Author: [Anonymus AC02915398]
Publisher:
ISBN: 9780738116471
Category : Integrated circuits
Languages : en
Pages : 132
Book Description
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
IEEE Standard Interface Test Language (STIL) for digital test vectors : approved 18 March 1999 ; IEEE-SA standard boards
Author: [Anonymus AC02915398]
Publisher:
ISBN: 9780738116471
Category : Integrated circuits
Languages : en
Pages : 132
Book Description
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
Publisher:
ISBN: 9780738116471
Category : Integrated circuits
Languages : en
Pages : 132
Book Description
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
IEEE Std 1450-1999
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
Author:
Publisher:
ISBN: 9780738116464
Category : Integrated circuits
Languages : en
Pages : 132
Book Description
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
Publisher:
ISBN: 9780738116464
Category : Integrated circuits
Languages : en
Pages : 132
Book Description
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL).
Standard Test Interface Language (STIL) for Digital Test Vector Data
Author:
Publisher:
ISBN: 9782831893372
Category : Computer hardware description languages
Languages : en
Pages : 143
Book Description
Publisher:
ISBN: 9782831893372
Category : Computer hardware description languages
Languages : en
Pages : 143
Book Description
IEEE Std 1450.2-2002
Author:
Publisher:
ISBN: 9780738135038
Category : Electronic books
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9780738135038
Category : Electronic books
Languages : en
Pages :
Book Description
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments
Author:
Publisher:
ISBN: 9780738147338
Category : Integrated circuits
Languages : en
Pages : 114
Book Description
Publisher:
ISBN: 9780738147338
Category : Integrated circuits
Languages : en
Pages : 114
Book Description
IEC 62525:2007 (E): (IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
Author:
Publisher:
ISBN: 9780738135045
Category : Integrated circuits
Languages : en
Pages : 31
Book Description
Publisher:
ISBN: 9780738135045
Category : Integrated circuits
Languages : en
Pages : 31
Book Description