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Author: Raphael Baillot Publisher: Elsevier ISBN: 0081010923 Category : Technology & Engineering Languages : en Pages : 224
Book Description
Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications. Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models. The proposed technology and methodologies will help those interested in the topic to further their knowledge of failure mechanisms, exploring the physical and chemical analyses involved. - Based on the work of two main Phd results in 2011 and 2014 - Describes GaN technology in the state-of-the-art, focusing on the specific electrical and spectral model - Proposes the technology and methodologies to understand failure mechanisms
Author: Raphael Baillot Publisher: Elsevier ISBN: 0081010923 Category : Technology & Engineering Languages : en Pages : 224
Book Description
Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications. Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models. The proposed technology and methodologies will help those interested in the topic to further their knowledge of failure mechanisms, exploring the physical and chemical analyses involved. - Based on the work of two main Phd results in 2011 and 2014 - Describes GaN technology in the state-of-the-art, focusing on the specific electrical and spectral model - Proposes the technology and methodologies to understand failure mechanisms
Author: Titu I. Băjenescu Publisher: Artech House ISBN: 1596934360 Category : Technology & Engineering Languages : en Pages : 706
Book Description
The main reason for the premature breakdown of today's electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. Today professionals are looking for effective ways to minimize the degradation of electronic components to help ensure longer-lasting, more technically sound products and systems. This practical book offers engineers specific guidance on how to design more reliable components and build more reliable electronic systems. Professionals learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for the intended applications. Moreover, the book helps system designers ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure.
Author: A. Christou Publisher: Springer Science & Business Media ISBN: 9400924828 Category : Technology & Engineering Languages : en Pages : 571
Book Description
This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.
Author: Marshall L. Michel, III Publisher: US Naval Institute Press ISBN: 9781591145196 Category : History Languages : en Pages : 0
Book Description
This classic work-part of the Marine Corps reading list-makes full use of declassified U.S. documents to offer the first comprehensive study of fighter combat over North Vietnam. Marshall Michel's balanced, exhaustive coverage describes and analyzes both Air Force and Navy engagements with North Vietnamese MiGs but also includes discussions of the SAM threat and U.S. countermeasures, laser-guided bombs, and U.S. attempts to counter the MiG threat with a variety of technological equipment. Accessible yet professional, the book is filled with valuable lessons learned that are as valid today as they were in the 1960s and 1970s. Some 29 photos and 33 drawings and maps, including diagrams of both American and North Vietnamese formations and tactics, are included.
Author: Joachim Piprek Publisher: Elsevier ISBN: 0080469787 Category : Technology & Engineering Languages : en Pages : 296
Book Description
Optoelectronics has become an important part of our lives. Wherever light is used to transmit information, tiny semiconductor devices are needed to transfer electrical current into optical signals and vice versa. Examples include light emitting diodes in radios and other appliances, photodetectors in elevator doors and digital cameras, and laser diodes that transmit phone calls through glass fibers. Such optoelectronic devices take advantage of sophisticated interactions between electrons and light. Nanometer scale semiconductor structures are often at the heart of modern optoelectronic devices. Their shrinking size and increasing complexity make computer simulation an important tool to design better devices that meet ever rising perfomance requirements. The current need to apply advanced design software in optoelectronics follows the trend observed in the 1980's with simulation software for silicon devices. Today, software for technology computer-aided design (TCAD) and electronic design automation (EDA) represents a fundamental part of the silicon industry. In optoelectronics, advanced commercial device software has emerged recently and it is expected to play an increasingly important role in the near future. This book will enable students, device engineers, and researchers to more effectively use advanced design software in optoelectronics. - Provides fundamental knowledge in semiconductor physics and in electromagnetics, while helping to understand and use advanced device simulation software - Demonstrates the combination of measurements and simulations in order to obtain realistic results and provides data on all required material parameters - Gives deep insight into the physics of state-of-the-art devices and helps to design and analyze of modern optoelectronic devices
Author: G. Pluvinage Publisher: Springer Science & Business Media ISBN: 9401008809 Category : Science Languages : en Pages : 361
Book Description
As Directors of this NATO Workshop, we welcome this opportunity to record formally our thanks to the NATO Scientific Affairs Division for making our meeting possible through generous financial support and encouragement. This meeting has two purposes: the first obvious one because we have collected scientists from East, far East and west to discuss new development in the field of fracture mechanics: the notch fracture mechanics. The second is less obvious but perhaps in longer term more important that is the building of bridges between scientists in the frame of a network called Without Walls Institute on Notch Effects in Fatigue and Fracture". Physical perception of notch effects is not so easy to understand as the presence of a geometrical discontinuity as a worst effect than the simple reduction of cross section. Notch effects in fatigue and fracture is characterised by the following fundamental fact: it is not the maximum local stress or stress which governs the phenomena of fatigue and fracture. The physic shows that a process volume is needed probably to store the necessary energy for starting and propagating the phenomenon. This is a rupture of the traditional "strength of material" school which always give the prior importance of the local maximum stress. This concept of process volume was strongly affirmed during this workshop.
Author: David J. Smith Publisher: Elsevier ISBN: 0080967825 Category : Technology & Engineering Languages : en Pages : 289
Book Description
Safety Critical Systems Handbook: A Straightfoward Guide to Functional Safety, IEC 61508 (2010 Edition) and Related Standards, Including Process IEC 61511 and Machinery IEC 62061 AND ISO 13849, Third Edition, offers a practical guide to the functional safety standard IEC 61508. The book is organized into three parts. Part A discusses the concept of functional safety and the need to express targets by means of safety integrity levels. It places functional safety in context, along with risk assessment, likelihood of fatality, and the cost of conformance. It also explains the life-cycle approach, together with the basic outline of IEC 61508 (known as BS EN 61508 in the UK). Part B discusses functional safety standards for the process, oil, and gas industries; the machinery sector; and other industries such as rail, automotive, avionics, and medical electrical equipment. Part C presents case studies in the form of exercises and examples. These studies cover SIL targeting for a pressure let-down system, burner control system assessment, SIL targeting, a hypothetical proposal for a rail-train braking system, and hydroelectric dam and tidal gates. - The only comprehensive guide to IEC 61508, updated to cover the 2010 amendments, that will ensure engineers are compliant with the latest process safety systems design and operation standards - Helps readers understand the process required to apply safety critical systems standards - Real-world approach helps users to interpret the standard, with case studies and best practice design examples throughout
Author: Xingsheng Liu Publisher: Springer ISBN: 1461492637 Category : Technology & Engineering Languages : en Pages : 415
Book Description
This book introduces high power semiconductor laser packaging design. The challenges of the design and various packaging and testing techniques are detailed by the authors. New technologies and current applications are described in detail.
Author: Abdulkerim Gok Publisher: BoD – Books on Demand ISBN: 1789848229 Category : Technology & Engineering Languages : en Pages : 171
Book Description
Photovoltaic (PV) solar energy is expected to be the world's largest source of electricity in the future. To enhance the long-term reliability of PV modules, a thorough understanding of failure mechanisms is of vital importance. In addition, it is important to address the potential downsides to this technology. These include the hazardous chemicals needed for manufacturing solar cells, especially for thin-film technologies, and the large number of PV modules disposed of at the end of their lifecycles. This book discusses the reliability and environmental aspects of PV modules.
Author: Raphael Baillot
Author: Raphael Baillot
Author: Titu I. Băjenescu
Author: A. G. Cannon
Author: A. Christou
Author: Marshall L. Michel, III
Author: Joachim Piprek
Author: G. Pluvinage
Author: David J. Smith
Author: Xingsheng Liu
Author: Abdulkerim Gok