Author: Silvia Richter
Publisher: Springer Science & Business Media
ISBN: 3540852263
Category : Science
Languages : en
Pages : 906
Book Description
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
EMC 2008
Author: Silvia Richter
Publisher: Springer Science & Business Media
ISBN: 3540852263
Category : Science
Languages : en
Pages : 906
Book Description
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
Publisher: Springer Science & Business Media
ISBN: 3540852263
Category : Science
Languages : en
Pages : 906
Book Description
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
EMC 2008
Author: Martina Luysberg
Publisher: Springer Science & Business Media
ISBN: 3540851569
Category : Science
Languages : en
Pages : 898
Book Description
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
Publisher: Springer Science & Business Media
ISBN: 3540851569
Category : Science
Languages : en
Pages : 898
Book Description
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
EMC 2008
Author: Anke Aretz
Publisher: Springer Science & Business Media
ISBN: 354085228X
Category : Science
Languages : en
Pages : 424
Book Description
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
Publisher: Springer Science & Business Media
ISBN: 354085228X
Category : Science
Languages : en
Pages : 424
Book Description
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
Railway Safety, Reliability, and Security: Technologies and Systems Engineering
Author: Flammini, Francesco
Publisher: IGI Global
ISBN: 146661644X
Category : Technology & Engineering
Languages : en
Pages : 487
Book Description
Human errors, as well as deliberate sabotage, pose a considerable danger to passengers riding on the modern railways and have created disastrous consequences. To protect civilians against both intentional and unintentional threats, rail transportation has become increasingly automated. Railway Safety, Reliability, and Security: Technologies and Systems Engineering provides engineering students and professionals with a collection of state-of-the-art methodological and technological notions to support the development and certification of real-time safety-critical railway control systems, as well as the protection of rail transportation infrastructures.
Publisher: IGI Global
ISBN: 146661644X
Category : Technology & Engineering
Languages : en
Pages : 487
Book Description
Human errors, as well as deliberate sabotage, pose a considerable danger to passengers riding on the modern railways and have created disastrous consequences. To protect civilians against both intentional and unintentional threats, rail transportation has become increasingly automated. Railway Safety, Reliability, and Security: Technologies and Systems Engineering provides engineering students and professionals with a collection of state-of-the-art methodological and technological notions to support the development and certification of real-time safety-critical railway control systems, as well as the protection of rail transportation infrastructures.
EMC Mortgage Corporation V. Kemp
Advanced Characterization Techniques for Thin Film Solar Cells
Author: Daniel Abou-Ras
Publisher: John Wiley & Sons
ISBN: 3527699015
Category : Science
Languages : en
Pages : 760
Book Description
The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.
Publisher: John Wiley & Sons
ISBN: 3527699015
Category : Science
Languages : en
Pages : 760
Book Description
The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.
Principles of Electron Optics, Volume 4
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0323916473
Category : Technology & Engineering
Languages : en
Pages : 665
Book Description
Principles of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern account of electron optical phenomena with the Dirac or Schrödinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron propagation in electron microscopes, electron holography and coherence. Sections in this new release include, Electron Interactions in Thin Specimens, Digital Image Processing, Acquisition, Sampling and Coding, Enhancement, Linear Restoration, Nonlinear Restoration – the Phase Problem, Three-dimensional Reconstruction, Image Analysis, Instrument Control, Vortex Beams, The Quantum Electron Microscope, and much more. - Includes authoritative coverage of many recent developments in wave electron optics - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Includes new content on multislice optics, 3D reconstruction, Wigner optics, vortex beams and the quantum electron microscope
Publisher: Academic Press
ISBN: 0323916473
Category : Technology & Engineering
Languages : en
Pages : 665
Book Description
Principles of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern account of electron optical phenomena with the Dirac or Schrödinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron propagation in electron microscopes, electron holography and coherence. Sections in this new release include, Electron Interactions in Thin Specimens, Digital Image Processing, Acquisition, Sampling and Coding, Enhancement, Linear Restoration, Nonlinear Restoration – the Phase Problem, Three-dimensional Reconstruction, Image Analysis, Instrument Control, Vortex Beams, The Quantum Electron Microscope, and much more. - Includes authoritative coverage of many recent developments in wave electron optics - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Includes new content on multislice optics, 3D reconstruction, Wigner optics, vortex beams and the quantum electron microscope
Handbook of Biomedical Optics
Author: David A. Boas
Publisher: CRC Press
ISBN: 1420090372
Category : Medical
Languages : en
Pages : 816
Book Description
Biomedical optics holds tremendous promise to deliver effective, safe, non- or minimally invasive diagnostics and targeted, customizable therapeutics. Handbook of Biomedical Optics provides an in-depth treatment of the field, including coverage of applications for biomedical research, diagnosis, and therapy. It introduces the theory and fundamental
Publisher: CRC Press
ISBN: 1420090372
Category : Medical
Languages : en
Pages : 816
Book Description
Biomedical optics holds tremendous promise to deliver effective, safe, non- or minimally invasive diagnostics and targeted, customizable therapeutics. Handbook of Biomedical Optics provides an in-depth treatment of the field, including coverage of applications for biomedical research, diagnosis, and therapy. It introduces the theory and fundamental
THERMEC 2009
Author: T. Chandra
Publisher: Trans Tech Publications Ltd
ISBN: 303813340X
Category : Technology & Engineering
Languages : en
Pages : 4007
Book Description
THERMEC 2009, 6th International Conference on PROCESSING & MANUFACTURING OF ADVANCED MATERIALS, Berlin, Germany, August 25-29, 2009
Publisher: Trans Tech Publications Ltd
ISBN: 303813340X
Category : Technology & Engineering
Languages : en
Pages : 4007
Book Description
THERMEC 2009, 6th International Conference on PROCESSING & MANUFACTURING OF ADVANCED MATERIALS, Berlin, Germany, August 25-29, 2009
PRICM7
Author: Jian Feng Nie
Publisher: Trans Tech Publications Ltd
ISBN: 3038133302
Category : Technology & Engineering
Languages : en
Pages : 3026
Book Description
Selected, peer reviewed papers from the Seventh Pacific Rim International Conference on Advanced Materials and Processing, August 2-6, 2010, Cairns, Australia
Publisher: Trans Tech Publications Ltd
ISBN: 3038133302
Category : Technology & Engineering
Languages : en
Pages : 3026
Book Description
Selected, peer reviewed papers from the Seventh Pacific Rim International Conference on Advanced Materials and Processing, August 2-6, 2010, Cairns, Australia