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Author: Albert Septier Publisher: Elsevier ISBN: 0323147186 Category : Science Languages : en Pages : 524
Book Description
Focusing of Charged Particles, Volume I, explains the focusing principles needed to guide the beams of fast particles over long distances and to increase the internal efficiency of particle accelerators. This book discusses the geometrical corpuscular optics as well as the methods for computing fields. Comprised of two parts encompassing two chapters, this volume starts with an overview of the general properties of potentials, fields, and trajectories. This book then examines the methods for resolving Laplace's and Poisson's equations, as well as computing trajectories with or without space charge. Other chapters describe the methods used for the measurement of magnetic field. This text discusses as well the optics of straight axis systems for focusing and producing low-intensity beams. The final chapter deals with the particular and very delicate problem of the production of electron microbes. Engineers, students, and researchers working with charged particles will find this book extremely useful.
Author: Albert Septier Publisher: Elsevier ISBN: 0323147186 Category : Science Languages : en Pages : 524
Book Description
Focusing of Charged Particles, Volume I, explains the focusing principles needed to guide the beams of fast particles over long distances and to increase the internal efficiency of particle accelerators. This book discusses the geometrical corpuscular optics as well as the methods for computing fields. Comprised of two parts encompassing two chapters, this volume starts with an overview of the general properties of potentials, fields, and trajectories. This book then examines the methods for resolving Laplace's and Poisson's equations, as well as computing trajectories with or without space charge. Other chapters describe the methods used for the measurement of magnetic field. This text discusses as well the optics of straight axis systems for focusing and producing low-intensity beams. The final chapter deals with the particular and very delicate problem of the production of electron microbes. Engineers, students, and researchers working with charged particles will find this book extremely useful.
Author: Albert Septier Publisher: Elsevier ISBN: 0323148468 Category : Science Languages : en Pages : 487
Book Description
Focusing of Charged Particles, Volume II presents the aspects of particle optics, including the electron, the ion optical domains, and the accelerator field. This book provides a detailed analysis of the principles of the laws of propagation of beams. Comprised of three parts encompassing three chapters, this volume starts with an overview of how a beam of charged particles traverses a region that is at a uniform, constant, electrostatic potential. This book then discusses the principle of charge repulsion effect by which the space charge of the beam modifies the potential in the region that it traverses. Other chapters examine the general design techniques and performances obtainable for electron guns applicable for use in initiating a beam for linear beam tubes that is given in a condensed form. The last chapter deals with the two stable charged particles that can be accelerated, namely, protons and electrons. This book is a valuable resource to physicists, accelerator experts, and experimenters in search of interactions in the detector target.
Author: Fouad G. Major Publisher: Springer Science & Business Media ISBN: 9783540220435 Category : Science Languages : en Pages : 372
Book Description
This book provides an introduction and guide to modern advances in charged particle (and antiparticle) confinement by electromagnetic fields. Confinement in different trap geometries, the influence of trap imperfections, classical and quantum mechanical description of the trapped particle motion, different methods of ion cooling to low temperatures, and non-neutral plasma properties (including Coulomb crystals) are the main subjects. They form the basis of such applications of charged particle traps as high-resolution optical and microwave spectroscopy, mass spectrometry, atomic clocks, and, potentially, quantum computing.
Author: Publisher: Academic Press ISBN: 0080860176 Category : Science Languages : en Pages : 485
Book Description
With this volume, Methods of Experimental Physics becomes Experimental Methods in the Physical Sciences, a name change which reflects the evolution of todays science. This volume is the first of three which will provide a comprehensive treatment of the key experimental methods of atomic, molecular, and optical physics; the three volumes as a set will form an excellent experimental handbook for the field. The wide availability of tunable lasers in the pastseveral years has revolutionized the field and lead to the introduction of many new experimental methods that are covered in these volumes. Traditional methods are also included to ensure that the volumes will be a complete reference source for the field.
Author: Helmut Liebl Publisher: Springer Science & Business Media ISBN: 3540719253 Category : Science Languages : en Pages : 131
Book Description
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Author: Martin Reiser Publisher: John Wiley & Sons ISBN: 3527617639 Category : Science Languages : en Pages : 634
Book Description
Although particle accelerators are the book's main thrust, it offers a broad synoptic description of beams which applies to a wide range of other devices such as low-energy focusing and transport systems and high-power microwave sources. Develops material from first principles, basic equations and theorems in a systematic way. Assumptions and approximations are clearly indicated. Discusses underlying physics and validity of theoretical relationships, design formulas and scaling laws. Features a significant amount of recent work including image effects and the Boltzmann line charge density profiles in bunched beams.
Author: John H. Moore Publisher: Cambridge University Press ISBN: 0521878586 Category : Mathematics Languages : en Pages : 663
Book Description
Unrivalled in its coverage and unique in its hands-on approach, this guide to the design and construction of scientific apparatus is essential reading for every scientist and student of engineering, and physical, chemical, and biological sciences. Covering the physical principles governing the operation of the mechanical, optical and electronic parts of an instrument, new sections on detectors, low-temperature measurements, high-pressure apparatus, and updated engineering specifications, as well as 400 figures and tables, have been added to this edition. Data on the properties of materials and components used by manufacturers are included. Mechanical, optical, and electronic construction techniques carried out in the lab, as well as those let out to specialized shops, are also described. Step-by-step instruction supported by many detailed figures, is given for laboratory skills such as soldering electrical components, glassblowing, brazing, and polishing.
Author: Jon Orloff Publisher: CRC Press ISBN: 1420045555 Category : Science Languages : en Pages : 666
Book Description
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Author: Martin Reiser Publisher: John Wiley & Sons ISBN: 3527622055 Category : Science Languages : en Pages : 674
Book Description
This indispensable work offers a broad synoptic description of beams, applicable to a wide range of other devices, such as low-energy focusing and transport systems and high-power microwave sources. The monograph develops the material from the basic principles in a systematic way and discusses the underlying physics and validity of theoretical relationships, design formulas and scaling laws. Assumptions and approximations are clearly indicated throughout. This new, revised and updated edition has 10% additional content, and features, among others, a new chapter on beam physics research from 1993 to 2007, significant enhancement of chapter 6 on emittance variation, updated references and color image plates.
Author: Albert Septier
Author: Albert Septier
Author: Albert Septier
Author: Fouad G. Major
Author: 
Author: Helmut Liebl
Author: Martin Reiser
Author: John H. Moore
Author: 
Author: Jon Orloff
Author: Martin Reiser