Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
IEEE Std 181-2011 (Revision of IEEE Std 181-2003) - Redline
IEEE Standard for Transitions, Pulses, and Related Waveforms
Author:
Publisher:
ISBN: 9780738167060
Category : Electronic measurements
Languages : en
Pages : 59
Book Description
Abstract: Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms. Keywords: aberration, algorithms, compound waveform, histogram, IEEE 181, levels, pulse, pulse amplitude, pulse definitions, pulse measurement, states, state boundaries, state levels, transients, transitions, transition duration, waveforms, waveform analysis, waveform definitions, waveform parameters, waveform terms.
Publisher:
ISBN: 9780738167060
Category : Electronic measurements
Languages : en
Pages : 59
Book Description
Abstract: Approximately 100 terms and their definitions, for accurately and precisely describing the waveforms of pulse signals and the process of measuring pulse signals, are presented in this standard. Algorithms are provided for computing the values of defined terms that describe measurable parameters of the waveform, such as transition duration, state level, pulse amplitude, and waveform aberrations. These analysis algorithms are applicable to two-state waveforms having one or two transitions connecting these states. Compound waveform analysis is accomplished by decomposing the compound waveform into its constituent two-state single-transition waveforms. Keywords: aberration, algorithms, compound waveform, histogram, IEEE 181, levels, pulse, pulse amplitude, pulse definitions, pulse measurement, states, state boundaries, state levels, transients, transitions, transition duration, waveforms, waveform analysis, waveform definitions, waveform parameters, waveform terms.
IEEE Std 181-2011 (Revision of IEEE Std 181-2003)
IEEE Standard on Transitions, Pulses, and Related Waveforms
Author:
Publisher:
ISBN: 9780738135700
Category : Electronic measurements
Languages : en
Pages : 54
Book Description
Publisher:
ISBN: 9780738135700
Category : Electronic measurements
Languages : en
Pages : 54
Book Description
IEEE Std 181-2003
Proceedings of the ... IEEE Instrumentation and Measurement Technology Conference
Author:
Publisher:
ISBN:
Category : Electronic instruments
Languages : en
Pages : 956
Book Description
Publisher:
ISBN:
Category : Electronic instruments
Languages : en
Pages : 956
Book Description
Fungal Machines
Author: Andrew Adamatzky
Publisher: Springer Nature
ISBN: 3031383362
Category : Technology & Engineering
Languages : en
Pages : 418
Book Description
This unique book explores fungi as sensors, electronic devices, and potential future computers, offering eco-friendly alternatives to traditional electronics. Fungi are ancient, widely distributed organisms ranging from microscopic single cells to massive mycelium spanning hectares. They possess senses similar to humans, detecting light, chemicals, gases, gravity, and electric fields. It covers fungal electrical activity, sensors, electronics, computing prototypes, and fungal language. Authored by leading experts from diverse fields, the book is accessible to readers of all backgrounds, from high-schoolers to professors. It reveals the remarkable potential of fungal machines while minimizing environmental impact.
Publisher: Springer Nature
ISBN: 3031383362
Category : Technology & Engineering
Languages : en
Pages : 418
Book Description
This unique book explores fungi as sensors, electronic devices, and potential future computers, offering eco-friendly alternatives to traditional electronics. Fungi are ancient, widely distributed organisms ranging from microscopic single cells to massive mycelium spanning hectares. They possess senses similar to humans, detecting light, chemicals, gases, gravity, and electric fields. It covers fungal electrical activity, sensors, electronics, computing prototypes, and fungal language. Authored by leading experts from diverse fields, the book is accessible to readers of all backgrounds, from high-schoolers to professors. It reveals the remarkable potential of fungal machines while minimizing environmental impact.
