Author:
Publisher:
ISBN: 9780819498014
Category : Interferometry
Languages : en
Pages : 0
Book Description
Field Guide to Displacement Measuring Interferometry
Author:
Publisher:
ISBN: 9780819498014
Category : Interferometry
Languages : en
Pages : 0
Book Description
Publisher:
ISBN: 9780819498014
Category : Interferometry
Languages : en
Pages : 0
Book Description
Field Guide to Displacement Measuring Interferometry
Author: Jonathan David Ellis
Publisher:
ISBN: 9780819498007
Category : SCIENCE
Languages : en
Pages : 128
Book Description
This Field Guide provides a practical treatment of the fundamental theory of displacement measuring interferometry, with examples of interferometry systems and uses. It outlines alignment techniques for optical components, signal processing systems for phase measurements, and laser stabilization for homodyne and heterodyne sources. The concept of displacement measurement uncertainty is discussed with a practical example of calculating uncertainty budgets. For practicing engineers, this Field Guide will serve as a refresher manual for error sources and uncertainty budgets. For researchers, it will bring new insight to the way in which this technology can be useful in their field. For new engineers, researchers, and students, it will also serve as an introduction into basic alignment techniques for breadboard-based optical systems.
Publisher:
ISBN: 9780819498007
Category : SCIENCE
Languages : en
Pages : 128
Book Description
This Field Guide provides a practical treatment of the fundamental theory of displacement measuring interferometry, with examples of interferometry systems and uses. It outlines alignment techniques for optical components, signal processing systems for phase measurements, and laser stabilization for homodyne and heterodyne sources. The concept of displacement measurement uncertainty is discussed with a practical example of calculating uncertainty budgets. For practicing engineers, this Field Guide will serve as a refresher manual for error sources and uncertainty budgets. For researchers, it will bring new insight to the way in which this technology can be useful in their field. For new engineers, researchers, and students, it will also serve as an introduction into basic alignment techniques for breadboard-based optical systems.
Field Guide to Displacement Measuring Interferometry
Author: Jonathan D. Ellis
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819497994
Category : Science
Languages : en
Pages : 0
Book Description
Provides a practical treatment of the fundamental theory of displacement measuring interferometry, with examples of interferometry systems and uses. It outlines alignment techniques for optical components, signal processing systems for phase measurements, and laser stabilisation for homodyne and heterodyne sources.
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819497994
Category : Science
Languages : en
Pages : 0
Book Description
Provides a practical treatment of the fundamental theory of displacement measuring interferometry, with examples of interferometry systems and uses. It outlines alignment techniques for optical components, signal processing systems for phase measurements, and laser stabilisation for homodyne and heterodyne sources.
Basics of Precision Engineering
Author: Richard Leach
Publisher: CRC Press
ISBN: 0429887442
Category : Technology & Engineering
Languages : en
Pages : 659
Book Description
Advances in engineering precision have tracked with technological progress for hundreds of years. Over the last few decades, precision engineering has been the specific focus of research on an international scale. The outcome of this effort has been the establishment of a broad range of engineering principles and techniques that form the foundation of precision design. Today’s precision manufacturing machines and measuring instruments represent highly specialised processes that combine deterministic engineering with metrology. Spanning a broad range of technology applications, precision engineering principles frequently bring together scientific ideas drawn from mechanics, materials, optics, electronics, control, thermo-mechanics, dynamics, and software engineering. This book provides a collection of these principles in a single source. Each topic is presented at a level suitable for both undergraduate students and precision engineers in the field. Also included is a wealth of references and example problems to consolidate ideas, and help guide the interested reader to more advanced literature on specific implementations.
Publisher: CRC Press
ISBN: 0429887442
Category : Technology & Engineering
Languages : en
Pages : 659
Book Description
Advances in engineering precision have tracked with technological progress for hundreds of years. Over the last few decades, precision engineering has been the specific focus of research on an international scale. The outcome of this effort has been the establishment of a broad range of engineering principles and techniques that form the foundation of precision design. Today’s precision manufacturing machines and measuring instruments represent highly specialised processes that combine deterministic engineering with metrology. Spanning a broad range of technology applications, precision engineering principles frequently bring together scientific ideas drawn from mechanics, materials, optics, electronics, control, thermo-mechanics, dynamics, and software engineering. This book provides a collection of these principles in a single source. Each topic is presented at a level suitable for both undergraduate students and precision engineers in the field. Also included is a wealth of references and example problems to consolidate ideas, and help guide the interested reader to more advanced literature on specific implementations.
Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry
Author: Christopher Taudt
Publisher: Springer Nature
ISBN: 3658359269
Category : Science
Languages : en
Pages : 180
Book Description
This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 μm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach.
Publisher: Springer Nature
ISBN: 3658359269
Category : Science
Languages : en
Pages : 180
Book Description
This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 μm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach.
Recent Advances in Microelectronics Reliability
Author: Willem Dirk van Driel
Publisher: Springer Nature
ISBN: 3031593618
Category :
Languages : en
Pages : 405
Book Description
Publisher: Springer Nature
ISBN: 3031593618
Category :
Languages : en
Pages : 405
Book Description
Blackbody Radiometry
Author: Victor Sapritsky
Publisher: Springer Nature
ISBN: 3030577899
Category : Technology & Engineering
Languages : en
Pages : 698
Book Description
This book, the first of a two-volume set, focuses on the basic physical principles of blackbody radiometry and describes artificial sources of blackbody radiation, widely used as sources of optical radiation, whose energy characteristics can be calculated on the base of fundamental physical laws. Following a review of radiometric quantities, radiation laws, and radiative heat transfer, it introduces the basic principles of blackbody radiators design, details of their practical implementation, and methods of measuring their defining characteristics, as well as metrological aspects of blackbody-based measurements. Chapters are dedicated to the effective emissivity concept, methods of increasing effective emissivities, their measurement and modeling using the Monte Carlo method, techniques of blackbody radiators heating, cooling, isothermalization, and measuring their temperature. An extensive and comprehensive reference source, this book is of considerable value to students, researchers, and engineers involved in any aspect of blackbody radiometry.
