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Author: D.K. Bowen Publisher: CRC Press ISBN: 0203979192 Category : Technology & Engineering Languages : en Pages : 263
Book Description
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization
Author: D.K. Bowen Publisher: CRC Press ISBN: 0203979192 Category : Technology & Engineering Languages : en Pages : 263
Book Description
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization
Author: André Authier Publisher: Springer Science & Business Media ISBN: 1461558794 Category : Science Languages : en Pages : 419
Book Description
This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.
Author: Vitalij Pecharsky Publisher: Springer Science & Business Media ISBN: 0387095799 Category : Science Languages : en Pages : 751
Book Description
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .
Author: Vitalij Pecharsky Publisher: Springer Science & Business Media ISBN: 9781402073656 Category : Technology & Engineering Languages : en Pages : 752
Book Description
Requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method. Useful for any scientific or engineering background, where precise structural information is required. Comprehensively describes the state-of-the-art in structure determination from powder diffraction data both theoretically and practically using multiple examples of varying complexity. Pays particular attention to the utilization of Internet resources, especially the well-tested and freely available computer codes designed for processing of powder diffraction data.
Author: Mario Birkholz Publisher: John Wiley & Sons ISBN: 3527607048 Category : Technology & Engineering Languages : en Pages : 378
Book Description
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Author: Brian Keith Tanner Publisher: Pergamon ISBN: Category : Science Languages : en Pages : 192
Book Description
X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang's method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring cr.
Author: Hans J. Scheel Publisher: John Wiley & Sons ISBN: 3527632891 Category : Technology & Engineering Languages : en Pages : 367
Book Description
Semiconductors and dielectrics are two essential materials found in cell phones and computers, for example, and both are manufactured by growing crystals. Edited by the organizers of the International Workshop on Crystal Growth Technology, this ready reference is essential reading for materials scientists, chemists, physicists, computer hardware manufacturers, engineers, and those working in the chemical and semiconductor industries. They have assembled an international team of experts who present the current challenges, latest methods and new applications for producing these materials necessary for the electronics industry using bulk crystal growth technology. From the contents: * General aspects of crystal growth technology * Compound semiconductors * Halides and oxides * Crystal growth for sustaining energy * Crystal machining
Author: Mihail Nazarov Publisher: CRC Press ISBN: 9814364053 Category : Science Languages : en Pages : 458
Book Description
This book concentrates on the luminescence and structural properties of the new generation of europium and terbium activated phosphors, associated phenomena, and related topics, from basic principles to the most recent discoveries. It summarizes the present state of the art in this rapidly growing field. The authors describe recent developments in
Author: Mihail Lungu Publisher: Cambridge Scholars Publishing ISBN: 1527591670 Category : Science Languages : en Pages : 228
Book Description
Oxide materials are the most common natural materials and are used in various technical and biomedical applications. Oxides are involved in industry to produce energy, various sensors, catalysts and electronic devices. They also find uses in medical applications, personal and home care products, and construction in manufacturing sealants, adhesives, paints and coating. The application of oxide materials will continue to grow in the future and their use as nanostructured materials will open new horizons. This book presents the fundamentals of oxide powders, undoped or doped with metal ions (having spinel, perovskite or crednerite type structure) and obtained by different methods, establishing a connection between the structure and their electromagnetic properties, with the purpose to be used in technological and biomedical applications.
Author: D.K. Bowen
Author: D.K. Bowen
Author: André Authier
Author: Vitalij Pecharsky
Author: Vitalij Pecharsky
Author: Mario Birkholz
Author: Brian Keith Tanner
Author: Hans J. Scheel
Author: Mihail Nazarov
Author: Mihail Lungu
Author: Heather M. Volz