Author: Ka Ngow WongPublisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 124
Book Description
Functional Method for Multiple Fault Detection and Location in Combinational Circuits
Author: Ka Ngow WongPublisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 124
Book Description
Multiple Fault Detection for Combinational Circuits
Author: Gholam-Reza FadakarPublisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 118
Book Description
Multiple Fault Detection in Combinational Circuits
Author: Min-Wen DuMultiple Fault Detection in Combinational Circuits
Author: Sivanarayana MallelaPublisher:
ISBN:
Category :
Languages : en
Pages : 128
Book Description
Optimum Statistical Fault Detection in Combinational Circuits
Author: S. AmaranathanSpectral Techniques and Fault Detection
Author: Marg KarpovskyPublisher: Elsevier
ISBN: 032314442X
Category : Technology & Engineering
Languages : en
Pages : 619
Book Description
Spectral Techniques and Fault Detection focuses on the spectral techniques for the analysis, testing, and design of digital devices. This book discusses the error detection and correction in digital devices. Organized into 10 chapters, this book starts with an overview of the concepts and tools to evaluate the applicability of various spectral approaches and fault-detection techniques to the design. This text then describes the class of generalized Programmable Logic Array configurations called Encoded PLAs. Other chapters consider the two-sided Chrestenson Transform to the analysis of some pattern properties. This book describes as well a certain type of cellular arrays for highly parallel processing, namely, three-dimensional arrays. The final chapter deals with the system design methods that allow and encourage designers to incorporate the necessary distributed error correction throughout any digital system. This book is a valuable resource for graduate students and engineers working in the fields of logic design, spectral techniques, testing, and self-testing of digital devices.
Scientific and Technical Aerospace Reports
Author: Rational Fault Analysis
Author: Richard SaeksPublisher: Marcel Dekker
ISBN:
Category : Business & Economics
Languages : en
Pages : 264
Book Description
Information on the development of rational procedures for detection, location, & prediction of faults in a variety of systems. Includes a chapter on computer-aided fault analysis.
Testing for multiple intermittent failures in combinational circuits by maximizing the probability of fault detection
Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 36
Book Description
Adaptive Location of Multiple Faults in Combinational Circuits
Author: Alan Douglas MayPublisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 172
Book Description