Author: Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL).
Author: Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL)
Author: Publisher:
ISBN:
Category : Computer hardware description languages
Languages : en
Pages :
Book Description
Unapproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) Replaced by Approved Draft
Author: IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
Author: Publisher:
ISBN: 9780738116464
Category : Integrated circuits
Languages : en
Pages : 132
Book Description
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
P1450.6/D1.6, Jun 2005 - IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL)
Author: IEEE Standard Interface Test Language (STIL) for digital test vectors : approved 18 March 1999 ; IEEE-SA standard boards
Author: [Anonymus AC02915398]Publisher:
ISBN: 9780738116471
Category : Integrated circuits
Languages : en
Pages : 132
Book Description
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
P1450.6/D1.6, Jun 2005 - Unapproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) (Replaced by Approved IEEE Draft)
Author: IEEE Std 1450-1999
Author: Standard Test Interface Language (STIL) for Digital Test Vector Data
Author: Publisher:
ISBN: 9782831893372
Category : Computer hardware description languages
Languages : en
Pages : 143
Book Description
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
Author: Krishnendu ChakrabartyPublisher: Springer Science & Business Media
ISBN: 1475765274
Category : Technology & Engineering
Languages : en
Pages : 202
Book Description
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.