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Author: Brent Fultz Publisher: Springer Science & Business Media ISBN: 3662049015 Category : Technology & Engineering Languages : en Pages : 763
Book Description
This practical and theoretical text/reference develops the concepts of transmission electron microscopy and x-ray diffractometry. This acclaimed new edition contains many improved explanations and new material on high-resolution microscopy.
Author: Brent Fultz Publisher: Springer Science & Business Media ISBN: 3662049015 Category : Technology & Engineering Languages : en Pages : 763
Book Description
This practical and theoretical text/reference develops the concepts of transmission electron microscopy and x-ray diffractometry. This acclaimed new edition contains many improved explanations and new material on high-resolution microscopy.
Author: P.E. Champness Publisher: Garland Science ISBN: 1000102335 Category : Science Languages : en Pages : 185
Book Description
This book is a practical guide to electron diffraction in the transmission electron microscope (TEM). Case studies and examples are used to provide an invaluable introduction to the subject for those new to the technique. The book explains the basic methods used to obtain diffraction patterns with the TEM. The numerous illustrations aid the understanding of the conclusions reached.
Author: Peter. B Hirsch Publisher: CRC Press ISBN: 9780750305389 Category : Science Languages : en Pages : 240
Book Description
Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work. The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.
Author: Pam Champness Publisher: ISBN: 9780387916088 Category : Languages : en Pages : 160
Book Description
This introductory level book on electron diffraction provides useful case studies and examples to guide new users. It explains basic methods on how to obtain images and patterns with the transmission electron microscope and how to interpret them. Its user-friendly approach, with simple explanations and informative illustrations, is perfect reading for students or researchers wanting to perform electron diffraction in the microscope.
Author: François Brisset Publisher: EDP Sciences ISBN: 2759803481 Category : Science Languages : fr Pages : 930
Book Description
Aussi bien essentielle dans les milieux académiques qu'industriels, la microscopie électronique à balayage et les microanalyses associéessont au coeur de la recherche scientifique et industrielle. L'ensemble des bases théoriques, les principales caractéristiques techniques, ainsi que des compléments pratiques d'utilisation et d'entretien liés à ces disciplines sont développés dans cet ouvrage. Les microscopes électroniques sous haut vide ou vide contrôlé sont exposées profondément, les microanalyses EDS et WDS de dernières générations également. À coté de ces piliers structurants, d'autres techniques d'analyse ou d'observation sont abordées, telles l'analyse EBSD et l'imagerie 3D, le FIB, les simulations de Monte-Carlo et les essais in-situ, etc. Ce volume en langue française est le seul traitant du sujet de façon aussi exhaustive ; il représente la version actualisée et totalement refondue d'une précédente édition de 1979 aujourd'hui épuisée ; il regroupe enfin les cours dispensés lors de l'école d'été de Saint Martin d'Hères en 2006, organisée par le Groupement National de Microscopie Électronique à Balayage et de microAnalyses (GN-MEBA). Ce livre est particulièrement recommandé aux expérimentateurs mais intéressera aussi les spécialistes en science des matériaux (durs ou mous, conducteurs ou non-conducteurs, stratifiés, etc.) désireux de s'investir dans toutes ces techniques d'imagerie et d'analyse, afin d'en exploiter pleinement les forts potentiels. Il a été écrit par les enseignants de l'école d'été, tous chercheurs ou ingénieurs et spécialistes dans leur domaine. Cet ouvrage s'inscrit dans une collection de publications du GN-MEBA consacrée aux principes, aux techniques expérimentales et aux méthodes de calcul et de simulation en Microscopie Électronique à Balayage et en microanalyses.
Author: Brent Fultz
Author: Brent Fultz
Author: P.E. Champness
Author: Severin Amelinckx
Author: Peter. B Hirsch
Author: Centre national de la recherche scientifique
Author: L. G. Bostwick
Author: Pam Champness
Author: François Brisset
Author: William Krakow
Author: Jean-Pierre Eberhart