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Author: René Guinebretière Publisher: John Wiley & Sons ISBN: 1118613953 Category : Technology & Engineering Languages : en Pages : 290
Book Description
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
Author: René Guinebretière Publisher: John Wiley & Sons ISBN: 1118613953 Category : Technology & Engineering Languages : en Pages : 290
Book Description
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
Author: Vincent Jacques Publisher: ISBN: Category : Languages : fr Pages : 198
Book Description
Le travail présenté dans ce manuscrit à pour fil conducteur l’utilisation de la diffraction cohérente des rayons X pour mettre en lumière différents phénomènes physiques. La détection de défauts topologiques, auxquels les faisceaux cohérents sont très sensibles, permet de tirer des conclusions sur l’ordre ou le désordre trouvés dans les systèmes étudiés. La notion de cohérence des rayons X est tout d’abord exposée, puis la caractérisation de profils de diffraction cohérente en présence de défauts topologiques est présentée à travers une étude des boucles de dislocation dans le silicium. Cette technique a ensuite été appliquée à l’étude de composés présentant des ordres électroniques incommensurables, tels que les Ondes de Densité de Charge (ODC) et les Ondes de Densité de Spin (ODS). Plusieurs systèmes ont été étudiés : le chrome pur monocristallin, le bronze bleu K0.3 MoO3 et NbSe3. Dans le cas du chrome, les résultats obtenus posent la question du lien réel existant entre ODC et ODS. Par ailleurs, une dislocation magnétique isolée en volume a été détectée et a permis de soulever la question des constantes de force de l’ODS du spin. Le bronze bleu et NbSe3 ont été étudiés sous champ électrique. Un ordre à très grande distance a été observé dans les ODC du bronze bleu et de NbSe3, dans le régime de glissement. Nous proposons une description en termes de phase, à l’aide d’un modèle de type réseau de solitons.
Author: Vitalij Pecharsky Publisher: Springer Science & Business Media ISBN: 0387095799 Category : Science Languages : en Pages : 751
Book Description
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .
Book Description
Cet ouvrage est composé de quatre chapitres. Dans le premier chapitre sont traitées les notions de base du réseau direct, introduites au niveau du premier cycle universitaire. Le concept de réseau réciproque est développé dans une deuxième partie de façon à introduire la résolution de problèmes de diffraction des rayons X. Le chapitre 2 est totalement consacré à la caractérisation des poudres par la diffraction des rayons X. Le chapitre 3 aborde la cristallochimie des dérivations structurales à partir des structures usuelles. Les notions plus délicates de transitions ordre/désordre et des défauts de structures sont introduites dans le cas de la wustite, zircone, oxyde de titane etc. Le chapitre 4 est consacré à l'étude des aluminosilicates.
Author: W. I. F. David Publisher: OUP Oxford ISBN: 0191525561 Category : Science Languages : en Pages : 358
Book Description
The art of solving a structure from powder diffraction data has developed rapidly over the last ten years to the point where numerous crystal structures, both organic and inorganic, have been solved directly from powder data. However, it is still an art and, in contrast to its single crystal equivalent, is far from routine. The art lies not only in the correct application of a specific experimental technique or computer program, but also in the selection of the optimal path for the problem at hand. Written and edited by experts active in the field, and covering both the fundamental and applied aspects of structure solution from powder diffraction data, this book guides both novices and experienced practitioners alike through the maze of possibilities.
Author: Vitalij Pecharsky Publisher: Springer Science & Business Media ISBN: 9781402073656 Category : Technology & Engineering Languages : en Pages : 752
Book Description
Requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method. Useful for any scientific or engineering background, where precise structural information is required. Comprehensively describes the state-of-the-art in structure determination from powder diffraction data both theoretically and practically using multiple examples of varying complexity. Pays particular attention to the utilization of Internet resources, especially the well-tested and freely available computer codes designed for processing of powder diffraction data.
Author: Georg Will Publisher: Springer Science & Business Media ISBN: 3540279865 Category : Science Languages : en Pages : 232
Book Description
Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.
Author: R E Dinnebier Publisher: Royal Society of Chemistry ISBN: 1782625992 Category : Science Languages : en Pages : 525
Book Description
Powder diffraction is a widely used scientific technique in the characterization of materials with broad application in materials science, chemistry, physics, geology, pharmacology and archaeology. Powder Diffraction: Theory and Practice provides an advanced introductory text about modern methods and applications of powder diffraction in research and industry. The authors begin with a brief overview of the basic theory of diffraction from crystals and powders. Data collection strategies are described including x-ray, neutron and electron diffraction setups using modern day apparatus including synchrotron sources. Data corrections, essential for quantitative analysis are covered before the authors conclude with a discussion of the analysis methods themselves. The information is presented in a way that facilitates understanding the information content of the data, as well as best practices for collecting and analyzing data for quantitative analysis. This long awaited book condenses the knowledge of renowned experts in the field into a single, authoritative, overview of the application of powder diffraction in modern materials research. The book contains essential theory and introductory material for students and researchers wishing to learn how to apply the frontier methods of powder diffraction
Author: René Guinebretière
Author: René Guinebretière
Author: Anne-Marie Levelut
Author: Vincent Jacques
Author: Vitalij Pecharsky
Author: Boumediene Tanouti
Author: W. I. F. David
Author: Vitalij Pecharsky
Author: Georg Will
Author: Norbert Broll
Author: R E Dinnebier