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Author: Milton Ohring Publisher: Academic Press ISBN: 0080575528 Category : Technology & Engineering Languages : en Pages : 759
Book Description
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Author: Milton Ohring Publisher: Academic Press ISBN: 0080575528 Category : Technology & Engineering Languages : en Pages : 759
Book Description
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Author: Ronald K Jurgen Publisher: SAE International ISBN: 0768034922 Category : Technology & Engineering Languages : en Pages : 377
Book Description
Vehicle reliability problems continue to be the news because of major vehicle recalls from several manufacturers. This book includes 40 SAE technical papers, published from 2007 through 2010, that describe the latest research on automotive electronics reliability technology. This book will help engineers and researchers focus on the design strategies being used to minimize electronics reliability problems, and how to test and verify those strategies. After an overview of durability, risk assessment, and failure mechanisms, this book focuses on state-of-the-art techniques for reliability-based design, and reliability testing and verification. Topics include: powertrain control monitoring distributed automotive embedded systems model-based design x-by-wire systems battery durability design verification fault tree analysis The book also includes editor Ronald K. Jurgen’s introduction ,“Striving for Maximum Reliability in a Highly Complex Electronic Environment”, and a concluding section on the future of electronics reliability, including networking technology, domain control units, the use of AUTOSAR, and embedded software.
Author: Eugene R. Hnatek Publisher: CRC Press ISBN: 9780203909089 Category : Technology & Engineering Languages : en Pages : 472
Book Description
Examining numerous examples of highly sensitive products, this book reviews basic reliability mathematics, describes robust design practices, and discusses the process of selecting suppliers and components. He focuses on the specific issues of thermal management, electrostatic discharge, electromagnetic compatibility, printed wiring assembly, environmental stress testing, and failure analysis. The book presents methods for meeting the reliability goals established for the manufacture of electronic product hardware and addresses the development of reliable software. The appendix provides example guidelines for the derating of electrical and electromechanical components.
Author: Joseph S. Heyman Publisher: Elsevier ISBN: 0815517009 Category : Technology & Engineering Languages : en Pages : 145
Book Description
This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
Author: Titu I. Bajenescu Publisher: Springer Science & Business Media ISBN: 3642585051 Category : Technology & Engineering Languages : en Pages : 547
Book Description
This application-oriented professional book explains why components fail, addressing the needs of engineers who apply reliability principles in design, manufacture, testing and field service. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography complete the book.
Author: Henry Shu-hung Chung Publisher: IET ISBN: 1849199019 Category : Technology & Engineering Languages : en Pages : 502
Book Description
The main aims of power electronic converter systems (PECS) are to control, convert, and condition electrical power flow from one form to another through the use of solid state electronics. This book outlines current research into the scientific modeling, experimentation, and remedial measures for advancing the reliability, availability, system robustness, and maintainability of PECS at different levels of complexity.
Author: Geoffrey W. A. Dummer Publisher: Elsevier ISBN: 1483149269 Category : Technology & Engineering Languages : en Pages : 249
Book Description
Electronics Reliability–Calculation and Design provides an introduction to the fundamental concepts of reliability. The increasing complexity of electronic equipment has made problems in designing and manufacturing a reliable product more and more difficult. Specific techniques have been developed that enable designers to integrate reliability into their products, and reliability has become a science in its own right. The book begins with a discussion of basic mathematical and statistical concepts, including arithmetic mean, frequency distribution, median and mode, scatter or dispersion of measurements, and the normal and binomial distributions. Separate chapters deal with techniques for calculating equipment and system reliability; safety and derating factors; and the effects of constructional methods on reliability. Subsequent chapters cover environmental effects on reliability; improved reliability through microelectronics or integrated circuits; and failure rates for electronic components. Each chapter concludes with questions to enable students to test their understanding of the topics discussed. This book offers students an introduction to the subject of reliability in a form that is easily assimilated. It also serves as a reference to the various aspects contributing towards increased reliability of both electronic equipment and complete systems.
Author: Bhargava, Cherry Publisher: IGI Global ISBN: 1799814661 Category : Computers Languages : en Pages : 330
Book Description
In the industry of manufacturing and design, one major constraint has been enhancing operating performance using less time. As technology continues to advance, manufacturers are looking for better methods in predicting the condition and residual lifetime of electronic devices in order to save repair costs and their reputation. Intelligent systems are a solution for predicting the reliability of these components; however, there is a lack of research on the advancements of this smart technology within the manufacturing industry. AI Techniques for Reliability Prediction for Electronic Components provides emerging research exploring the theoretical and practical aspects of prediction methods using artificial intelligence and machine learning in the manufacturing field. Featuring coverage on a broad range of topics such as data collection, fault tolerance, and health prognostics, this book is ideally designed for reliability engineers, electronic engineers, researchers, scientists, students, and faculty members seeking current research on the advancement of reliability analysis using AI.
Author: Titu I. Băjenescu Publisher: Artech House ISBN: 1596934360 Category : Technology & Engineering Languages : en Pages : 706
Book Description
The main reason for the premature breakdown of today's electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. Today professionals are looking for effective ways to minimize the degradation of electronic components to help ensure longer-lasting, more technically sound products and systems. This practical book offers engineers specific guidance on how to design more reliable components and build more reliable electronic systems. Professionals learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for the intended applications. Moreover, the book helps system designers ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure.
Author: Norman. B. Fuqua Publisher: CRC Press ISBN: 1000146782 Category : Technology & Engineering Languages : en Pages : 409
Book Description
This book addresses the needs of electronic design engineers, reliability engineers, and their respective managers, stressing a pragmatic viewpoint rather than a vigorous mathematical presentation.
Author: Milton Ohring
Author: Milton Ohring
Author: Ronald K Jurgen
Author: Eugene R. Hnatek
Author: Joseph S. Heyman
Author: Titu I. Bajenescu
Author: Henry Shu-hung Chung
Author: Geoffrey W. A. Dummer
Author: Bhargava, Cherry
Author: Titu I. Băjenescu
Author: Norman. B. Fuqua