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Author: G. Bahar Basim Publisher: LAP Lambert Academic Publishing ISBN: 9783843363464 Category : Languages : en Pages : 124
Book Description
Chemical mechanical polishing (CMP) is used in microelectronics industry to planarize and pattern metal and dielectric layers. Decrease in the sizes of the devices and introduction of new materials necessitate improved control of the CMP that can be achieved by studying the slurry chemical and particulate properties. In this study, the impacts of slurry particle size distribution and stability on pad-particle-surface interactions are investigated. Impacts of hard and soft (transient) agglomerates on polishing performance are quantified. To stabilize slurries, repulsive force barriers provided by the self-assembled surfactant structures at the solid/liquid interface are utilized. A major finding of this work is that slurry stabilization has to be achieved by controlling not only the particle-particle interactions, but also the pad- particle-substrate interactions. Effective slurry formulations are developed by studying the frictional forces representative of particle- substrate interactions, while achieving stability by introducing adequate interparticle repulsion. Optimal slurry properties are examined and a slurry design criterion is developed.
Author: G. Bahar Basim Publisher: LAP Lambert Academic Publishing ISBN: 9783843363464 Category : Languages : en Pages : 124
Book Description
Chemical mechanical polishing (CMP) is used in microelectronics industry to planarize and pattern metal and dielectric layers. Decrease in the sizes of the devices and introduction of new materials necessitate improved control of the CMP that can be achieved by studying the slurry chemical and particulate properties. In this study, the impacts of slurry particle size distribution and stability on pad-particle-surface interactions are investigated. Impacts of hard and soft (transient) agglomerates on polishing performance are quantified. To stabilize slurries, repulsive force barriers provided by the self-assembled surfactant structures at the solid/liquid interface are utilized. A major finding of this work is that slurry stabilization has to be achieved by controlling not only the particle-particle interactions, but also the pad- particle-substrate interactions. Effective slurry formulations are developed by studying the frictional forces representative of particle- substrate interactions, while achieving stability by introducing adequate interparticle repulsion. Optimal slurry properties are examined and a slurry design criterion is developed.
Author: Gul Bahar Basim Publisher: ISBN: Category : Languages : en Pages :
Book Description
ABSTRACT: Chemical mechanical polishing (CMP) is widely used in the microelectronics industry to achieve planarization and patterning of metal and dielectric layers for microelectronic device manufacturing. Rapid advances in the microelectronics industry demand a decrease in the sizes of the devices, resulting in the requirement of a very thin layer of material removal with atomically flat and clean surface finish by CMP. Furthermore, new materials, such as copper and polymeric dielectrics, are introduced to build faster microprocessors, which are more vulnerable to defect formation and also demand more complicated chemistries. These trends necessitate improved control of the CMP that can be achieved by studying the slurry chemical and particulate properties to gain better fundamental understanding on the process. In this study, the impacts of slurry particle size distribution and stability on pad-particle-surface interactions during polishing are investigated. One of the main problems in CMP is the scratch or pit formation as a result of the presence of larger size particles in the slurries. Therefore, in this investigation, impacts of hard and soft (transient) agglomerates on polishing performance are quantified in terms of the material removal rate and the quality of the surface finish. It is shown that the presence of both types of agglomerates must be avoided in CMP slurries and robust stabilization schemes are needed to prevent the transient agglomerate formation. To stabilize the CMP slurries at extreme pH and ionic strength environments, under applied shear and normal forces, repulsive force barriers provided by the self-assembled surfactant structures at the solid/liquid interface are utilized. A major finding of this work is that slurry stabilization has to be achieved by controlling not only the particle-particle interactions, but also the pad-particle-substrate interactions. Perfect lubrication of surfaces by surfactants prevented polishing. Thus, effective slurry formulations are developed by studying the frictional forces, which are representative of the particle-substrate interactions, while achieving stability by introducing adequate interparticle repulsion. Finally, optimal slurry particulate properties are examined by analyzing the material removal mechanisms for silica-silica polishing. Based on the reported findings, a slurry design criterion is developed to achieve optimal polishing performance.
Author: Ungyu Paik Publisher: CRC Press ISBN: 1000023362 Category : Science Languages : en Pages : 203
Book Description
In the development of next-generation nanoscale devices, higher speed and lower power operation is the name of the game. Increasing reliance on mobile computers, mobile phone, and other electronic devices demands a greater degree of speed and power. As chemical mechanical planarization (CMP) progressively becomes perceived less as black art and more as a cutting-edge technology, it is emerging as the technology for achieving higher performance devices. Nanoparticle Engineering for Chemical-Mechanical Planarization explains the physicochemical properties of nanoparticles according to each step in the CMP process, including dielectric CMP, shallow trend isolation CMP, metal CMP, poly isolation CMP, and noble metal CMP. The authors provide a detailed guide to nanoparticle engineering of novel CMP slurry for next-generation nanoscale devices below the 60nm design rule. They present design techniques using polymeric additives to improve CMP performance. The final chapter focuses on novel CMP slurry for the application to memory devices beyond 50nm technology. Most books published on CMP focus on the polishing process, equipment, and cleaning. Even though some of these books may touch on CMP slurries, the methods they cover are confined to conventional slurries and none cover them with the detail required for the development of next-generation devices. With its coverage of fundamental concepts and novel technologies, this book delivers expert insight into CMP for all current and next-generation systems.
