Fabrication, Testing, and Reliability of Semiconductor Lasers II PDF Download

Author: Mahmoud Fallahi
Publisher: Society of Photo Optical
ISBN: 9780819424150
Category : Technology & Engineering
Languages : en
Pages : 176

View

Book Description

Author: Mahmoud Fallahi
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819420572
Category : Semiconductor lasers
Languages : en
Pages : 162

View

Book Description

Author:
Publisher:
ISBN:
Category : Semiconductor lasers
Languages : en
Pages : 190

View

Book Description

Author: Society of Photo-optical Instrumentation Engineers
Publisher:
ISBN:
Category :
Languages : en
Pages : 162

View

Book Description

Author: Mahmoud Fallahi
Publisher: Society of Photo Optical
ISBN: 9780819427243
Category : Technology & Engineering
Languages : en
Pages : 232

View

Book Description

Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :

View

Book Description

Author: Edward B. Stokes
Publisher: The Electrochemical Society
ISBN: 9781566773492
Category : Technology & Engineering
Languages : en
Pages : 292

View

Book Description

Author: Charles Blain
Publisher: Nova Publishers
ISBN: 9781590332252
Category : Technology & Engineering
Languages : en
Pages : 214

View

Book Description
Developments in lasers continue to enable progress in many areas such as eye surgery, the recording industry and dozens of others. This book presents citations from the book literature for the last 25 years and groups them for ease of access which is also provided by subject, author and titles indexes.

Author: Robert Herrick
Publisher: Elsevier
ISBN: 0128192542
Category : Technology & Engineering
Languages : en
Pages : 334

View

Book Description
Front Cover -- Reliability of Semiconductor Lasers and Optoelectronic Devices -- Copyright Page -- Dedication -- Contents -- List of contributors -- Preface -- Acknowledgments -- 1 Introduction to optoelectronic devices -- 1.1 Introduction -- 1.2 Optoelectronic applications -- 1.2.1 InGaN-based light-emitting diodes for high-efficiency lighting -- 1.2.2 Lasers for sensing arrays -- 1.2.3 Lasers for data- and telecommunications -- 1.2.4 The history of the laser -- 1.3 Principles of operation for optoelectronic components -- 1.3.1 Light emission -- 1.3.1.1 Light emission in gas plasmas: a review -- 1.3.1.2 Stimulated emission in gas lasers -- 1.3.1.3 Spontaneous and stimulated emission from semiconductors -- 1.3.2 Light-emitting diodes -- 1.3.2.1 Carrier confinement -- 1.3.2.2 Light extraction -- 1.3.2.3 Heat extraction -- 1.3.2.4 "Rollover" or "droop" -- 1.3.2.5 "The green gap" -- 1.3.3 Lasers -- 1.3.3.1 What additional design features exist with lasers that are not present with an light-emitting diode? -- Adding a "population inversion" -- Adding waveguiding -- Adding mirrors -- 1.3.3.2 Vertical-cavity surface-emitting lasers -- 1.3.3.3 Direct modulation -- 1.3.4 Modulators -- 1.3.5 Photodetectors -- 1.3.5.1 Photodiodes -- 1.3.5.2 Avalanche photodiodes -- 1.4 Method of fabrication -- 1.4.1 Epitaxial growth -- 1.4.2 Wafer fabrication -- 1.4.3 Wafer test -- 1.4.4 Singulation and packaging -- 1.4.5 Burn-in -- 1.5 Critical metrics -- 1.5.1 Beam divergence -- 1.5.2 Single mode versus multimode -- 1.5.3 Coherence length -- 1.5.4 Power -- 1.5.5 Modulation rate -- 1.6 Laser and light-emitting diode reliability -- 1.6.1 Reliability qualification -- 1.6.2 Quality control -- 1.7 New technology developments -- 1.7.1 Fiber optics -- 1.7.2 The future of optoelectronic devices -- 1.7.2.1 Photonic integrated circuits -- 1.7.2.2 LiDAR.

Author: Massimo Vanzi
Publisher: Elsevier
ISBN: 0081010893
Category : Technology & Engineering
Languages : en
Pages : 270

View

Book Description
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda Present the extension to new failure mechanisms, new technologies, new application fields, new environments Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities