Author: Hafiz Ul AsadPublisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Formal Verification of Analog and Mixed Signal Circuits Using Deductive and Bounded Approaches
Author: Hafiz Ul AsadTechniques for the Formal Verification of Analog and Mixed- Signal Designs
Author: Mohamed Hamed Zaki HusseinPublisher:
ISBN:
Category :
Languages : en
Pages : 382
Book Description
Formal Verification and In-Situ Test of Analog and Mixed-Signal Circuits
Author: Leyi YinPublisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
As CMOS technologies continuously scale down, designing robust analog and mixed-signal (AMS) circuits becomes increasingly difficult. Consequently, there are pressing needs for AMS design checking techniques, more specifically design verification and design for testability (DfT). The purpose of verification is to ensure that the performance of an AMS design meets its specification under process, voltage and temperature (PVT) variations and different working conditions, while DfT techniques aim at embedding testability into the design, by adding auxiliary circuitries for testing purpose. This dissertation focuses on improving the robustness of AMS designs in highly scaled technologies, by developing novel formal verification and in-situ test techniques. Compared with conventional AMS verification that relies more on heuristically chosen simulations, formal verification provides a mathematically rigorous way of checking the target design property. A formal verification framework is proposed that incorporates nonlinear SMT solving techniques and simulation exploration to efficiently verify the dynamic properties of AMS designs. A powerful Bayesian inference based technique is applied to dynamically tradeoff between the costs of simulation and nonlinear SMT. The feasibility and efficacy of the proposed methodology are demonstrated on the verification of lock time specification of a charge-pump PLL. The powerful and low-cost digital processing capabilities of today's CMOS technologies are enabling many new in-situ test schemes in a mixed-signal environment. First, a novel two-level structure of GRO-PVDL is proposed for on-chip jitter testing of high-speed high-resolution applications with a gated ring oscillator (GRO) at the first level to provide a coarse measurement and a Vernier-style structure at the second level to further measure the residue from the first level with a fine resolution. With the feature of quantization noise shaping, an effective resolution of 0.8ps can be achieved using a 90nm CMOS technology. Second, the reconfigurability of recent all-digital PLL designs is exploited to provide in-situ output jitter test and diagnosis abilities under multiple parametric variations of key analog building blocks. As an extension, an in-situ test scheme is proposed to provide online testing for all-digital PLL based polar transmitters. The electronic version of this dissertation is accessible from http://hdl.handle.net/1969.1/151616
Test and Design-for-Testability in Mixed-Signal Integrated Circuits
Author: Jose Luis Huertas DíazPublisher: Springer Science & Business Media
ISBN: 0387235213
Category : Technology & Engineering
Languages : en
Pages : 310
Book Description
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
Analog/RF and Mixed-Signal Circuit Systematic Design
Author: Mourad FakhfakhPublisher: Springer Science & Business Media
ISBN: 3642363296
Category : Technology & Engineering
Languages : en
Pages : 380
Book Description
Despite the fact that in the digital domain, designers can take full benefits of IPs and design automation tools to synthesize and design very complex systems, the analog designers’ task is still considered as a ‘handcraft’, cumbersome and very time consuming process. Thus, tremendous efforts are being deployed to develop new design methodologies in the analog/RF and mixed-signal domains. This book collects 16 state-of-the-art contributions devoted to the topic of systematic design of analog, RF and mixed signal circuits. Divided in the two parts Methodologies and Techniques recent theories, synthesis techniques and design methodologies, as well as new sizing approaches in the field of robust analog and mixed signal design automation are presented for researchers and R/D engineers.
Verification of Analog and Mixed-signal Circuits Using Symbolic Methods
Author: David C. WalterPublisher:
ISBN: 9780549051701
Category : Computer software
Languages : en
Pages : 121
Book Description
After describing the verification system in detail, experiences applying the techniques to several case studies are described and performance results are provided.
Novellen
Author: Learning Approaches to Analog and Mixed Signal Verification and Analysis
Author: Samantha Alice AltPublisher:
ISBN: 9781321695533
Category :
Languages : en
Pages : 198
Book Description
There are many automated characterization, test, and verification methods used in practice for digital circuits, but analog and mixed signal circuits suffer from long simulation times brought on by transistor-level analysis. Due to the substantial amount of simulations required to properly characterize and verify an analog circuit, many undetected issues manifest themselves in the manufactured chips.
SAT-based Verification for Analog and Mixed-signal Circuits
Author: Yue DengPublisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
The wide application of analog and mixed-signal (AMS) designs makes the verification of AMS circuits an important task. However, verification of AMS circuits remains as a significant challenge even though verification techniques for digital circuits design have been successfully applied in the semiconductor industry. In this thesis, we propose two techniques for AMS verification targeting DC and transient verifications, respectively. The proposed techniques leverage a combination of circuit modeling, satisfiability (SAT) and circuit simulation techniques. For DC verification, we first build bounded device models for transistors. The bounded models are conservative approximations to the accurate BSIM3/4 models. Then we formulate a circuit verification problem by gathering the circuit's KCL/KVL equations and the I-V characteristics which are constrained by the bounded models. A nonlinear SAT solver is then recursively applied to the problem formula to locate a candidate region which is guaranteed to enclose the actual DC equilibrium of the original circuit. In the end, a refinement technique is applied to reduce the size of candidate region to a desired resolution. To demonstrate the application of the proposed DC verification technique, we apply it to locate the DC equilibrium points for a set of ring oscillators. The experimental results show that the proposed DC verification technique is efficient in terms of runtime. For transient verification, we perform reachability analysis to verify the dynamic property of a circuit. Our method combines circuit simulation SAT to take advantage of the efficiency of simulation and the soundness of SAT. The novelty of the proposed transient verification lies in the fact that a significant part of the reachable state space is discovered via fast simulation while the full coverage of the reachable state space is guaranteed by the invoking of a few SAT runs. Furthermore, a box merging algorithm is presented to efficiently represent the reachable state space using grid boxes. The proposed technique is used to verify the startup condition of a tunnel diode oscillator and the phase-locking of a phase-locked loop (PLL). The experimental results demonstrate that the proposed transient verification technique can perform reachability analysis for reasonable complex circuits over a great number of time steps.
Author: Abhijit Ghosh