Estimates of Interfacial Properties in Cu/Ni Multilayer Thin Films Using Hardness and Internal Stress Data PDF Download
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Author: John Stuart Carpenter Publisher: ISBN: Category : Languages : en Pages :
Book Description
Abstract: Modeling the defect structure and mechanical properties of metallic multilayer thin films requires estimates of dislocation parameters such as interfacial line energy, interfacial barrier strength, and resistance to confined layer slip (CLS). A method is presented to estimate these parameters using experimental measurements of hardness and internal stress vs. individual layer thickness, h. Cu/Ni multilayers of varying bilayer thickness (20 nm
Author: John Stuart Carpenter Publisher: ISBN: Category : Languages : en Pages :
Book Description
Abstract: Modeling the defect structure and mechanical properties of metallic multilayer thin films requires estimates of dislocation parameters such as interfacial line energy, interfacial barrier strength, and resistance to confined layer slip (CLS). A method is presented to estimate these parameters using experimental measurements of hardness and internal stress vs. individual layer thickness, h. Cu/Ni multilayers of varying bilayer thickness (20 nm
Author: Tai D. Nguyen Publisher: ISBN: Category : Technology & Engineering Languages : en Pages : 520
Book Description
Layered thin film structures often have unusual properties which make them appealing in a wide range of applications. Fabrication of submicron and nanometer multilayers can produce metastable phases that many not be predicted from the bulk equilibrium phase diagrams. Understanding the growth, structure, stability and properties of multilayers, and controlling their microstructure through processing, are important in many applications. This book focuses on the relationship of structure and processing to the properties that are relevant to all researchers in the field of multilayers. Topics include: phase transformation and reaction kinetics; processing and growth; structural characterization; magnetic, electronic and optical properties; mechanical properties; X-ray optics; thin-film interfaces.
Author: John Stuart Carpenter
Author: John Stuart Carpenter
Author: Dillon Dodd Fong
Author: James Anthony Ruud
Author: Tai D. Nguyen
Author: Todd Evan Schlesinger
Author: Yifan Zhu
Author: 
Author: Heather Ludtke Knoedler
Author: M. Doerner
Author: