Author: Kwok Wai LamPublisher:
ISBN:
Category :
Languages : en
Pages : 204
Book Description
Experimentation with Infra-red Laser Tomography with a Small Number of Line-of-sight Measurements on a Non-uniform Spatial Density Distribution
Author: Kwok Wai LamSpectroscopy and Optical Diagnostics for Gases
Author: Ronald K. HansonPublisher: Springer
ISBN: 3319232525
Category : Technology & Engineering
Languages : en
Pages : 290
Book Description
This text provides an introduction to the science that governs the interaction of light and matter (in the gas phase). It provides readers with the basic knowledge to exploit the light-matter interaction to develop quantitative tools for gas analysis (i.e. optical diagnostics) and understand and interpret the results of spectroscopic measurements. The authors pair the basics of gas‐phase spectroscopy with coverage of key optical diagnostic techniques utilized by practicing engineers and scientists to measure fundamental flow‐field properties. The text is organized to cover three sub‐topics of gas‐phase spectroscopy: (1) spectral line positions, (2) spectral line strengths, and (3) spectral lineshapes by way of absorption, emission, and scattering interactions. The latter part of the book describes optical measurement techniques and equipment. Key subspecialties include laser induced fluorescence, tunable laser absorption spectroscopy, and wavelength modulation spectroscopy. It is ideal for students and practitioners across a range of applied sciences including mechanical, aerospace, chemical, and materials engineering.
International Aerospace Abstracts
Author: In Vivo Optical Imaging of Brain Function, Second Edition
Author: Ron D. FrostigPublisher: CRC Press
ISBN: 9781420076844
Category : Science
Languages : en
Pages : 0
Book Description
These are exciting times for the field of optical imaging of brain function. Rapid developments in theory and technology continue to considerably advance understanding of brain function. Reflecting changes in the field during the past five years, the second edition of In Vivo Optical Imaging of Brain Function describes state-of-the-art techniques and their applications for the growing field of functional imaging in the live brain using optical imaging techniques. New in the Second Edition: Voltage-sensitive dyes imaging in awake behaving animals Imaging based on genetically encoded probes Imaging of mitochondrial auto-fluorescence as a tool for cortical mapping Using pH-sensitive dyes for functional mapping Modulated imaging Calcium imaging of neuronal activity using 2-photon microscopy Fourier approach to optical imaging Fully updated chapters from the first edition Leading Authorities Explore the Latest Techniques Updated to reflect continuous development in this emerging research area, this new edition, as with the original, reaches across disciplines to review a variety of non-invasive optical techniques used to study activity in the living brain. Leading authorities from such diverse areas as biophysics, neuroscience, and cognitive science present a host of perspectives that range from a single neuron to large assemblies of millions of neurons, captured at various temporal and spatial resolutions. Introducing techniques that were not available just a few years ago, the authors describe the theory, setup, analytical methods, and examples that highlight the advantages of each particular method.
Cavity Ring-Down Spectroscopy
Author: Giel BerdenPublisher: John Wiley & Sons
ISBN: 9781444308242
Category : Science
Languages : en
Pages : 344
Book Description
Cavity Ring-Down Spectroscopy: Techniques and Applications provides a practical overview of this valuable analytical tool, explaining the fundamental concepts and experimental methods, and illustrating important applications. Designed as both an introductory text and a reference source, this book is relevant for scientists unfamiliar with CRDS who are interested in using the technique in their research, as well as experienced users.
Radiative Processes in Astrophysics
Author: George B. RybickiPublisher: John Wiley & Sons
ISBN: 352761818X
Category : Science
Languages : en
Pages : 402
Book Description
Radiative Processes in Astrophysics: This clear, straightforward, and fundamental introduction is designed to present-from a physicist's point of view-radiation processes and their applications to astrophysical phenomena and space science. It covers such topics as radiative transfer theory, relativistic covariance and kinematics, bremsstrahlung radiation, synchrotron radiation, Compton scattering, some plasma effects, and radiative transitions in atoms. Discussion begins with first principles, physically motivating and deriving all results rather than merely presenting finished formulae. However, a reasonably good physics background (introductory quantum mechanics, intermediate electromagnetic theory, special relativity, and some statistical mechanics) is required. Much of this prerequisite material is provided by brief reviews, making the book a self-contained reference for workers in the field as well as the ideal text for senior or first-year graduate students of astronomy, astrophysics, and related physics courses. Radiative Processes in Astrophysics also contains about 75 problems, with solutions, illustrating applications of the material and methods for calculating results. This important and integral section emphasizes physical intuition by presenting important results that are used throughout the main text; it is here that most of the practical astrophysical applications become apparent.
Index to Theses with Abstracts Accepted for Higher Degrees by the Universities of Great Britain and Ireland and the Council for National Academic Awards
Author: Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 608
Book Description
Theses on any subject submitted by the academic libraries in the UK and Ireland.
Progress in Brain Research
Author: J. P. SchadéPublisher:
ISBN: 9780444409522
Category : Brain
Languages : en
Pages : 438
Book Description
Semiconductor Material and Device Characterization
Author: Dieter K. SchroderPublisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Author: