Fault-Tolerance Techniques for SRAM-Based FPGAs PDF Download

Author: Fernanda Lima Kastensmidt
Publisher: Springer Science & Business Media
ISBN: 038731069X
Category : Technology & Engineering
Languages : en
Pages : 193

View

Book Description
This book reviews fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs), outlining many methods for designing fault tolerance systems. Some of these are based on new fault-tolerant architecture, and others on protecting the high-level hardware description before synthesis in the FPGA. The text helps the reader choose the best techniques project-by-project, and to compare fault tolerant techniques for programmable logic applications.

Author: Paul Leroux
Publisher: MDPI
ISBN: 3039212796
Category : Technology & Engineering
Languages : en
Pages : 210

View

Book Description
Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.

Author: Fernanda Kastensmidt
Publisher: Springer
ISBN: 3319143522
Category : Technology & Engineering
Languages : en
Pages : 319

View

Book Description
This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

Author: Mengfei Yang
Publisher: John Wiley & Sons
ISBN: 1119107407
Category : Computers
Languages : en
Pages : 374

View

Book Description
Comprehensive coverage of all aspects of space application oriented fault tolerance techniques • Experienced expert author working on fault tolerance for Chinese space program for almost three decades • Initiatively provides a systematic texts for the cutting-edge fault tolerance techniques in spacecraft control computer, with emphasis on practical engineering knowledge • Presents fundamental and advanced theories and technologies in a logical and easy-to-understand manner • Beneficial to readers inside and outside the area of space applications

Author: Luca Sterpone
Publisher: Springer Science & Business Media
ISBN: 1402089791
Category : Technology & Engineering
Languages : en
Pages : 153

View

Book Description
What is exactly “Safety”? A safety system should be defined as a system that will not endanger human life or the environment. A safety-critical system requires utmost care in their specification and design in order to avoid possible errors in their implementation that should result in unexpected system’s behavior during his operating “life”. An inappropriate method could lead to loss of life, and will almost certainly result in financial penalties in the long run, whether because of loss of business or because the imposition of fines. Risks of this kind are usually managed with the methods and tools of the “safety engineering”. A life-critical system is designed to 9 lose less than one life per billion (10 ). Nowadays, computers are used at least an order of magnitude more in safety-critical applications compared to two decades ago. Increasingly electronic devices are being used in applications where their correct operation is vital to ensure the safety of the human life and the environment. These application ranging from the anti-lock braking systems (ABS) in automobiles, to the fly-by-wire aircrafts, to biomedical supports to the human care. Therefore, it is vital that electronic designers be aware of the safety implications of the systems they develop. State of the art electronic systems are increasingly adopting progr- mable devices for electronic applications on earthling system. In particular, the Field Programmable Gate Array (FPGA) devices are becoming very interesting due to their characteristics in terms of performance, dimensions and cost.

Author: Francesca Palumbo
Publisher: Springer Nature
ISBN: 3031429214
Category : Computers
Languages : en
Pages : 380

View

Book Description
This book constitutes the proceedings of the 19th International Symposium on Applied Reconfigurable Computing, ARC 2023, which was held in Cottbus, Germany, in September 2023. The 18 full papers presented in this volume were reviewed and selected from numerous submissions. The proceedings also contain 4 short PhD papers. The contributions were organized in topical sections as follows: Design methods and tools; applications; architectures; special session: near and in-memory computing; and PhD forum papers.

Author: Mahtab Niknahad
Publisher: KIT Scientific Publishing
ISBN: 3731500388
Category : Technology & Engineering
Languages : en
Pages : 164

View

Book Description
Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.

Author: Youngsoo Shin
Publisher: Springer
ISBN: 3319460978
Category : Computers
Languages : en
Pages : 236

View

Book Description
This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.

Author: Niccolò Battezzati
Publisher: Springer Science & Business Media
ISBN: 1441975950
Category : Technology & Engineering
Languages : en
Pages : 221

View

Book Description
Embedded systems applications that are either mission or safety-critical usually entail low- to mid- production volumes, require the rapid development of specific tasks, which are typically computing intensive, and are cost bounded. The adoption of re-configurable FPGAs in such application domains is constrained to the availability of suitable techniques to guarantee the dependability requirements entailed by critical applications. This book describes the challenges faced by designers when implementing a mission- or safety-critical application using re-configurable FPGAs and it details various techniques to overcome these challenges. In addition to an overview of the key concepts of re-configurable FPGAs, it provides a theoretical description of the failure modes that can cause incorrect operation of re-configurable FPGA-based electronic systems. It also outlines analysis techniques that can be used to forecast such failures and covers the theory behind solutions to mitigate fault effects. This book also reviews current technologies available for building re-configurable FPGAs, specifically SRAM-based technology and Flash-based technology. For each technology introduced, theoretical concepts presented are applied to real cases. Design techniques and tools are presented to develop critical applications using commercial, off-the-shelf devices, such as Xilinx Virtex FPGAs, and Actel ProASIC FPGAs. Alternative techniques based on radiation hardened FPGAs, such as Xilinx SIRF and Atmel ATF280 are also presented. This publication is an invaluable reference for anyone interested in understanding the technologies of re-configurable FPGAs, as well as designers developing critical applications based on these technologies.

Author: Krzysztof Iniewski
Publisher: CRC Press
ISBN: 1439826951
Category : Technology & Engineering
Languages : en
Pages : 432

View

Book Description
Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.