Author: Timothy David VealPublisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
High Resolution Electron Energy Loss Spectroscopy of Narrow Gap III V Semiconductor Surfaces and Interfaces
Author: Timothy David VealSemiconductor - metal interfaces studied by high resolution electron energy loss spectroscopy
Author: Ramón Compañó MonteSurfaces and Interfaces of Solid Materials
Author: Hans LüthPublisher: Springer Science & Business Media
ISBN: 3662031329
Category : Technology & Engineering
Languages : en
Pages : 508
Book Description
Surfaces and Interfaces of Solid Materials emphasises both experimental and theoretical aspects of surface and interface physics. Beside the techniques of preparing well-defined solid surfaces and interfaces basic models for the description of structural, vibronic and electronic properties of interfaces are described, as well as fundamental aspects of adsorption and layer growth. Because of its importance for modern microelectronics special emphasis is placed on the electronic properties of semiconductor interfaces and heterostructures. Experimental topics covering the basics of ultrahigh-vacuum technology, electron optics, surface spectroscopies and electrical interface characterization techniques are presented in the form of separate panels.
Surfaces and Interfaces of Solids
Author: Hans LüthPublisher: Springer Science & Business Media
ISBN: 3662101599
Category : Technology & Engineering
Languages : en
Pages : 497
Book Description
"Surfaces and Interfaces of Solids" emphasizes both experimental and theoretical aspects of surface and interface physics. Beside the techniques of preparing well-defined solid surfaces and interfaces basic models for the description of structural, vibronic and electronic properties ofinterfaces are described, as well as fundamental aspects of adsorption and layer growth. Because of its importance for modern microelectronics special emphasis is placed on the electronic properties of semiconductorinterfaces and heterostructures. Experimental topics covering the basics of ultrahigh-vacuum technology, electron optics, surface spectroscopies and electrical interface characterization techniques are presented in the form of separate panels.
Semiconductor Metal Interfaces Studied by High Resolution Electron Energy Loss Spectroscopy
Author: Ramón Compañó MonteHigh Resolution Electron Energy Loss Spectroscopy of Surface Excitations
Author: Joseph Anthony StroscioPublisher:
ISBN:
Category : Electron energy loss spectroscopy
Languages : en
Pages : 1202
Book Description
Electron Energy-loss Spectroscopy of Surfaces and Interfaces
Author: Michael Gerard WallsApplication of High Resolution Electron Energy Loss Spectroscopy to Catalysis and Semiconductor Surface Studies
Author: Shinichiro TakataniHigh Resolution Electron Energy Loss Spectroscopy of InAs and InSb (001) Surfaces
Author: Gavin Richard BellAtomic Resolution Electron Energy Loss Spectroscopy of Interfaces
Author: Publisher:
ISBN:
Category :
Languages : en
Pages : 3
Book Description
The ability of high resolution STEM instruments to provide electron energy loss spectroscopy (EELS) data at the ultimate atomic resolution offers significant new insights into interfacial phenomena. Several examples are described in this paper.