ESCA and Auger Spectroscopy PDF Download

Author: David M. Hercules
Publisher:
ISBN:
Category : Electron spectroscopy
Languages : en
Pages : 152

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Author: Thomas Carlson
Publisher: Springer Science & Business Media
ISBN: 1475701187
Category : Science
Languages : en
Pages : 427

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Book Description
In 1970 when I first seriously contemplated writing a book on electron spectroscopy, I recognized the impossibility of completely reaching my desired goals. First, the field was expanding (and still is) at such a rate that a definitive statement of the subject is not possible. The act of following the literature comprehensively and summarizing its essential content proved to be a diver gent series. On the other hand, the field has increased to such a size that violent changes in its basic makeup no longer occur with the frequency that was present in its early days. Furthermore, the excitement of electron spectro scopy lies in its many-faceted interrelationships. In the era of specialization, electron spectroscopy is an open-ended subject continually bringing together new aspects of science. I wished to discuss not just one type of electron spectro scopy, but as many as would be possible. The book as it stands concentrates its attention on x-ray photoelectron spectroscopy, but also presents the basis of Auger electron spectroscopy and uv photoelectron spectroscopy, as well as mentioning many of the other branches of the field. A large, many-author volume might be an answer to some of these problems. However, though anyone person possesses only a limited amount of expertise, I have always enjoyed books by a single author since what they lack in detailed knowledge they gain in a unified viewpoint. I hope the final product, though limited in its attainment of these goals, will still be of some merit.

Author: J. N. Black
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 64

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Author: Tery L. Barr
Publisher: CRC Press
ISBN: 1000099385
Category : Science
Languages : en
Pages : 373

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Book Description
Modern ESCA: The Principles and Practice of X-Ray Photoelectron Spectroscopy is a unique text/reference that focuses on the branch of electron spectroscopy generally labeled as either Electron Spectroscopy for Chemical Analysis (ESCA) or X-ray Photoelectron Spectroscopy (XPS). The book emphasizes the use of core level and valence band binding energies, their shifts, and line widths. It describes the background, present status, and possible future uses of a number of recently developed branches of ESCA, including:

Author: C. R. Brundle
Publisher: Mittal Publications
ISBN: 9788170998259
Category : Electron spectroscopy
Languages : en
Pages : 274

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Author: National Aeronautics and Space Adm Nasa
Publisher: Independently Published
ISBN: 9781792191572
Category :
Languages : en
Pages : 26

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The Surface Science Laboratories at the University of Alabama in Huntsville (UAH) are equipped with x-ray photoelectron spectroscopy (XPS or ESCA) and Auger electron spectroscopy (AES) facilities. These techniques provide information from the uppermost atomic layers of a sample, and are thus truly surface sensitive. XPS provides both elemental and chemical state information without restriction on the type of material that can be analyzed. The sample is placed into an ultra high vacuum (UHV) chamber and irradiated with x-rays which cause the ejection of photoelectrons from the sample surface. Since x-rays do not normally cause charging problems or beam damage, XPS is applicable to a wide range of samples including metals, polymers, catalysts, and fibers. AES uses a beam of high energy electrons as a surface probe. Following electronic rearrangements within excited atoms by this probe, Auger electrons characteristic of each element present are emitted from the sample. The main advantage of electron induced AES is that the electron beam can be focused down to a small diameter and localized analysis can be carried out. On the rastering of this beam synchronously with a video display using established scanning electron microscopy techniques, physical images and chemical distribution maps of the surface can be produced. Thus very small features, such as electronic circuit elements or corrosion pits in metals, can be investigated. Facilities are available on both XPS and AES instruments for depth-profiling of materials, using a beam of argon ions to sputter away consecutive layers of material to reveal sub-surface (and even semi-bulk) analyses. Gregory, John C. NASA-CR-196599, NAS 1.26:196599, UAH-5-32465 NASA ORDER H-01099-D...

Author: Eero Sjöström
Publisher: Springer Science & Business Media
ISBN: 9783540631026
Category : Science
Languages : en
Pages : 344

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Book Description
In its broadest sense, and according to the traditional conception, wood chemistry is a comprehensive discipline, ranging from fundamental studies to practical applications. The manifold constituents, located in different morphological regions in the wood, results in an extreme complexity of wood chemistry. Ever more sophisticated endeavors needing fundamental studies and advanced analytical methods are necessary in order to delve deeper into various problems in pulping and papermaking. Gradually, new, improved ana lytical methods, originally developed for research purposes, are currently replacing many of the old "routine" methods in practical applications. Because of the expanse of the subject, an attempt to write a book of this size about analytical methods seems, perhaps, too ambitious. Of course, a whole book series of several volumes would be necessary to cover this topic completely. However, there is undoubtedly a need for a more condensed presentation which does not go into experimental details, but is limited to the basic principles of the analytical methods and illustrates their applica tions. The emphasis is on more advanced and potential methods, and partic ularly on those based on different types of spectroscopy and chromatography.

Author: David Briggs
Publisher: Im Publications
ISBN: 9781901019049
Category : Electron spectroscopy
Languages : en
Pages : 899

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Author: Mauro Sardela
Publisher: Springer
ISBN: 1461492815
Category : Technology & Engineering
Languages : en
Pages : 242

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Book Description
Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.

Author: Patrick Echlin
Publisher: Springer Science & Business Media
ISBN: 1475790279
Category : Medical
Languages : en
Pages : 463

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Book Description
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.