Author: Dimitris Gizopoulos
Publisher: Springer Science & Business Media
ISBN: 1402028016
Category : Computers
Languages : en
Pages : 226
Book Description
Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
Embedded Processor-Based Self-Test
Author: Dimitris Gizopoulos
Publisher: Springer Science & Business Media
ISBN: 1402028016
Category : Computers
Languages : en
Pages : 226
Book Description
Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
Publisher: Springer Science & Business Media
ISBN: 1402028016
Category : Computers
Languages : en
Pages : 226
Book Description
Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
Processor Design
Author: Jari Nurmi
Publisher: Springer Science & Business Media
ISBN: 1402055307
Category : Technology & Engineering
Languages : en
Pages : 534
Book Description
Here is an extremely useful book that provides insight into a number of different flavors of processor architectures and their design, software tool generation, implementation, and verification. After a brief introduction to processor architectures and how processor designers have sometimes failed to deliver what was expected, the authors introduce a generic flow for embedded on-chip processor design and start to explore the vast design space of on-chip processing. The authors cover a number of different types of processor core.
Publisher: Springer Science & Business Media
ISBN: 1402055307
Category : Technology & Engineering
Languages : en
Pages : 534
Book Description
Here is an extremely useful book that provides insight into a number of different flavors of processor architectures and their design, software tool generation, implementation, and verification. After a brief introduction to processor architectures and how processor designers have sometimes failed to deliver what was expected, the authors introduce a generic flow for embedded on-chip processor design and start to explore the vast design space of on-chip processing. The authors cover a number of different types of processor core.
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
Author: Krishnendu Chakrabarty
Publisher: Springer Science & Business Media
ISBN: 1475765274
Category : Technology & Engineering
Languages : en
Pages : 202
Book Description
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Publisher: Springer Science & Business Media
ISBN: 1475765274
Category : Technology & Engineering
Languages : en
Pages : 202
Book Description
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Software-based Self-test and Diagnosis for Processors and System-on-chips
Railway Safety, Reliability, and Security: Technologies and Systems Engineering
Author: Flammini, Francesco
Publisher: IGI Global
ISBN: 146661644X
Category : Technology & Engineering
Languages : en
Pages : 487
Book Description
Human errors, as well as deliberate sabotage, pose a considerable danger to passengers riding on the modern railways and have created disastrous consequences. To protect civilians against both intentional and unintentional threats, rail transportation has become increasingly automated. Railway Safety, Reliability, and Security: Technologies and Systems Engineering provides engineering students and professionals with a collection of state-of-the-art methodological and technological notions to support the development and certification of real-time safety-critical railway control systems, as well as the protection of rail transportation infrastructures.
Publisher: IGI Global
ISBN: 146661644X
Category : Technology & Engineering
Languages : en
Pages : 487
Book Description
Human errors, as well as deliberate sabotage, pose a considerable danger to passengers riding on the modern railways and have created disastrous consequences. To protect civilians against both intentional and unintentional threats, rail transportation has become increasingly automated. Railway Safety, Reliability, and Security: Technologies and Systems Engineering provides engineering students and professionals with a collection of state-of-the-art methodological and technological notions to support the development and certification of real-time safety-critical railway control systems, as well as the protection of rail transportation infrastructures.
Design and Test Technology for Dependable Systems-on-chip
Author: Raimund Ubar
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 580
Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 580
Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Embedded Processor-Based Self-Test
Author: Gizopoulos
Publisher:
ISBN: 9788184892321
Category :
Languages : en
Pages : 232
Book Description
Publisher:
ISBN: 9788184892321
Category :
Languages : en
Pages : 232
Book Description
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Author: M. Bushnell
Publisher: Springer Science & Business Media
ISBN: 0306470403
Category : Technology & Engineering
Languages : en
Pages : 690
Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Publisher: Springer Science & Business Media
ISBN: 0306470403
Category : Technology & Engineering
Languages : en
Pages : 690
Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
IEEE VLSI Test Symposium
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
Book Description
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
Book Description
Test Driven Development for Embedded C
Author: James W. Grenning
Publisher: Pragmatic Bookshelf
ISBN: 1680504886
Category : Computers
Languages : en
Pages : 486
Book Description
Another day without Test-Driven Development means more time wasted chasing bugs and watching your code deteriorate. You thought TDD was for someone else, but it's not! It's for you, the embedded C programmer. TDD helps you prevent defects and build software with a long useful life. This is the first book to teach the hows and whys of TDD for C programmers. TDD is a modern programming practice C developers need to know. It's a different way to program---unit tests are written in a tight feedback loop with the production code, assuring your code does what you think. You get valuable feedback every few minutes. You find mistakes before they become bugs. You get early warning of design problems. You get immediate notification of side effect defects. You get to spend more time adding valuable features to your product. James is one of the few experts in applying TDD to embedded C. With his 1.5 decades of training,coaching, and practicing TDD in C, C++, Java, and C# he will lead you from being a novice in TDD to using the techniques that few have mastered. This book is full of code written for embedded C programmers. You don't just see the end product, you see code and tests evolve. James leads you through the thought process and decisions made each step of the way. You'll learn techniques for test-driving code right nextto the hardware, and you'll learn design principles and how to apply them to C to keep your code clean and flexible. To run the examples in this book, you will need a C/C++ development environment on your machine, and the GNU GCC tool chain or Microsoft Visual Studio for C++ (some project conversion may be needed).
Publisher: Pragmatic Bookshelf
ISBN: 1680504886
Category : Computers
Languages : en
Pages : 486
Book Description
Another day without Test-Driven Development means more time wasted chasing bugs and watching your code deteriorate. You thought TDD was for someone else, but it's not! It's for you, the embedded C programmer. TDD helps you prevent defects and build software with a long useful life. This is the first book to teach the hows and whys of TDD for C programmers. TDD is a modern programming practice C developers need to know. It's a different way to program---unit tests are written in a tight feedback loop with the production code, assuring your code does what you think. You get valuable feedback every few minutes. You find mistakes before they become bugs. You get early warning of design problems. You get immediate notification of side effect defects. You get to spend more time adding valuable features to your product. James is one of the few experts in applying TDD to embedded C. With his 1.5 decades of training,coaching, and practicing TDD in C, C++, Java, and C# he will lead you from being a novice in TDD to using the techniques that few have mastered. This book is full of code written for embedded C programmers. You don't just see the end product, you see code and tests evolve. James leads you through the thought process and decisions made each step of the way. You'll learn techniques for test-driving code right nextto the hardware, and you'll learn design principles and how to apply them to C to keep your code clean and flexible. To run the examples in this book, you will need a C/C++ development environment on your machine, and the GNU GCC tool chain or Microsoft Visual Studio for C++ (some project conversion may be needed).