Inheritance of Resistance to Septoria Tritici Blotch in the Winter Wheat Doubled Haploid Population Solitär X Mazurka PDF Download
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Author: Publisher: ISBN: Category : Languages : en Pages : 122
Book Description
In a doubled haploid population of the two winter wheat cultivars Solitär (resistant) and Mazurka (susceptible) inheritance of Septoria tritici blotch (STB) resistance was analyzed. In the seedling stage isolate-specific quantitative trait loci (QTL) were mapped on chromosomes 3A, 1B, 4A, 3B, 3D und 6B. QTL specific for necrotization of leaf area and pycnidia production were localized on chromosomes 1A, 4B and 3B, 6B, respectively. Under natural infection in the field plant height correlated negative with disease severity. With plant height as co-variable five QTL specific for resistance were identified on chromosomes 5A, 6D and 7D. Although, the contributions of QTL x QTL interactions to the total variance were generally low a complex inheritance of STB resistance can be assumed. None of the isolate-specific QTL detected in the seedling stage were verified in the field trials under natural infection.
Author: Publisher: ISBN: Category : Languages : en Pages : 122
Book Description
In a doubled haploid population of the two winter wheat cultivars Solitär (resistant) and Mazurka (susceptible) inheritance of Septoria tritici blotch (STB) resistance was analyzed. In the seedling stage isolate-specific quantitative trait loci (QTL) were mapped on chromosomes 3A, 1B, 4A, 3B, 3D und 6B. QTL specific for necrotization of leaf area and pycnidia production were localized on chromosomes 1A, 4B and 3B, 6B, respectively. Under natural infection in the field plant height correlated negative with disease severity. With plant height as co-variable five QTL specific for resistance were identified on chromosomes 5A, 6D and 7D. Although, the contributions of QTL x QTL interactions to the total variance were generally low a complex inheritance of STB resistance can be assumed. None of the isolate-specific QTL detected in the seedling stage were verified in the field trials under natural infection.
Author: Guillermo Ariel Briceno Felix Publisher: ISBN: Category : Wheat speckled leaf blotch Languages : en Pages : 172
Book Description
Septoria leaf blotch of wheat is a major biotic factor limiting the grain yield. To determine the nature of inheritance involving selected genotypes, three resistant semidwarf spring wheat lines exhibiting durable global resistance and one susceptible cultivar were crossed in all possible combinations, excluding reciprocals. Parents, Fl, F2, and F3 generations were inoculated with one pathogenic strain of Septoria tritici and evaluated under field conditions. Data were collected on an individual plant basis. F2 and F3 frequency distributions were computed to determine the nature of inheritance. Combining ability analysis of the 4x4 diallel cross and narrow-sense heritability were employed to estimate the nature of gene action. Phenotypic correlations were obtained to examined the possible association between disease severity traits and their relationship with heading date and plant height. The continuous distribution of the F2 and F3 populations among crosses made it impossible to classify plants into discrete classes in crosses between resistant x susceptible genotypes. Mean values of the disease traits Septoria progress coefficient, Relative coefficient of infection, and Septoria severity of flag leaf among the segregating populations were similar to the midparent values. Transgressive segregation was also observed in the F2 and F3 suggesting that parents had different resistance genes. Additive gene effects were found to be the major component of variation although nonadditive gene action played an important role in the expression of all three disease traits. The resistant parents Bobwhite"S" and Kavkaz /K4500 L.A.4 were found to have the largest negative general combining ability effects for the disease traits suggesting that these parents would be the best source for resistance to Septoria leaf blotch. High general combining ability and high narrow sense heritability estimates in the F3 population, indicated that substantial progress for resistance to Septoria tritici would be effective selecting in this generation. Of the three disease measures it would appear that selection for the lowest percentage of Septoria infection on the flag leaf would provide the most progress in developing resistant cultivars. Moderate and low negative phenotypic correlations were found among generations for the disease traits with heading date and plant height. From the results of this study the selection of early maturing short stature progeny would be possible within the genetic materials employed in this study.
Author: Miguel Alfonso Camacho Casas Publisher: ISBN: Category : Septoria tritici Languages : en Pages : 186
Book Description
Parental lines, Fi's and segregating populations (F2, F3 and BC's) including reciprocals were evaluated under field conditions to determine if genetic resistance per se exists for Septoria Leaf Blotch in a selected winter wheat cross. The experiment was conducted over a three year period with both natural infection and artificial inoculations being employed. Data were collected on an individual plant basis. The mode of inheritance was determined using the generation mean analysis. Phenotypic correlations and path coefficient analyses were employed to determine if possible associations of plant height and heading date were influencing disease severity. Differences for all variables were observed for the parents and all generations each year. Based on the frequency distribution of the F2 population, all variables measured appeared to be quantitatively inherited. Information from the generation mean analyses showed that both additive and nonadditive genetic effects were involved in the expression of disease resistance. Dominance and epistasis effects were more important in influencing disease resistance. That genetic resistance per se was involved was evidenced by the consistent difference observed within and between generations. As observed from the phenotypic correlations and path coefficient analysis, a significant amount of variation in disease expression could not be accounted for by variation in plant height and heading date. In addition, F3 lines with similar maturity and plant height differed in their level of disease resistance. It does appear however, that a compromise will be necessary in both plant height and heading date if acceptable levels of resistance are to be achieved, as no progeny was found to be as early and short as the susceptible parent with acceptable levels of disease resistance.
Author: Baltazar Baltazar Publisher: ISBN: Category : Dwarfism in plants Languages : en Pages : 170
Book Description
Four isogenic lines possessing different combinations of height reducing genes Rht1 and Rht2 from 'Norin 10' were crossed to a short stature, early maturing, septoria susceptible cultivar identified as the 'Tibet Dwarf'. The isogenic lines originated from the backcross population of 'Itana'/3/'Norin 10'/'Brevor 14'//6*'Itana'. Parents, F1 and F2 generations provided the experimental materials upon which observations were made. Differences in reaction to septoria tritici blotch were observed with a specific height reducing gene. When the gene Rht2 was present either as a isoline or in the progeny a higher degree of resistance was found. The most susceptible disease reaction was measured in the presence of Rht1 gene. Associations, as determined by phenotypic and genetic correlations were detected between septoria tritici blotch resistance and tall stature, late heading and maturity dates. Short stature, early heading and maturing plants with acceptable levels of resistance were identified in the F2 population when Rht2 was present. Either due to some biological limitation or perhaps genetic linkages it will be necessary for wheat breeders to select the appropriate dwarfing source and to grow large F2 populations to insure obtaining the desired genotypes.
Author: Yeshwant Ramchandra Mehta Publisher: Springer ISBN: 3319064657 Category : Science Languages : en Pages : 265
Book Description
Wheat Diseases and Their Management addresses biotic and abiotic constrains to wheat production. Besides detailed illustrations and descriptions of the most important diseases of wheat in the world, it offers an updated view on the reemergence of some old diseases and the occurrence of new races of the pathogen. It deals with the sustainability of wheat production through precision agriculture and focuses on the importance of conservation tillage. The book also deals with pillars of integrated disease management which would be eco-friendly and reduce severity of diseases and yield losses, with acquired Latin-American experiences of more than 40 years.
Author: Muhammad Asif Publisher: Springer Science & Business Media ISBN: 3319007327 Category : Science Languages : en Pages : 84
Book Description
Deals with the historical perspectives and the current status of doubled haploid production along with its practical implications in basic and applied research. It highlights various haploid production methods with a comprehensive discussion on their pros and cons, bottlenecks, and embryogenic pathways. The review also describes in detail the results of molecular and genomic studies conducted to investigate the underlying principles of this spectacular technique that has changed the status of many species from recalcitrant to responsive over the last ninety years.
Author: Alain P. Bonjean Publisher: Intercept Limited ISBN: 9781898298724 Category : Nature Languages : en Pages : 1131
Book Description
This work is a comprehensive history of wheat across all its main areas of production. New techniques such as in vitro culture now enable the development of a greater level of understanding of the genetics of wheat.
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Author: Oscar Arturo Somasco
Author: Maarten Van Ginkel
Author: Guillermo Ariel Briceno Felix
Author: Miguel Alfonso Camacho Casas
Author: Lia Susana Arraiano
Author: Baltazar Baltazar
Author: Yeshwant Ramchandra Mehta
Author: Muhammad Asif
Author: Alain P. Bonjean