Fundamentals of Surface and Thin Film Analysis PDF Download

Author: Leonard C. Feldman
Publisher:
ISBN:
Category : Mathematics
Languages : en
Pages : 384

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Book Description
Contains concise coverage of the major analytical techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectroscopy and RBS methods. Annotation copyrighted by Book News, Inc., Portland, OR

Author: L.C. Feldman
Publisher:
ISBN:
Category :
Languages : it
Pages : 0

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Author:
Publisher:
ISBN: 9780444012753
Category :
Languages : en
Pages : 43

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Book Description

Author: Gernot Friedbacher
Publisher: Wiley-VCH
ISBN: 9783527320479
Category : Technology & Engineering
Languages : en
Pages : 0

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Book Description
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)

Author: Henning Bubert
Publisher: Wiley-VCH
ISBN: 9783527304585
Category : Science
Languages : en
Pages : 0

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Book Description
The development and quality assurance of such high-tech materials as semiconductors or biopolymers demand special analytical methods for surfaces and thin films. This book presents the whole spectrum of methods available in a clear manner, moving beyond the basics, equipment and applications to compare these methods. This allows users to find the optimum method in solving any given problem. - The book is richly illustrated with 200 figures - Almost 900 references guide to the primary literature - A list of suppliers, each with full address, makes it easy to obtain the required equipment

Author: Terry L. Alford
Publisher: Springer Science & Business Media
ISBN: 0387292608
Category : Technology & Engineering
Languages : en
Pages : 349

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Book Description
From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.

Author: Gernot Friedbacher
Publisher: John Wiley & Sons
ISBN: 3527636935
Category : Technology & Engineering
Languages : en
Pages : 514

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Book Description
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)

Author: John Venables
Publisher: Cambridge University Press
ISBN: 9780521785006
Category : Science
Languages : en
Pages : 392

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Book Description
This book covers the experimental and theoretical understanding of surface and thin film processes. It presents a unique description of surface processes in adsorption and crystal growth, including bonding in metals and semiconductors. Emphasis is placed on the strong link between science and technology in the description of, and research for, new devices based on thin film and surface science. Practical experimental design, sample preparation and analytical techniques are covered, including detailed discussions of Auger electron spectroscopy and microscopy. Thermodynamic and kinetic models of structure are emphasised throughout. The book provides extensive leads into practical and research literature, as well as resources on the World Wide Web (see http://venables.asu.edu/book). Each chapter contains problems which aim to develop awareness of the subject and the methods used. Aimed as a graduate textbook, this book will also be useful as a sourcebook for graduate students, researchers and practitioners in physics, chemistry, materials science and engineering.

Author: A. Goswami
Publisher: New Age International
ISBN: 9788122408584
Category : Thin films
Languages : en
Pages : 568

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Book Description
Even Though Thin Solid Films Have Found Tremendous Applications In Electronic, Optical And Other Industries The Basic Concepts About Them Have Often Been Taken Similar To Those Of The Bulk Materials From Which Films Are Prepared And These Need Not Be So. This Book Is Intended To Serve As A Guide To Students, Beginners And Research Workers Interested In This Field.The Basic Science Behind Thin Solid Films Has Been Described With Special Reference To Nucleation, Structures Of Films, Their Growth Process, Phase Transitions, Behaviour Of Films Under Electrical, Electromagnetic And Other Fields With Film Thickness, Temperatures Etc. Characteristic Behaviour Of Films, Different From Bulk, Can Often Be Related To Nearly Two-Dimensional Nature Of Films And Also To The Presence Of Factors Such As Surface States, Contact Potential, High Defect Concentration, Creation Of New Energy Levels, In-Homogeneities, Discontinuities Or Gaps, Etc. Which Are More Often Less Significant In Bulk Materials. Special Techniques Used For Measuring Thin Film Properties And Also Precautions To Be Taken Have Been Given In Details. This Book Also Includes Many Useful Relations Otherwise Scattered In Literatures And Also A Good Number Of References Though Not Complete But Relevant To The Topics Discussed.

Author: Thomas M. Christensen
Publisher: CRC Press
ISBN: 1482233061
Category : Science
Languages : en
Pages : 373

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Book Description
This book is a conceptual overview of surface and thin film science, providing a basic and straightforward understanding of the most common ideas and methods used in these fields. Fundamental scientific ideas, deposition methods, and characterization methods are all examined. Relying on simple, conceptual models and figures, fundamental scientific ideas are introduced and then applied to surfaces and thin films in the first half of the book. Topics include vacuum and plasma environments, crystal structure, atomic motion, thermodynamics, electrical and magnetic properties, optical and thermal properties, and adsorbed atoms on surfaces. Common methods of gas-phase thin film deposition are then introduced, starting with an overview of the film growth process and then a discussion of both physical and chemical vapor deposition methods. This is followed by an overview of a wide range of characterization techniques including imaging, structural, chemical, electrical, magnetic, optical, thermal, and mechanical techniques. Thin film science is a natural extension of surface science, especially as applications involve thinner and thinner films; distinct from other literature in the field, this book combines the two topics in a single volume. Simple, conceptual models and figures are used, supported by some mathematical expressions, to convey key ideas to students as well as practicing engineers, scientists, and technicians.