Author: Publisher:
ISBN: 9780931288463
Category :
Languages : en
Pages : 383
Book Description
Fundamental Electron and Ion Beam Interactions with Solids for Microscopy, Microanalysis and Microlithography
Author: Fundamental Electron and Ion Beam Interactions with Solids for Microscopy, Microanalysis, and Microlithography
Author: Jørgen SchouPublisher:
ISBN: 9780931288463
Category : Electron beams
Languages : en
Pages : 370
Book Description
Electron Beam Interactions with Solids for Microscopy, Microanalysis & Microlithography
Author: David F. KyserPublisher: Scanning Electron Microscopy
ISBN:
Category : Science
Languages : en
Pages : 392
Book Description
In-situ Characterization Techniques for Nanomaterials
Author: Challa S.S.R. KumarPublisher: Springer
ISBN: 3662563223
Category : Technology & Engineering
Languages : en
Pages : 458
Book Description
Seventh volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about In-situ Characterization Techniques for Nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
The Science of Biological Specimen Preparation for Microscopy
Author: Godfried M. RoomansPublisher:
ISBN: 9780931288494
Category : Biological specimens
Languages : en
Pages : 490
Book Description
The Principles and Practice of Electron Microscopy
Author: Ian M. WattPublisher: Cambridge University Press
ISBN: 9780521435918
Category : Science
Languages : en
Pages : 506
Book Description
The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.
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