Publisher: Springer Nature
ISBN: 3030577899
Category : Technology & Engineering
Languages : en
Pages : 698
Book Description
This book, the first of a two-volume set, focuses on the basic physical principles of blackbody radiometry and describes artificial sources of blackbody radiation, widely used as sources of optical radiation, whose energy characteristics can be calculated on the base of fundamental physical laws. Following a review of radiometric quantities, radiation laws, and radiative heat transfer, it introduces the basic principles of blackbody radiators design, details of their practical implementation, and methods of measuring their defining characteristics, as well as metrological aspects of blackbody-based measurements. Chapters are dedicated to the effective emissivity concept, methods of increasing effective emissivities, their measurement and modeling using the Monte Carlo method, techniques of blackbody radiators heating, cooling, isothermalization, and measuring their temperature. An extensive and comprehensive reference source, this book is of considerable value to students, researchers, and engineers involved in any aspect of blackbody radiometry.
Optical Measurement of Surface Topography
Author: Richard Leach
Publisher: Springer Science & Business Media
ISBN: 3642120121
Category : Technology & Engineering
Languages : en
Pages : 333
Book Description
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Publisher: Springer Science & Business Media
ISBN: 3642120121
Category : Technology & Engineering
Languages : en
Pages : 333
Book Description
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Basics of Interferometry
Author: P. Hariharan
Publisher: Academic Press
ISBN: 0080918611
Category : Technology & Engineering
Languages : en
Pages : 232
Book Description
This book is for those who have some knowledge of optics, but little or no previous experience in interferometry. Accordingly, the carefully designed presentation helps readers easily find and assimilate the interferometric techniques they need for precision measurements. Mathematics is held to a minimum, and the topics covered are also summarized in capsule overviews at the beginning and end of each chapter. Each chapter also contains a set of worked problems that give a feel for numbers.The first five chapters present a clear tutorial review of fundamentals. Chapters six and seven discuss the types of lasers and photodetectors used in interferometry. The next eight chapters describe key applications of interferometry: measurements of length, optical testing, studies of refractive index fields, interference microscopy, holographic and speckle interferometry, interferometric sensors, interference spectroscopy, and Fourier-transform spectroscopy. The final chapter offers suggestions on choosing and setting up an interferometer.
Publisher: Academic Press
ISBN: 0080918611
Category : Technology & Engineering
Languages : en
Pages : 232
Book Description
This book is for those who have some knowledge of optics, but little or no previous experience in interferometry. Accordingly, the carefully designed presentation helps readers easily find and assimilate the interferometric techniques they need for precision measurements. Mathematics is held to a minimum, and the topics covered are also summarized in capsule overviews at the beginning and end of each chapter. Each chapter also contains a set of worked problems that give a feel for numbers.The first five chapters present a clear tutorial review of fundamentals. Chapters six and seven discuss the types of lasers and photodetectors used in interferometry. The next eight chapters describe key applications of interferometry: measurements of length, optical testing, studies of refractive index fields, interference microscopy, holographic and speckle interferometry, interferometric sensors, interference spectroscopy, and Fourier-transform spectroscopy. The final chapter offers suggestions on choosing and setting up an interferometer.
Full-Field Measurements and Identification in Solid Mechanics
Author: Michel Grediac
Publisher: John Wiley & Sons
ISBN: 1118578473
Category : Science
Languages : en
Pages : 376
Book Description
This timely book presents cutting-edge developments by experts in the field on the rapidly developing and scientifically challenging area of full-field measurement techniques used in solid mechanics – including photoelasticity, grid methods, deflectometry, holography, speckle interferometry and digital image correlation. The evaluation of strains and the use of the measurements in subsequent parameter identification techniques to determine material properties are also presented. Since parametric identification techniques require a close coupling of theoretical models and experimental measurements, the book focuses on specific modeling approaches that include finite element model updating, the equilibrium gap method, constitutive equation gap method, virtual field method and reciprocity gap method. In the latter part of the book, the authors discuss two particular applications of selected methods that are of special interest to many investigators: the analysis of localized phenomenon and connections between microstructure and constitutive laws. The final chapter highlights infrared measurements and their use in the mechanics of materials. Written and edited by knowledgeable scientists, experts in their fields, this book will be a valuable resource for all students, faculties and scientists seeking to expand their understanding of an important, growing research area
Publisher: John Wiley & Sons
ISBN: 1118578473
Category : Science
Languages : en
Pages : 376
Book Description
This timely book presents cutting-edge developments by experts in the field on the rapidly developing and scientifically challenging area of full-field measurement techniques used in solid mechanics – including photoelasticity, grid methods, deflectometry, holography, speckle interferometry and digital image correlation. The evaluation of strains and the use of the measurements in subsequent parameter identification techniques to determine material properties are also presented. Since parametric identification techniques require a close coupling of theoretical models and experimental measurements, the book focuses on specific modeling approaches that include finite element model updating, the equilibrium gap method, constitutive equation gap method, virtual field method and reciprocity gap method. In the latter part of the book, the authors discuss two particular applications of selected methods that are of special interest to many investigators: the analysis of localized phenomenon and connections between microstructure and constitutive laws. The final chapter highlights infrared measurements and their use in the mechanics of materials. Written and edited by knowledgeable scientists, experts in their fields, this book will be a valuable resource for all students, faculties and scientists seeking to expand their understanding of an important, growing research area