Author: O. BunemannPublisher:
ISBN:
Category : Beam dynamics
Languages : en
Pages : 24
Book Description
Formation of Focussed Space-charge-limited Electrons and Ion Beams
Author: O. BunemannPublisher:
ISBN:
Category : Beam dynamics
Languages : en
Pages : 24
Book Description
Formation of Focussed Space-charge-limited Electrons and Ion Beams
Author: O. BunemannPublisher:
ISBN:
Category : Electron beams
Languages : en
Pages : 0
Book Description
Formation of Focussed Space-charge Limited Electron and Ion Beams
Author: O. BunemanPublisher:
ISBN:
Category : Electrodes, Ion selective
Languages : en
Pages : 50
Book Description
Formation of Focussed Space-charge-limited Electrons and Ion Beams
Author: O. BunemannPublisher:
ISBN:
Category : Electron beams
Languages : en
Pages : 16
Book Description
Formation of Focussed Space-charge Limited Electron and Ion Beams. Part II. Design of Electrodes
Author: O. BunemanMaterial Characterization Using Ion Beams
Author: J. ThomasPublisher: Springer Science & Business Media
ISBN: 1468408569
Category : Science
Languages : en
Pages : 521
Book Description
The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity by itself and in its evident connec tion with the others has brought a new impetus to both the funda mental and the applied aspects of materials science. A summer school on "Material Characterization Using Ion Beams" has resulted from these developments and the realization that the use of ion beams is not restricted to accelerators but covers a wide energy range in the developing technology. The idea of the ion beam as a common denominator of many act1v1t1es dealing with surface and near-surface characterization was enthu siastically received by many scientists and a school on this subject received the positive endorsement of NATO. The Advanced Study Institute on Materials Science has assumed for us the status of an "institution" leading to better contact among the many laboratories engaged in this field. The fourth Institute in this series was held in Aleria, Corsica, between August 22 and September 12, 1976.
Abstracts of Declassified Documents
Author: U.S. Atomic Energy CommissionPublisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 818
Book Description
Consists of AECD 1-2023 (no. 1-1779 called MDDC).
Bibliography of Scientific and Industrial Reports
Author: Catalogue of Publications Issued by the Government of the United States
Author: United States. Superintendent of DocumentsPublisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1334
Book Description
February issue includes Appendix entitled Directory of United States Government periodicals and subscription publications; September issue includes List of depository libraries; June and December issues include semiannual index
Handbook of Charged Particle Optics
Author: Jon OrloffPublisher: CRC Press
ISBN: 1420045555
Category : Science
Languages : en
Pages : 666
Book Description
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.