Author: Laura MendicinoPublisher: The Electrochemical Society
ISBN: 9781566773379
Category : Science
Languages : en
Pages : 278
Book Description
Environmental Issues with Materials and Processes for the Electronics and Semiconductor Industries V
Author: Laura MendicinoPublisher: The Electrochemical Society
ISBN: 9781566773379
Category : Science
Languages : en
Pages : 278
Book Description
Environmental Issues with Materials and Processes for the Electronics and Semiconductor Industries
Author: Laura MendicinoPublisher: The Electrochemical Society
ISBN: 9781566773126
Category : Science
Languages : en
Pages : 228
Book Description
Environmental Issues in the Electronics and Semiconductor Industries
Author: Electrochemical Society. Dielectric Science and Technology DivisionPublisher: The Electrochemical Society
ISBN: 9781566772723
Category : Technology & Engineering
Languages : en
Pages : 246
Book Description
Environmental Issues in the Electronics/semiconductor Industries and
Author: Electrochemical Society. Dielectric Science and Technology DivisionPublisher: The Electrochemical Society
ISBN: 9781566771993
Category : Science
Languages : en
Pages : 300
Book Description
Plasma Etching Processes for Sub-quarter Micron Devices
Author: G. S. MathadPublisher: The Electrochemical Society
ISBN: 9781566772532
Category : Integrated circuits
Languages : en
Pages : 396
Book Description
New Research on Hazardous Materials
Author: Phillip B. WareyPublisher: Nova Publishers
ISBN: 9781600212567
Category : Nature
Languages : en
Pages : 444
Book Description
Hazardous waste is a waste with properties that make it dangerous or potentially harmful to human health or the environment. Hazardous waste generally exhibits one or more of these characteristics: ignitability, corrosivity, reactivity or toxicity. The universe of hazardous wastes is large and diverse. Hazardous wastes can be liquids, solids, contained gases, or sludges. They can be the by-products of manufacturing processes or simply discarded commercial products, like cleaning fluids or pesticides. One major type is radioactive waste. This book brings together the latest research in this diverse field.
Index of Conference Proceedings
Author: British Library. Document Supply CentrePublisher:
ISBN:
Category : Conference proceedings
Languages : en
Pages : 870
Book Description
Compound Semiconductor
Author: Publisher:
ISBN:
Category : Compound semiconductors
Languages : en
Pages : 554
Book Description
Characterization and Metrology for ULSI Technology: 2003
Author: David G. SeilerPublisher: American Institute of Physics
ISBN:
Category : Computers
Languages : en
Pages : 868
Book Description
The worldwide semiconductor community faces increasingly difficult challenges as it moves into the manufacturing of chips with feature sizes approaching 100 nm and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Topics include: integrated circuit history, challenges and overviews, front end, lithography, interconnect and back end, and critical analytical techniques. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continue the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The editors believe that this book of collected papers provides a concise and effective portrayal of industry characterization needs and the way they are being addressed by industry, academia, and government to continue the dramatic progress in semiconductor technology. Hopefully, it will also provide a basis for stimulating advances in metrology and new ideas for research and development.
Author: