Fabrication and characterization of silicon position sensitive particle detectors PDF Download

Author: Kari Leinonen
Publisher:
ISBN: 9789522141415
Category :
Languages : en
Pages : 92

View

Book Description

Author: David Aaron Routenberg
Publisher:
ISBN:
Category :
Languages : en
Pages : 294

View

Book Description

Author: Alan Owens
Publisher: CRC Press
ISBN: 1439873127
Category : Science
Languages : en
Pages : 583

View

Book Description
Although elemental semiconductors such as silicon and germanium are standard for energy dispersive spectroscopy in the laboratory, their use for an increasing range of applications is becoming marginalized by their physical limitations, namely the need for ancillary cooling, their modest stopping powers, and radiation intolerance. Compound semiconductors, on the other hand, encompass such a wide range of physical and electronic properties that they have become viable competitors in a number of applications. Compound Semiconductor Radiation Detectors is a consolidated source of information on all aspects of the use of compound semiconductors for radiation detection and measurement. Serious Competitors to Germanium and Silicon Radiation Detectors Wide-gap compound semiconductors offer the ability to operate in a range of hostile thermal and radiation environments while still maintaining sub-keV spectral resolution at X-ray wavelengths. Narrow-gap materials offer the potential of exceeding the spectral resolution of germanium by a factor of three. However, while compound semiconductors are routinely used at infrared and optical wavelengths, their development in other wavebands has been plagued by material and fabrication problems. So far, only a few have evolved sufficiently to produce commercial detection systems. From Crystal Growth to Spectroscopic Performance Bringing together information scattered across many disciplines, this book summarizes the current status of research in compound semiconductor radiation detectors. It examines the properties, growth, and characterization of compound semiconductors as well as the fabrication of radiation sensors, with particular emphasis on the X- and gamma-ray regimes. It explores the limitations of compound semiconductors and discusses current efforts to improve spectral performances, pointing to where future discoveries may lie. A timely resource for the established researcher, this book serves as a comprehensive and illustrated reference on material science, crystal growth, metrology, detector physics, and spectroscopy. It can also be used as a textbook for those new to the field of compound semiconductors and their application to radiation detection and measurement.

Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 23

View

Book Description
Structure of silicon carbide wafers have been evaluated by x-ray topography, high resolution x-ray diffraction, etching, Atomic Force Microscopy, and related techniques. The low angle grain boundaries were imaged by White Beam Synchrotron X-Ray Topography and mis-orientations quantitatively mapped out by x-ray diffraction. The dominant component of mis-orientation was basal plane tilt. The formation mechanism is most likely due to buckling of the rigidly mounted SiC seed during initial stages of growth. The morphology of hexagonal voids was studied by optical microscopy and AFM. Voids originate at the seed crystal/crucible lid interface and move through the boule during growth. Interaction of void and grown in dislocations leads to formation of dislocation arrays and open core screw dislocations underneath the void. It appears to be the dominant formation mechanism of micropipes.

Author: Poornika Gayathri Fernandes
Publisher:
ISBN:
Category : Field-effect transistors
Languages : en
Pages : 352

View

Book Description
This work focuses on a variety of issues that impact the electrical properties of Silicon-on-insulator FET-based sensor devices. Biological solutions consist of protein or DNA in an electrolytic solution containing salt ions. Some of these ions, such as Na, have long been known to cause instabilities in MOS devices. The effect of mobile ions on SOI-based sensors is studied. Na is shown to cause permanent hysteresis in the devices while K is not. Devices with the gate oxide protected by self-assembled monolayers (SAMs) do not show hysteresis.

Author:
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 782

View

Book Description

Author: Aaron M. Brock
Publisher:
ISBN:
Category : Electrons
Languages : en
Pages : 168

View

Book Description

Author: Glyn Love
Publisher: Springer Science & Business Media
ISBN: 3709175062
Category : Technology & Engineering
Languages : en
Pages : 376

View

Book Description
This supplement of Mikrochimica Acta contains selected papers from the Fifth Workshop of the European Microbeam Analysis Society (EMAS) on "Modern Developments and Applications in Microbeam Analysis" which th th took place from the 11 to 15 May 1997 in Torquay (UK). EMAS was founded in 1986 by scientists from many European countries in order to stimulate research in microbe am analysis and into its development and application. The society now has over 350 members from more than 20 countries. An important EMAS activity is the organisation of biennial workshops which focus upon the current status and developing trends in microanalytical techniques. For this meeting EMAS chose to invite speakers on the following subjects: Standardless analysis, EPMA techniques for quantitative near-surface analysis and depth profiling, Matrix corrections in Auger electron and X-ray photon spectroscopy, X-ray analysis and imaging using low voltage beams, Scanning probe and near field microscopies, EPMA of frozen biological bulk samples, Environmen tal SEM and X-ray microanalysis of biological materials, Quantitative elemental mapping of X-ray radiographs by factorial correspondence, X-ray spectrum processing and multivariate analysis, Thin film analysis and chemical mapping in the analytical electron microscope, Wavelength dispersive X-ray spectroscopy, High resolution non dispersive X-ray spectroscopy with state-of-the-art silicon detectors and Recent developments in instrumentation for X-ray analysis. These invited lectures were given by eminent scientists from Europe, the USA, and Australia In addition to the introductory lectures there were poster sessions at which some 110 posters were on display.

Author: Claes Mattsson
Publisher:
ISBN: 9789185317721
Category :
Languages : en
Pages : 71

View

Book Description

Author: Christian W. Fabjan
Publisher: Springer Nature
ISBN: 3030353184
Category : Elementary particles (Physics).
Languages : en
Pages : 1083

View

Book Description
This second open access volume of the handbook series deals with detectors, large experimental facilities and data handling, both for accelerator and non-accelerator based experiments. It also covers applications in medicine and life sciences. A joint CERN-Springer initiative, the "Particle Physics Reference Library" provides revised and updated contributions based on previously published material in the well-known Landolt-Boernstein series on particle physics, accelerators and detectors (volumes 21A, B1,B2,C), which took stock of the field approximately one decade ago. Central to this new initiative is publication under full open access