In Situ Studies of Defect Nucleation During the PVT and CVD Growth of Silicon Carbide Single Crystals PDF Download

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In Situ Studies of Defect Nucleation During the PVT and CVD Growth of Silicon Carbide Single Crystals

In Situ Studies of Defect Nucleation During the PVT and CVD Growth of Silicon Carbide Single Crystals PDF Author:
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Languages : en
Pages : 4

Book Description
A complete chemical vapor deposition (CVD) system for growing SiC epitaxial films and bulk crystals was set up using commercially procured gas flow controls and scrubber units, and integrating them with a modified in-house designed growth chamber that has options for in situ X-ray topographic study. This CVD system uses silicon tetrachloride (SiCl4), silane (SiH4), propane (C3H8), hydrogen (H2) and argon (Ar) gases. The aggressive SiCl4 corrosion in the chamber and the gas lines has been investigated and found to be predominantly related to moisture, and this severe problem has been solved by keeping the gas lines and the growth reactor in vacuum or in inert atmosphere when the CVD system is not running.
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