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Author: Gerhard Dehm Publisher: John Wiley & Sons ISBN: 3527652183 Category : Technology & Engineering Languages : en Pages : 403
Book Description
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.
Author: Gerhard Dehm Publisher: John Wiley & Sons ISBN: 3527652183 Category : Technology & Engineering Languages : en Pages : 403
Book Description
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.
Author: Florian Banhart Publisher: World Scientific ISBN: 9812797335 Category : Science Languages : en Pages : 318
Book Description
In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
Author: Pratibha L. Gai Publisher: Springer Science & Business Media ISBN: 1461562155 Category : Technology & Engineering Languages : en Pages : 345
Book Description
2. High Temperature UHV-STM System 264 3. Hydrogen Desorption Process on Si (111) Surface 264 4. (7x7) - (1 xl) Phase Transition on Si (111) Surface 271 Step Shifting under dc Electric Fields 275 5. 6. Conclusions 280 Acknowledgements and References 281 12. DYNAMIC OBSERVATION OF VORTICES IN SUPERCONDUCTORS USING ELECTRON WAVES 283 by Akira Tonomura 1. Introduction 283 2. Experimental Method 284 2. 1 Interference Microscopy 284 2. 2 Lorentz Microscopy 287 Observation of Superconducting Vortices 288 3. 3. 1 Superconducting Vortices Observed by Interference Microscopy 288 3. 1. 1 Profile Mode 288 3. 1. 2 Transmission Mode 291 3. 2 Superconducting Vortices Observed by Lorentz Microscopy 293 3. 3 Observation of Vortex Interaction with Pinning Centers 294 3. 3. 1 Surface Steps 295 3. 3. 2 Irradiated Point Defects 296 4. Conclusion 298 References 299 13. TEM STUDIES OF SOME STRUCTURALLY FLEXIBLE SOLIDS AND THEIR ASSOCIATED PHASE TRANSFORMATIONS 301 by Ray L. Withers and John G. Thompson 1. Introduction 301 2. Tetrahedrally Comer-Connected Framework Structures 302 3. Tetragonal a-PbO 311 4. Compositionally Flexible Anion-Deficient Fluorites and the "Defect Fluorite" to C-type Sesquioxide Transition 320 5. Summary and Conclusions 327 Acknowledgements and References 327 Author Index 331 Subject Index 333 List of Contributors A. ASEEV Institute of Semiconductor Physics, Russian Academy of Sciences Novosibirsk, 630090, pr. ac. , Lavrentjeva 13, RUSSIA E. BAUER Department of Physics and Astronomy, Arizona State University Tempe, AZ 85287-1504, U. S. A. G. H.
Author: Alexander Ziegler Publisher: Springer Science & Business Media ISBN: 3642451527 Category : Science Languages : en Pages : 265
Book Description
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.
Author: Klaus Wetzig Publisher: Wiley-VCH ISBN: Category : Science Languages : en Pages : 252
Book Description
The authors of this book give an instructive survey of the latest advancements in Scanning Electron Microscopy (SEM). During the last two decades there has been a new stage in the development of scanning electron microscopes as they are equipped with special devices for in situ investigations. Thus a "microlab" now exists inside the electron microscope. Different in situ sample treatments, based on mechanical, thermal and electrical effects, as well as on surface modification by radiation and environmental interaction processes, can be used to quantitatively study reactions at solid surfaces under well-defined external conditions. The objects under investigation can be of many kinds: engineering materials, electrical and magnetic materials (as used in microelectronics), products of technical and chemical industries, minerals, forensic objects, textiles, pharmaceutical, biological and archaeological specimens.
Author: Klaus Wetzig Publisher: Wiley-VCH ISBN: 9783527400096 Category : Science Languages : en Pages : 244
Book Description
The authors of this book give an instructive survey of the latest advancements in Scanning Electron Microscopy (SEM). During the last two decades there has been a new stage in the development of scanning electron microscopes as they are equipped with special devices for in situ investigations. Thus a "microlab" now exists inside the electron microscope. Different in situ sample treatments, based on mechanical, thermal and electrical effects, as well as on surface modification by radiation and environmental interaction processes, can be used to quantitatively study reactions at solid surfaces under well-defined external conditions. The objects under investigation can be of many kinds: engineering materials, electrical and magnetic materials (as used in microelectronics), products of technical and chemical industries, minerals, forensic objects, textiles, pharmaceutical, biological and archaeological specimens.
Author: Joseph Goldstein Publisher: Springer Science & Business Media ISBN: 1461332737 Category : Science Languages : en Pages : 679
Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author: Goerg H. Michler Publisher: Springer Science & Business Media ISBN: 3540363521 Category : Technology & Engineering Languages : en Pages : 472
Book Description
The study of polymers by electron microscopy (EM) needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy, are given in this hands-on book. The application of these techniques to the study of morphology and properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Author: Weilie Zhou Publisher: Springer Science & Business Media ISBN: 0387396209 Category : Technology & Engineering Languages : en Pages : 533
Book Description
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Author: Gerhard Dehm
Author: Gerhard Dehm
Author: Florian Banhart
Author: Pratibha L. Gai
Author: Alexander Ziegler
Author: Klaus Wetzig
Author: Klaus Wetzig
Author: Joseph Goldstein
Author: Goerg H. Michler
Author: Frances M. Ross
Author: Weilie Zhou