Author: Joy Marie Johnson Publisher: ISBN: Category : Languages : en Pages : 188
Book Description
A theoretical modeling approach is developed to predict silica-specific instability in chemical-mechanical polishing (CMP) slurries. In CMP, the formation of large agglomerates is of great concern, as these large particles are associated with high defectivity and poor polishing performance. The proposed model describes the complex CMP slurry system as a colloid under high non-linear shear conditions. The model diverges from the classic colloidal models by focusing on the following: reaction limited agglomeration (RLA) bounded by silica-specific modes of transitory bonding, and modified DVLO assumptions to include chemical activation and hydrodynamic agglomerate break-up condition evaluation. In order to build physical intuition and predict key model parameters, fundamental studies and novel metrology of agglomerates is performed.
Author: E. Guazzelli Publisher: Springer Science & Business Media ISBN: 9401585180 Category : Science Languages : en Pages : 407
Book Description
Mobile particulate systems involve the mechanics, flow and transport properties of mixtures of fluids and solids. These systems are intrinsic to the rheology of emulsions and suspensions, flocculation and aggregation, sedimentation and fluidization, flow of granular media, nucleation and growth of small particles, segregation, attrition and solidification processes. Its diversity means that the area has been studied by a number of different disciplines (e.g. chemical or civil engineering, mechanics, hydrodynamics, geophysics, condensed matter and statistical physics, etc.). Mobile Particulate Systems features general, orientational lectures and advanced topics, covering state of the art approaches to the study of suspensions, fluidized beds, sedimentation and granular flows.
Author: Babu Suryadevara Publisher: Woodhead Publishing ISBN: 0128218193 Category : Technology & Engineering Languages : en Pages : 650
Book Description
Advances in Chemical Mechanical Planarization (CMP), Second Edition provides the latest information on a mainstream process that is critical for high-volume, high-yield semiconductor manufacturing, and even more so as device dimensions continue to shrink. The second edition includes the recent advances of CMP and its emerging materials, methods, and applications, including coverage of post-CMP cleaning challenges and tribology of CMP. This important book offers a systematic review of fundamentals and advances in the area. Part one covers CMP of dielectric and metal films, with chapters focusing on the use of current and emerging techniques and processes and on CMP of various materials, including ultra low-k materials and high-mobility channel materials, and ending with a chapter reviewing the environmental impacts of CMP processes. New content addressed includes CMP challenges with tungsten, cobalt, and ruthenium as interconnect and barrier films, consumables for ultralow topography and CMP for memory devices. Part two addresses consumables and process control for improved CMP and includes chapters on CMP pads, diamond disc pad conditioning, the use of FTIR spectroscopy for characterization of surface processes and approaches for defection characterization, mitigation, and reduction. Advances in Chemical Mechanical Planarization (CMP), Second Edition is an invaluable resource and key reference for materials scientists and engineers in academia and R&D. Reviews the most relevant techniques and processes for CMP of dielectric and metal films Includes chapters devoted to CMP for current and emerging materials Addresses consumables and process control for improved CMP, including post-CMP
Author: Jim Litster Publisher: Cambridge University Press ISBN: 1316727750 Category : Technology & Engineering Languages : en Pages : 343
Book Description
With this unique and comprehensive text, readers will gain the quantitative tools needed to engineer the particulate processes and products that are ubiquitous in modern life. Covering a series of particle and particulate delivery form design processes, with emphasis on design and operation to control particle attributes, and supported by many worked examples, it is essential reading for students and practitioners. Topics covered include a range of particle design processes such as crystallization and precipitation, granulation, grinding, aerosol processes and spray drying, as well as forms of delivery such as granules, tablets, dry powders, and aerosols. Readers will learn from real-world examples how the primary particle properties and the structure and properties of the delivery form can lead to high performance products, ranging from pharmaceuticals, consumer goods and foods, to specialty chemicals, paints, agricultural chemicals and minerals.
Author: Wolfgang Sigmund Publisher: CRC Press ISBN: 142000753X Category : Science Languages : en Pages : 424
Book Description
Despite the widespread growth and acceptance of particulate technology, challenges in the design, operation, and manufacturing of these systems still exists. These critical issues must be resolved so that particle technology may continue to serve as a foundation for new nano and biotechnologies. Particulate Systems in Nano- and Biotechnologies pres
Author: Tarek I. Zohdi Publisher: Springer Science & Business Media ISBN: 3642285198 Category : Technology & Engineering Languages : en Pages : 124
Book Description
The objective of this monograph is to provide a concise introduction to the dynamics of systems comprised of charged small-scale particles. Flowing, small-scale, particles ("particulates'') are ubiquitous in industrial processes and in the natural sciences. Applications include electrostatic copiers, inkjet printers, powder coating machines, etc., and a variety of manufacturing processes. Due to their small-scale size, external electromagnetic fields can be utilized to manipulate and control charged particulates in industrial processes in order to achieve results that are not possible by purely mechanical means alone. A unique feature of small-scale particulate flows is that they exhibit a strong sensitivity to interparticle near-field forces, leading to nonstandard particulate dynamics, agglomeration and cluster formation, which can strongly affect manufactured product quality. This monograph also provides an introduction to the mathematically-related topic of the dynamics of swarms of interacting objects, which has gained the attention of a number of scientific communities. In summary, the following topics are discussed in detail: (1) Dynamics of an individual charged particle, (2) Dynamics of rigid clusters of charged particles, (3) Dynamics of flowing charged particles, (4) Dynamics of charged particle impact with electrified surfaces and (5) An introduction to the mechanistic modeling of swarms. The text can be viewed as a research monograph suitable for use in an upper division undergraduate or first year graduate course geared towards students in the applied sciences, mechanics and mathematics that have an interest in the analysis of particulate materials.
Author: G. Bahar Basim
Author: G. Bahar Basim
Author: Gul Bahar Basim
Author: Ungyu Paik
Author: R. L. Opila
Author: Joy Marie Johnson
Author: E. Guazzelli
Author: Babu Suryadevara
Author: Jim Litster
Author: Wolfgang Sigmund
Author: Tarek I. Zohdi