Ultra-Thin Sensors and Data Conversion Techniques for Hybrid System-in-Foil
Author: Mourad Elsobky
Publisher: Springer Nature
ISBN: 3030977269
Category : Technology & Engineering
Languages : en
Pages : 153
Book Description
This book reports on the design, fabrication and characterization of a set of flexible electronic components, including on-foil sensors, organic thin-film transistors and ultra-thin chips. The core of the work is on showing how to combine high-performance integrated circuits with large-area electronic components on a single polymeric foil, to realize smart electronic systems for different applications, such as temperature, humidity and mechanical stress sensors. The book offers an extensive introduction to Hybrid System-in-Foil technology (HySiF), and related on-chip/on-foil passive and active components. It presents six case studies designed to highlight key HySiF challenges, together with the methodology to address those challenges. Last but not least, it describes the development of a reconfigurable, energy-efficient Analog-to-Digital Converter for HySiF. All in all, this book provides readers with extensive information on the state of the art in the design and characterization of integrated circuits and hybrid electronic systems on flexible polymeric substrates. By describing significant advances in organic thin-film transistor technology, this work is expected to pave the way to future developments in the area of energy-efficient smart sensors and integrated circuits.
Publisher: Springer Nature
ISBN: 3030977269
Category : Technology & Engineering
Languages : en
Pages : 153
Book Description
This book reports on the design, fabrication and characterization of a set of flexible electronic components, including on-foil sensors, organic thin-film transistors and ultra-thin chips. The core of the work is on showing how to combine high-performance integrated circuits with large-area electronic components on a single polymeric foil, to realize smart electronic systems for different applications, such as temperature, humidity and mechanical stress sensors. The book offers an extensive introduction to Hybrid System-in-Foil technology (HySiF), and related on-chip/on-foil passive and active components. It presents six case studies designed to highlight key HySiF challenges, together with the methodology to address those challenges. Last but not least, it describes the development of a reconfigurable, energy-efficient Analog-to-Digital Converter for HySiF. All in all, this book provides readers with extensive information on the state of the art in the design and characterization of integrated circuits and hybrid electronic systems on flexible polymeric substrates. By describing significant advances in organic thin-film transistor technology, this work is expected to pave the way to future developments in the area of energy-efficient smart sensors and integrated circuits.
Formal Techniques for Safety-Critical Systems
Author: Cyrille Artho
Publisher: Springer
ISBN: 3319054163
Category : Computers
Languages : en
Pages : 307
Book Description
This book constitutes the refereed proceedings of the Second International Workshop, FTSCS 2013, held in Queenstown, New Zealand, in October 2013. The 17 revised full papers presented together with an invited talk were carefully reviewed and selected from 32 submissions. The papers address various topics related to the application of formal and semi-formal methods to improve the quality of safety-critical computer systems.
Publisher: Springer
ISBN: 3319054163
Category : Computers
Languages : en
Pages : 307
Book Description
This book constitutes the refereed proceedings of the Second International Workshop, FTSCS 2013, held in Queenstown, New Zealand, in October 2013. The 17 revised full papers presented together with an invited talk were carefully reviewed and selected from 32 submissions. The papers address various topics related to the application of formal and semi-formal methods to improve the quality of safety-critical computer systems.
Digital Communications Test and Measurement
Author: Dennis Derickson
Publisher: Pearson Education
ISBN: 0132797216
Category : Technology & Engineering
Languages : en
Pages : 1242
Book Description
A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works. Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout. Coverage includes Signal integrity from a measurement point of view Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes Bit error ratio measurements for both electrical and optical links Extensive coverage on the topic of jitter in high-speed networks State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing Channel and system characterization: TDR/T and frequency domain-based alternatives Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM
Publisher: Pearson Education
ISBN: 0132797216
Category : Technology & Engineering
Languages : en
Pages : 1242
Book Description
A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works. Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout. Coverage includes Signal integrity from a measurement point of view Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes Bit error ratio measurements for both electrical and optical links Extensive coverage on the topic of jitter in high-speed networks State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing Channel and system characterization: TDR/T and frequency domain-based alternatives Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM