequency (RF) IC Brings together research papers from the past few years that address the broad range of issues faced by IC designers and CAD managers now and in the future A Wiley-IEEE Press publication
Author: Raminderpal Singh Publisher: John Wiley & Sons ISBN: 0471150428 Category : Technology & Engineering Languages : en Pages : 484
Book Description
"...offers a tutorial guide to IC designers who want to move to the next level of chip design by unlocking the secrets of signal integrity." —Jake Buurma, Senior Vice President, Worldwide Research & Development, Cadence Design Systems, Inc. Covers signal integrity effects in high performance Radio Frequency (RF) IC Brings together research papers from the past few years that address the broad range of issues faced by IC designers and CAD managers now and in the future A Wiley-IEEE Press publication
Author: VLSI Society of India Publisher: Institute of Electrical & Electronics Engineers(IEEE) ISBN: 9780769500133 Category : Computers Languages : en Pages : 682
Book Description
The proceedings of the January 1999 conference consist of 103 papers, 11 talks, and six tutorials. The papers are grouped under the headings of TCAD to ECAD, low power, testing, co-design and synthesis, analog design, multi-valued logic, verification, digital signal processor (DSP), logic synthesis,
Author: Krishnendu Chakrabarty Publisher: Springer Science & Business Media ISBN: 1475765274 Category : Technology & Engineering Languages : en Pages : 202
Book Description
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Author: Johan Vounckx Publisher: Springer Science & Business Media ISBN: 3540390944 Category : Computers Languages : en Pages : 691
Book Description
This book constitutes the refereed proceedings of the 16th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2006. The book presents 41 revised full papers and 23 revised poster papers together with 4 key notes and 3 industrial abstracts. Topical sections include high-level design, power estimation and modeling memory and register files, low-power digital circuits, busses and interconnects, low-power techniques, applications and SoC design, modeling, and more.
Author: Salvador Bracho del Pino Publisher: Ed. Universidad de Cantabria ISBN: 9788481023114 Category : Technology & Engineering Languages : en Pages : 756
Book Description
Este libro contiene las presentaciones de la XVII Conferencia de Diseño de Circuitos y Sistemas Integrados celebrado en el Palacio de la Magdalena, Santander, en noviembre de 2002. Esta Conferencia ha alcanzado un alto nivel de calidad, como consecuencia de su tradición y madurez, que lo convierte en uno de los acontecimientos más importantes para los circuitos de microelectrónica y la comunidad de diseño de sistemas en el sur de Europa. Desde su origen tiene una gran contribución de Universidades españolas, aunque hoy los autores participan desde catorce países
Author: Hongjiang Song Publisher: Lulu.com ISBN: 1329199812 Category : Technology & Engineering Languages : en Pages : 390
Book Description
This book covers various VLSI circuit noise effects and VLSI noise processing circuit implementations. All materials are organized in am unified framework with VLSI noise modeling and noise processing circuits across various VLSI signal domains.
Author: Enrico Macii Publisher: Springer Science & Business Media ISBN: 3540230955 Category : Computers Languages : en Pages : 926
Book Description
This book constitutes the refereed proceedings of the 14th International Workshop on Power and Timing Optimization and Simulation, PATMOS 2004, held in Santorini, Greece in September 2004. The 85 revised papers presented together with abstracts of 6 invited presentations were carefully reviewed and selected from 152 papers submitted. The papers are organized in topical sections on buses and communication, circuits and devices, low power issues, architectures, asynchronous circuits, systems design, interconnect and physical design, security and safety, low-power processing, digital design, and modeling and simulation.
Author: Publisher: Institute of Electrical & Electronics Engineers(IEEE) ISBN: 9780769511221 Category : Computers Languages : en Pages : 458
Book Description
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Author: Luciano Lavagno Publisher: CRC Press ISBN: 1482254638 Category : Technology & Engineering Languages : en Pages : 644
Book Description
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Author: Raminderpal Singh
Author: Raminderpal Singh
Author: VLSI Society of India
Author: Krishnendu Chakrabarty
Author: Johan Vounckx
Author: Salvador Bracho del Pino
Author: Hongjiang Song
Author: Enrico Macii
Author: 
Author: 
Author: Luciano Lavagno