Author: Jessica Meyer
Publisher: Forschungszentrum Jülich
ISBN: 389336840X
Category :
Languages : en
Pages : 147
Book Description
Ice Crystal Measurements with the New Particle Spectrometer NIXE-CAPS
Investigations of Angular Light Scattering by Complex Atmospheric Particles
Author: Jaervinen, Emma
Publisher: KIT Scientific Publishing
ISBN: 3731505541
Category : Physics
Languages : en
Pages : 258
Book Description
This book experimentally investigates the angular light scattering properties of three atmospherically relevant particles: ice crystals, dust particles and secondary organic aerosol particles. Key optical quantities under examination are the near-backscattering depolarisation properties and the angular light scattering function. The main question is how these parameters are related to the particle microphysical properties, such as particle size and complexity.
Publisher: KIT Scientific Publishing
ISBN: 3731505541
Category : Physics
Languages : en
Pages : 258
Book Description
This book experimentally investigates the angular light scattering properties of three atmospherically relevant particles: ice crystals, dust particles and secondary organic aerosol particles. Key optical quantities under examination are the near-backscattering depolarisation properties and the angular light scattering function. The main question is how these parameters are related to the particle microphysical properties, such as particle size and complexity.
An Analysis of the Global Atmospheric Methane Budget Under Different Climates
Author: Abhijit Basu
Publisher: Forschungszentrum Jülich
ISBN: 3893368590
Category :
Languages : en
Pages : 127
Book Description
Publisher: Forschungszentrum Jülich
ISBN: 3893368590
Category :
Languages : en
Pages : 127
Book Description
Lidar Observations of Natural and Volcanic-ash-induced Cirrus Clouds
Author: Christian Rolf
Publisher: Forschungszentrum Jülich
ISBN: 3893368477
Category :
Languages : en
Pages : 143
Book Description
Publisher: Forschungszentrum Jülich
ISBN: 3893368477
Category :
Languages : en
Pages : 143
Book Description
Ion Beam Treatment of Functional Layers in Thin-film Silicon Solar Cells
Author: Wendi Zhang
Publisher: Forschungszentrum Jülich
ISBN: 3893368647
Category :
Languages : en
Pages : 215
Book Description
Publisher: Forschungszentrum Jülich
ISBN: 3893368647
Category :
Languages : en
Pages : 215
Book Description
Effects of 137Cs and 90Sr on Structure and Functional Aspects of the Microflora in Agricultural Used Soils
Author: Bastian Niedrée
Publisher: Forschungszentrum Jülich
ISBN: 3893368434
Category :
Languages : en
Pages : 113
Book Description
Publisher: Forschungszentrum Jülich
ISBN: 3893368434
Category :
Languages : en
Pages : 113
Book Description
Experimental Determination of the Partitioning Coefficient of Nopinone as a Marker Substance in Organic Aerosol
Author: Bettina Steitz
Publisher: Forschungszentrum Jülich
ISBN: 3893368620
Category :
Languages : en
Pages : 139
Book Description
Publisher: Forschungszentrum Jülich
ISBN: 3893368620
Category :
Languages : en
Pages : 139
Book Description
Interest Mediation and Policy Formulation in the European Union
Author: Olga Schenk
Publisher: Forschungszentrum Jülich
ISBN: 3893368523
Category :
Languages : en
Pages : 277
Book Description
Publisher: Forschungszentrum Jülich
ISBN: 3893368523
Category :
Languages : en
Pages : 277
Book Description
Nuclear Science Abstracts
Transmission Electron Microscopy
Author: C. Barry Carter
Publisher: Springer
ISBN: 3319266519
Category : Technology & Engineering
Languages : en
Pages : 543
Book Description
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Publisher: Springer
ISBN: 3319266519
Category : Technology & Engineering
Languages : en
Pages : 543
Book Description
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.